DLA SMD-5962-90571 REV A-2006 MICROCIRCUIT HYBRID LINEAR MULTIPLEXED TRACK AND HOLD AMPLIFIER《多路复用追踪保持放大器 线性混合微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Updated drawing to latest requirements. -sld 06-03-20 Raymond Monnin REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRC

2、UIT DRAWING CHECKED BY Micheal C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, MULTIPLEXED TRACK AND HOLD AMPLIFIER THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVA

3、L DATE 93-05-11 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-90571 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E343-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90571 DEFENSE SUPPLY CENTER COLUMBU

4、S COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Ident

5、ifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 90571 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1

6、) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.

7、2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MN7130 Multiplexed track and hold amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. Al

8、l levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This

9、level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and

10、In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with

11、exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality cl

12、ass. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90571 DEFENSE SUPPLY CENTER

13、COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 32 Dual-in-line 1.2.5 Lead finish. The lead fini

14、sh shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (+VCC) . +16 V dc Negative supply voltage (-VCC). -16 V dc Multiplexer inputs (pins 1 through 16) -VCCto +VCC Instrumentation amp inputs (pins 21 and 22). 15 V T/H amplifier input (pin 19). 0 to VCCAd

15、dress inputs (pins 27 through 31) -0.3 V to +VCCT/H command input (pin 17) 0 to +7 V Power dissipation (PD) . 1200 mW Thermal resistance (JC) 5C/W Thermal resistance (JA) 28C/W Lead temperature (soldering, 10 seconds). +300C Storage temperature range -65C to +150C Junction temperature (TJ) +175C 1.4

16、 Recommended operating conditions. Positve supply voltage range (+VCC) . +14.55 V dc to +15.45 V dc Negative supply voltage range (-VCC) -14.55 V dc to -15.45 V dc Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The

17、following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General

18、Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawi

19、ngs. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum ratings may cause perma

20、nent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBU

21、S, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulat

22、ions unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or a

23、s designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicabl

24、e device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and here

25、in. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance char

26、acteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of

27、device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufactu

28、rer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any

29、, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to thi

30、s drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with e

31、ach lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the

32、form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE

33、I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Min Max Unit Input voltage range VIN1,2,3 01 -10 +10 V 1 +10 Input current high T/H command IIH1VIH= 2.0 V 2,3 01 +100 A 1 +10 Input current low T/H comma

34、nd IIL1VIL= 0.8 V 2,3 01 +100 A Input current high mux enable IIH2 VIH= 4.0 V 1,2,3 01 -30 +30 Input current low mux enable IIL2VIL= 0.8 V 1,2,3 01 -30 +30 nA Positive supply current +ICC +VCC = +15.45 V dc1,2,3 01 +40 mA Negative supply current -ICC -VCC = -15.45 V dc 1,2,3 01 -40 mA Power consumpt

35、ion PD 1,2,3 01 1200 mW Input offset voltage VIOVIN= 0 V, track mode 1,2,3 01 -6.0 +6.0 mV 4 25 Hold step (pedestal) VHSVIN= 0 V, hold mode (test all 16 channels) 5,6 01 50 mV Gain error AE Track mode 4,5,6 01 -0.2 +0.2 %FSR 4 7 Hold mode droop VHDVIN= 0 V 5,6 01 40 mV/ms Settling time, track -to-ho

36、ld 2/ TR(ts)Settling to 1 mV 9,10,11 01 2 s 9 10 Acquisition time 2/ TAQ20 V step to 0.01%FSR 10,11 01 15 s See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90571 DEFENSE SUPPLY

37、CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Min Max Unit Output slew rate 2/ VO/TVIN= -10 V

38、 to +10 V step, gain = 1. 4,5,6 01 8 V/s 1/ +14.55 V dc +VCC +15.45 V dc, -14.55 V dc -VCC -15.45 V dc, unless otherwise specified. 2/ Parameter shall be tested as part of initial charcterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I f

39、or all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 FIGURE 1. Cas

40、e outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Millimeters Inches Symbol Min Max Min M

41、ax A 4.37 .172 b 0.51 .020 b2 0.89 1.14 .035 .045 c 0.30 .012 D 43.48 1.712 E 20.32 .800 e 2.54 BSC .100 BSC eA 15.11 15.37 .595 .605 L 5.08 5.84 .200 .230 Q 0.38 0.89 .015 .035 X 37.90 38.30 1.492 1.508 Y 2.54 .100 Z 2.57 2.82 .101 .111 NOTE: The U.S. government preferred system of measurement is t

42、he metric SI. This item was designed using inch- pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. FIGURE 1. Case outline - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted with

43、out license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal Connection 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22

44、23 24 25 26 27 28 29 30 31 32 Channel 0 Channel 1 Channel 2 Channel 3 Channel 4 Channel 5 Channel 6 Channel 7 Channel 8 Channel 9 Channel 10 Channel 11 Channel 12 Channel 13 Channel 14 Channel 15 T/H command T/H amplifier output T/H amplifier input Instrumentation amplifier output +VIN(instrumentati

45、on amplifier) -VIN(instrumentation amplifier) -15 V supply (-VCC) +15 V supply (+VCC) Ground Mux 2 output Mux 2 enable A2 mux address A1 mux address A0 mux address Mux 1 enable Mux 1 output FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without l

46、icense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A te

47、st table) Interim electrical parameters Final electrical parameters 1*,2,3,4,5,6,9,10,11 Group A test requirements 1,2,3,4,5,6,9,10,11 Group C end-point electrical parameters 1,2,3 End-point electrical parameters for Radiation Hardness Assurance (RHA) devices Not applicable * PDA applies to subgroup

48、 1. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the ac