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本文(DLA SMD-5962-90855 REV E-2011 MICROCIRCUIT HYBRID HIGH SPEED SINGLE CHANNEL OPTOCOUPLER.pdf)为本站会员(explodesoak291)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-90855 REV E-2011 MICROCIRCUIT HYBRID HIGH SPEED SINGLE CHANNEL OPTOCOUPLER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added case outlines X and Y. Editorial changes throughout. 93-09-10 K. A. Cottongim B Changes in accordance with NOR 5962-R038-94 93-11-12 K. A. Cottongim C Added class K devices. Redrew entire document. -sld 98-03-24 K. A. Cottongim D Updated dr

2、awing to the current requirements of MIL-PRF-38534. 05-10-25 Raymond Monnin E Updated drawing paragraphs. 11-12-13 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED REV SHEET REV SHEET REV STATUS REV E E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 P

3、MIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Robert M. Heber THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY William K. Heckma

4、n MICROCIRCUIT, HYBRID, HIGH SPEED SINGLE CHANNEL, OPTOCOUPLER DRAWING APPROVAL DATE 91-01-30 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-90855 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E043-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,

5、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lea

6、d finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 90855 01 H P X Federal RHA Device Device Case Lead s

7、tock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the

8、appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HCPL-5601, HCPL-560K, 66056-005, 66056-300 High speed single channel optocoupler 1.2.3 Device class des

9、ignator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels

10、are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G

11、Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (G

12、roup A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure tha

13、t the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated i

14、n MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P CDIP2-T8 8 Dual-in-line X See figure 1 8 Dual-in-line Y See figure 1 8 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction o

15、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. Supply voltage range (VCC) 1/ 7.0 V dc Peak forward input current (t 1.0 ms

16、) . 40 mA Average input forward current (IFAVG) 20 mA Reverse input voltage (VR) 5.0 V dc Output current (IO) . 25 mA Output voltage (VO) . 7.0 V dc Enable input voltage (VE) 5.5 V dc Output power dissipation . 40 mW Input power dissipation 35 mW Total package power dissipation (PD) 350 mW Lead temp

17、erature (soldering, 10 seconds) +260C Storage temperature range . -65C to +150C Thermal resistance, junction-to-case (JC): Case outline P . See MIL-STD-1835 Case outlines X and Y . 28 C/W Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Low level input current range (IFL) 0 to 2

18、50 A High level input current range (IFH) 2/ 12.5 mA to 16 mA Output supply voltage range (VCC) 4.5 V dc to 5.5 V dc Fan out (N) 6.0 TTL loads maximum High-level enable voltage (VEH) 3/ 2.0 V dc to VCCLow-level enable voltage (VEL) 3/ . 0 V dc to 0.8 V dc Operating temperature range (TA) . -55C to +

19、125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or cont

20、ract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-

21、HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

22、 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ t 1.0 minu

23、te. 2/ 12.5 mA condition permits at least 20 percent CTR degradation guardband. Initial switching thresholds is 10 mA or less. 3/ No external pull up in required for a high logic state on the enable input. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-

24、,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-

25、PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, ho

26、wever the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The

27、design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table

28、(s). The truth table(s) shall be as specified on figure 3. 3.2.4 Schematic diagram(s). The schematic diagram(s) shall be as specified on figure 4. 3.2.5 Test circuit and waveform(s). The test circuit and waveform(s) shall be as specified on figure 5. 3.3 Electrical performance characteristics. Unles

29、s otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical te

30、sts for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the gen

31、eral performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary o

32、f all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificat

33、e of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate o

34、f conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device

35、manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90855 DLA LAND AND

36、MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Low level enable current IELVCC= 5.5 V, VE= 0.5 V, IF=

37、10 mA 1,2,3 01 -2.0 mA High level enable voltage 1/ 2/ VEH1,2,3 01 2.0 V Low level enable voltage 3/ VEL1,2,3 01 0.8 V High level output current IOHVCC= 5.5 V, VO= 5.5 V, IF= 250 A 1,2,3 01 250 A Low level output voltage 4/ VOLVCC= 5.5 V, IF= 10 mA, IOL(sinking) = 10 mA 1,2,3 01 0.6 V Logic high sup

38、ply current ICCHVCC= 5.5 V, IF= 0 mA 1,2,3 01 14 mA Logic low supply current ICCLVCC= 5.5 V, IF= 20 mA 1,2,3 01 18 mA Input forward voltage VFIF= 20 mA 1,2,3 01 1.9 V Input reverse breakdown current BVRIR= 10 A 1,2,3 01 5.0 V Input-output leakage current 5/ 6/ II-O VI-O= 1500 V, relative humidity =

39、45%, TA= +25C, t = 5 seconds 1 01 1.0 A Propagation delay time to high output level 7/ tPLH VCC= 5.5 V, RL= 510, CL= 50 pF, IF= 13 mA, see figure 5 9 01 100 ns 10,11 140 Propagation delay time to low output level 7/ tPHL VCC= 5.5 V, RL= 510, CL= 50 pF, IF= 13 mA, see figure 5 9 01 100 ns 10,11 120 C

40、ommon mode transient immunity at high output level 8/ 9/ CMH VCM= 50 V (peak), VO(min) = 2.0 V, RL= 510, IF= 0 mA, VCC= 5.0 V, TA= +25C 9 01 1000 V/s Common mode transient immunity at low output level 8/ 9/ CML VCM= 50 V (peak), VO(min) = 0.8 V, RL= 510, IF= 10 mA, VCC= 5.0 V, TA= +25C 9 01 -1000 V/

41、s See footnotes at top of next page. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical pe

42、rformance characteristics - Continued. 1/ No external pull up is required for a high logic state on the enable input. 2/ This test is verified by setting VEto 2.0 V and forcing +VFinput high, and measuring VOL. 3/ This test is verified by setting VEto 0.8 V and measuring IOH. 4/ It is essential that

43、 a bypass capacitor (.01 to 0.1 F, ceramic) be connected from VCCto ground. Total lead length between both ends of this external capacitor and the isolator pins should not exceed 20 millimeters. 5/ This device is considered a two terminal device. Pins 1 through 4 are shorted together and pins 5 thro

44、ugh 8 are shorted together. 6/ This is a momentary withstand test, not an operating condition. 7/ The parameter tPHLpropagation delay is measured from the 50 percent point on the leading edge of the input pulse to 1.5 V point on the leading edge of the output pulse. The propagation delay tPLHis meas

45、ured from the 50 percent point on the trailing edge of the input pulse to 1.5 V point on the trailing edge of the output pulse. 8/ The parameter CMLis the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state (VO 0.8 V dc). The parameter

46、 CMHis the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic high state (VO 2.0 V dc). 9/ Parameters shall be tested as part of device intial characterization and after any design or process changes which may affect these parameters. Parameter

47、s shall be guaranteed to the limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LE

48、VEL E SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Symbol Millimeters Inches Min Max Min Max A 4.57 .180 A1 1.40 1.65 .055 .065 b 0.41 0.51 .016 .020 c 0.18 0.33 .007 .013 D 9.40 9.91 .370 .390 e 2.29 2.79 .090 .110 E 9.65 9.91 .380 .390 E1 8.13 .320 L 1.07 1.32 .042 .052 S 0.89 1.27 .035 .050 NOTES: 1. The U.S. government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems invol

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