1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDA Drawing updated to reflect current requirements. - ro 01-07-18 R. MONNINTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.REVSHEETREVSHEETREV STATUS REV AAAAAAAAAAAAAOF SHETS SHET 1234567891011213PMIC N/A PREPARED BY RICK C. OFFICERDEFENSE
2、SUPPLY CENTER COLUMBUSSTANDARDMICROCIRCUITDRAWINGCHECKED BYCHARLES E. BESORECOLUMBUS, OHIO 43216http:/www.dscc.dla.milTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYMICHAEL A. FRYEMICROCIRCUIT, LINEAR, DUAL SPDT, ANALOGSWITCH WITH DRIVER, MONOLITHIC SILICONAND AGENCIES OF THEDEPARTMENT
3、 OF DEFENSEDRAWING APPROVAL DATE92-01-29AMSC N/AREVISION LEVELASIZEACAGE CODE672685962-90689SHEET1 OF 13DSCC FORM 2233APR 97 5962-E520-01DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without licen
4、se from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90689DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET2DSCC FORM 2234APR 971. SCOPE1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q andM) and space app
5、lication (device class V). A choice of case outlines and lead finishes are available and are reflected in thePart or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in thePIN.1.2 PIN. The PIN is as shown in the following example:5962 - 90
6、689 01 M E XFederalstock classdesignatorRHAdesignator(see 1.2.1)Devicetype(see 1.2.2)DeviceclassdesignatorCaseoutline(see 1.2.4)Leadfinish(see 1.2.5) / (see 1.2.3)/Drawing number1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels andare marked
7、with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix Aspecified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.1.2.2 Device type(s). The device type(s) identify the circuit function as follows:De
8、vice type Generic number Circuit function01 DG189 Dual, SPDT, JFET switches with bipolar driver1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level asfollows:Device class Device requirements documentationM Vendor self-certification to
9、the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix AQ or V Certification and qualification to MIL-PRF-385351.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive de
10、signator Terminals Package styleE GDIP1-T16 or CDIP2-T16 16 Dual-in-line1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,appendix A for device class M.Provided by IHSNot for ResaleNo reproduction or networking permitted without license f
11、rom IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90689DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET3DSCC FORM 2234APR 971.3 Absolute maximum ratings. 1/Negative supply to positive supply voltage (V- to V+) 36 V dcDrain to positive supply voltage (VDto V+) 33 V dcNegati
12、ve supply to drain voltage (V- to VD) . 33 V dcSource to drain voltage (VSto VD) . 22 V dcNegative supply to logic supply voltage (V- to VL) . 36 V dcInput to logic supply voltage (VINto VL) . 8 V dcReference supply to logic supply voltage (VRto VL) 8 V dcNegative supply to reference supply voltage
13、(V- to VR) . 27 V dcInput to reference supply voltage (VINto VR) 8 V dcReference supply voltage to input (VRto VIN) . 2 V dcSource or drain current (S or D) . 200 mASupply current (all other pins) 30 mAPower dissipation (PD) . 900 mW 2/Storage temperature range -65C to +150CThermal resistance, junct
14、ion-to-case (JC) See MIL-STD-18351.4 Recommended operating conditions.Positive supply voltage (V+) . +15 V dcNegative supply voltage (V-) -15 V dcLogic supply voltage (VL) . 5 V dcReference supply voltage (VR) . 0 V dcAmbient operating temperature range (TA) -55C to +125C2. APPLICABLE DOCUMENTS2.1 G
15、overnment specification, standards, and handbooks. The following specification, standards, and handbooks form apart of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed inthe issue of the Department of Defense Index of Specificati
16、ons and Standards (DoDISS) and supplement thereto, cited in thesolicitation.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Method Standard Microcircuits.MIL-STD-1835 - Interface Standard
17、 Electronic Component Case Outlines.1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at themaximum levels may degrade performance and affect reliability.2/ Derate 12 mW/C with TAabove +75C.Provided by IHSNot for ResaleNo reproduction or netwo
18、rking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90689DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET4DSCC FORM 2234APR 97HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of Standard Microcircuit Drawings.MIL-HDBK-780 - Standard Microcir
19、cuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Order of precedence. In the event of a conflict between the text of this drawi
20、ng and the references cited herein, the textof this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless aspecific exemption has been obtained.3. REQUIREMENTS3.1 Item requirements. The individual item requirements for device classes Q and V s
21、hall be in accordance withMIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. Themodification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements fordevice class M shall be in acco
22、rdance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specifiedherein.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specifiedin MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A
23、 and herein for device class M.3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.3.2.3 Truth table. The truth table shall be as specified on figure 2.3.2.4 Logic diagram. The logic diag
24、ram shall be as specified on figure 3.3.3 Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified herein, theelectrical performance characteristics and post irradiation parameter limits are as specified in table I and shall apply over thefull ambient
25、operating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIB. The electricaltests for each subgroup are defined in table I.3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufac
26、turers PIN may also bemarked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to spacelimitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, theRHA designator shall still be marke
27、d. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required inMIL-PRF-38535
28、. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A.3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535listed manufacturer in order to supply to the requirements of this drawing (see 6.
29、6.1 herein). For device class M, a certificate ofcompliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for thisdrawi
30、ng shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.3.7 Certificate of conformance. A certificate of conformance as required for device classes Q
31、and V in MIL-PRF-38535 or fordevice class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90689DEFENSE SUP
32、PLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics.Test SymbolConditions 1/-55C TA +125Cunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxDrain-source “ON”resistanceRDS(ON)IS= -10 mA, VD= -7.5 V, 2/
33、1,3 01 10.0 VIN= 2 V or 0.8 V2 20.0Source “OFF”leakage currentIS(OFF)V+ = 10 V, V- = -20 V, 2/VD= -10 V, VS= 10 V,1 01 -10.0 +10.0 nAVIN= 2 V or 0.8 V2,3 -1000 +1000V+ = 15 V, V- = -15 V, 2/VD= -7.5 V, VS= 7.5 V,1 -10.0 +10.0VIN= 2 V or 0.8 V2,3 -1000 +1000Drain “OFF”leakage currentID(OFF)V+ = 10 V,
34、 V- = -20 V, 2/VD= 10 V, VS= -10 V,1 01 -10.0 +10.0 nAVIN= 2 V or 0.8 V2,3 -1000 +1000V+ = 15 V, V- = -15 V, 2/VD= 7.5 V, VS= -7.5 V,1 -10.0 +10.0VIN= 2 V or 0.8 V2,3 -1000 +1000Channel “ON”leakage currentID(ON)+VS= VD= -7.5 V, 2/1 01 -2.0 +2.0 nAIS(ON)VIN= 2 V or 0.8 V2,3 -200 +200Input current wit
35、hVINlowIILVINunder test = 0 V,all other VIN= 5 V1,2,3 01 -250 AInput current withVINhighIIHVINunder test = 5 V,all other VIN= 0 V1,3 01 +10.0 A2 +20.0Positive supplycurrentI+VIN= 0 V or VIN= 5 V1,2,3 01 1.5 mANegative supplycurrentI-VIN= 0 V or VIN= 5 V1,2,3 01 -5.0 mALogic supply currentILVIN= 0 V
36、or VIN= 5 V1,2,3 01 4.5 mASee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90689DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET6DSCC FORM 2234APR 97TABLE I
37、. Electrical performance characteristics Continued.Test SymbolConditions 1/-55C TA +125Cunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxReference supply currentIRVIN= 0 V or VIN= 5 V1,2,3 01 -2.0 mAFunctional test See 4.4.1c 7,8Turn-ON timetONSee figures 4 and 5 9,11 01 400 ns1
38、0 600Turn-OFF timetOFFSee figures 4 and 5 9,11 01 200 ns10 2501/ Unless otherwise specified, V+ = 15 V, V- = -15 V, VL= 5 V, and VR= 0 V.2/ VIN= input voltage to perform proper function.3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (s
39、ee 6.2herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retainthe option to review the manufacturers facility and appl
40、icable required documentation. Offshore documentation shall be madeavailable onshore at the option of the reviewer.3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be inmicrocircuit group number 94 (see MIL-PRF-38535, appendix A).Provided by
41、 IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90689DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET7DSCC FORM 2234APR 97Device type 01Case outline ETerminalnumberTerminal symbol1DRAIN 1 (D1)2NC3
42、DRAIN 3 (D3)4SOURCE 3 (S3)5SOURCE 4 (S4)6DRAIN 4 (D4)7NC8DRAIN 2 (D2)9SOURCE 2 (S2)10INPUT 2 (IN2)11 V+12VL13VR14 V-15INPUT 1 (IN1)16SOURCE 1 (S1)FIGURE 1. Terminal connections.LogicS1, S2S3,S40OF ON1ONFLogic “0” 0.8 VLogic “1” 2.0 VFIGURE 2. Truth table.Provided by IHSNot for ResaleNo reproduction
43、or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90689DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET8DSCC FORM 2234APR 97Two SPDT switches per packageNOTE: All switches are shown for logic “1” input.FIGURE 3. Logic diagram.Provid
44、ed by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90689DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET9DSCC FORM 2234APR 97VOUT= VSx RL/ (RL+ RDS(ON), tON: VS= +3 V, tOFF: VS= -3 V(Repeat test
45、 for IN2, S2, S4, D2, and D4.)FIGURE 4. Test circuit.NOTE: VOis the steady-state output with the switch on. Feed through via switch capacitance may result in spikesat the leading and trailing edge of the output waveform. Logic input waveform is inverted for switches that havethe opposite logic sense
46、 control.FIGURE 5. Timing waveforms.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90689DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET10DSCC FORM 2234APR 974. QUALITY ASSURANCE PROVI
47、SIONS4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance withMIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM planshall not affect the form, fit, or function as described h
48、erein. For device class M, sampling and inspection procedures shall bein accordance with MIL-PRF-38535, appendix A.4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conductedon all devices prior to qualification and technology conformance in
49、spection. For device class M, screening shall be inaccordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.4.2.1 Additional criteria for device class M.a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition C. The test circuit shall be maintaine
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