DLA SMD-5962-90693 REV C-2000 MICROCIRCUIT LINEAR 8TH ORDER SWITCHED CAPACITOR FILTER MONOLITHIC SILICON《硅单块 第八序开关电容过滤器 直线型微型电路》.pdf

1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDA Changes in accordance with N.O.R. 5962-R273-92. 93-03-05 M. A. FRYEB Changes in accordance with N.O.R. 5962-R136-95. 95-05-25 M. A. FRYEC Make changes to figure 1 and paragraph 6.5. Drawing updated to reflectcurrent requirements. - ro00-08-30 R. MON

2、NINTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.REVSHEETREVSHEETREV STATUS REV CCCCCCCCCCCOF SHETS SHET 123456789101PMIC N/A PREPARED BY RICK C. OFFICERDEFENSE SUPPLY CENTER COLUMBUSSTANDARDMICROCIRCUITDRAWINGCHECKED BYCHARLES E. BESORECOLUMBUS, OHIO 43216THIS DRAWING IS AVAILABLEFOR U

3、SE BY ALLDEPARTMENTSAPPROVED BYMICHAEL A. FRYEMICROCIRCUIT, LINEAR, 8 TH ORDERSWITCHED CAPACITOR FILTER, MONOLITHICAND AGENCIES OF THEDEPARTMENT OF DEFENSEDRAWING APPROVAL DATE92-01-16SILICONAMSC N/AREVISION LEVELCSIZEACAGE CODE672685962-90693SHEET1 OF 11DSCC FORM 2233APR 97 5962-E500-00DISTRIBUTION

4、 STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90693DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET2DSCC FORM 2234

5、APR 971. SCOPE1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q andM) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in thePart or Identifying Number (PIN). When a

6、vailable, a choice of Radiation Hardness Assurance (RHA) levels are reflected in thePIN.1.2 PIN. The PIN is as shown in the following example:5962 - 90693 01 M C XG7EG7E G7EG7E G7EG7EG7EG7E G7EG7E G7EG7EG7E G7E G7E G7E G7E G7E Federal RHA Device Device Case Lead stock class designator type class out

7、line finishdesignator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3)/ Drawing number1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels andare marked with the appropriate RHA designator. Device class M RHA marked devic

8、es meet the MIL-PRF-38535, appendix Aspecified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.1.2.2 Device type(s). The device type(s) identify the circuit function as follows:Device type Generic number Circuit function01 LTC1064-1 8 th order, cl

9、ock, sweepable elliptic(cauer) lowpass switched capacitor filter02 LTC1064-1A 8 th order, clock, sweepable elliptic(cauer) lowpass switched capacitor filter1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level asfollows:Device class Dev

10、ice requirements documentationM Vendor self-certification to the requirements for MIL-STD-883 compliant,non-JAN class level B microcircuits in accordance with MIL-PRF-38535,appendix AQ or V Certification and qualification to MIL-PRF-385351.2.4 Case outline(s). The case outline(s) are as designated i

11、n MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleC GDIP1-T14 or CDIP2-T14 14 Dual-in-line1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,appendix A for device class M.Provided by IHSNot for Resa

12、leNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90693DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET3DSCC FORM 2234APR 971.3 Absolute maximum ratings. 1/Total supply voltage (+VSto VS) .16.0 V dcPower dissipatio

13、n (PD) 400 mWStorage temperature range .-65G71C to +150G71CLead temperature (soldering, 10 seconds) .+300G71CThermal resistance, junction-to-case (G54JC) .See MIL-STD-1835Thermal resistance, junction-to-ambient (G54JA) 100G71C/W1.4 Recommended operating conditions.Supply voltage (VS) .G727.5 V dcClo

14、ck frequency (fCLK) 1 MHzCorner frequency (fC) 10 kHzClock input levels TTL or CMOSAmbient operating temperature (TA) .-55G71C to +125G71C2. APPLICABLE DOCUMENTS2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form apart of this drawing to

15、 the extent specified herein. Unless otherwise specified, the issues of these documents are those listed inthe issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in thesolicitation.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38535 - Integrat

16、ed Circuits, Manufacturing, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Method Standard Microcircuits.MIL-STD-973 - Configuration Management.MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of Standa

17、rd Microcircuit Drawings (SMDs).MIL-HDBK-780 - Standard Microcircuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)1/ Stresses above

18、the absolute maximum rating may cause permanent damage to the device. Extended operation at themaximum levels may degrade performance and affect reliability.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90693DE

19、FENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET4DSCC FORM 2234APR 972.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the tex tof this drawing takes precedence. Nothing in this document, however, supersedes

20、 applicable laws and regulations unless aspecific exemption has been obtained.3. REQUIREMENTS3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance withMIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Manageme

21、nt (QM) plan. Themodification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements fordevice class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specifiedherein.3.2 Design, construction, an

22、d physical dimensions. The design, construction, and physical dimensions shall be as specifiedin MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein.3.2.2 Te

23、rminal connections. The terminal connections shall be as specified on figure 1.3.3 Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified herein, theelectrical performance characteristics and post irradiation parameter limits are as specified in tabl

24、e I and shall apply over thefull ambient operating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are defined in table I.3.5 Marking. The part shall be marked with the PIN listed

25、 in 1.2 herein. In addition, the manufacturers PIN may also bemarked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to spacelimitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option

26、, theRHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a

27、“QML“ or “Q“ as required inMIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A.3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535listed manufacturer in order to supply to

28、the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate ofcompliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an

29、 approved source of supply for thisdrawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.3.7 Certificate of conformance. A certificate of confo

30、rmance as required for device classes Q and V in MIL-PRF-38535 or fordevice class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product

31、(see 6.2herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973.3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retainthe option to review the manufacturers facility and applicable requi

32、red documentation. Offshore documentation shall be madeavailable onshore at the option of the reviewer.3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be inmicrocircuit group number 115 (see MIL-PRF-38535, appendix A).Provided by IHSNot for

33、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90693DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics.Test SymbolConditions 1/-55G71C G64 T

34、AG64 +125G71Cunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxPower supply voltagerangeVS1,2,3 All G722.37 G727.5 VOutput dc offsetVS= G727.5 V, VIN= 0 V,1 01 175 mVTA= +25G71C02 125Power supply currentISVS= G722.37 V, VIN= 0 V1,2,3 All 22 mAVS= G725 V, VIN= 0 V1232,3 26VS= G728

35、.0 V, VIN= 0 V1282,3 32Maximum clock frequencyfCLKVS= G727.5 V, TA= +25G71C,50 % duty cycle4Al 5MHzInput impedanceZIN100 G50A applied to VINpin,TA= +25G71C4Al10 kG3APositive output voltageswing and operatinginput voltage rangeVS= G722.37 V,measure swing at COMP 1and COMP 2 pins4,5,6 All +1.1 VVS= G7

36、25 Vmeasure swing at COMP 1and COMP 2 pins+3.1VS= G727.5 Vmeasure swing at COMP 1and COMP 2 pins+5.0Negative output voltageswing and operatinginput voltageVS= G722.37 V,measure swing at COMP 1and COMP 2 pins4,5,6 All -1.1 VVS= G725 Vmeasure swing at COMP 1and COMP 2 pins-3.1VS= G727.5 Vmeasure swing

37、 at COMP 1and COMP 2 pins-5.0See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90693DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET6DSCC FORM 2234APR 97TABL

38、E I. Electrical performance characteristics Continued.Test SymbolConditions 1/-55G71C G64 TAG64 +125G71Cunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxPassband ripple0.1 fCto 0.85 fC2/referenced to passband4,5,6 01 -0.32 +0.32 dBgain, measured at6.25 kHz and 8.5 kHz02 -0.19 +0

39、.19Gain at passband edgefrequencyReferenced to 2/pasband gain4,5,6 01 -1.25 +0.85 dB02 -0.75 +0.65Passband gain Referenced to 0 dB, 2/measured 1 Hz to 0.1 fC4,5,6 All -0.35 +0.35 dBStopband attenuation Referenced to 0 dB, 2/ 4,5,6 01 66 dBmeasured at 1.5 fC02 68Referenced to 0 dB, 2/ 01 67measured a

40、t 2.0 fC02 681/ Unless otherwise specified, VS= G727.5 V, fCLK= 1 MHz, and fC= 20 kHz. RL= 10 kG3A and CL= 10 pF which aremeasured in parallel. INV A and R(H, I) pins are tied together. INV C, AGND, COMP 1, and COMP 2 pins are open.2/ VIN= 500 mV RMS when measured at 1 kHz to 10 Hz. VIN= 3 V RMS whe

41、n measured at 15 kHz to 20 kHz.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90693DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET7DSCC FORM 2234APR 97Device types 01 and 02Case outli

42、ne CTerminalnumberTerminalsymbol1INV C2VIN3AGND4+VS5AGND6 COMP 17INV A8NC9VOUT10 NC11fCLK12-VS13 COMP 214 R (H, I)FIGURE 1. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90693DEFENSE SUPPLY

43、 CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET8DSCC FORM 2234APR 97Symbol DescriptionINV C Negative input pin to inverter CVINInput voltage pinAGND Analog ground+VSPositive power supplyAGND Analog groundCOMP 1 Compensation pin 1INV A Negative input pin to inverter ANC No connectionVOU

44、TOutput voltage pinfCLKClock frequency-VSNegative power supplyCOMP 2 Compensation pin 2R (H, I) High rejection band outputFIGURE 1. Terminal connections Continued.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-9

45、0693DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET9DSCC FORM 2234APR 974. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance withMIL-PRF-38535 or as modified in the device manufac

46、turers Quality Management (QM) plan. The modification in the QM planshall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall bein accordance with MIL-PRF-38535, appendix A.4.2 Screening. For device classes Q and V, screening shall

47、be in accordance with MIL-PRF-38535, and shall be conductedon all devices prior to qualification and technology conformance inspection. For device class M, screening shall be inaccordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.4

48、.2.1 Additional criteria for device class M.a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition C. The test circuit shall be maintained by the manufacturer under document revision level controland shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify theinputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in testmethod 1015.(2) TA= +125G71C, minimum.b. Interim and final electrical test parameters shall be as specified in table II herein