ImageVerifierCode 换一换
格式:PDF , 页数:16 ,大小:128.10KB ,
资源ID:699904      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-699904.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(DLA SMD-5962-90870 REV B-2012 MICROCIRCUIT DIGITAL BIPOLAR CMOS OCTAL REGISTERED TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf)为本站会员(amazingpat195)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-90870 REV B-2012 MICROCIRCUIT DIGITAL BIPOLAR CMOS OCTAL REGISTERED TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redraw the switching waveforms in figure 4, switching waveforms and test circuit. Update boilerplate to MIL-PRF-38535 requirements. Editorial changes throughout. - LTG 06-05-05 Thomas M. Hess B Update boilerplate to MIL-PRF-38535 requirements. Ed

2、itorial changes throughout. jak 12-06-04 Thomas M. Hess REV SHEET REV B SHEET 15 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Marcia B. Kelleher DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STAND

3、ARD MICROCIRCUIT DRAWING CHECKED BY Thomas J. Ricciuti THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL REGISTERED TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT

4、 OF DEFENSE DRAWING APPROVAL DATE 90-10-31 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-90870 SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E213-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90870 DL

5、A LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lea

6、d finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 90870 01 M L A Federal stock class designator RHA designato

7、r (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator

8、. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit

9、 function 01 54BCT543 Octal registered transceiver with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certificat

10、ion to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Desc

11、riptive designator Terminals Package style L GDIP3-T24 or CDIP4-T24 24 Dual-in-line K GDFP2-F24 or CDFP3-F24 24 Flat pack 3 CQCC1-N28 28 Square chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.

12、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90870 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC

13、) -0.5 V dc to +7.0 V dc DC input voltage range (VIN): Including I/O ports -0.5 V dc to +5.5 V dc Excluding I/O ports . -0.5 V dc to +7.0 V dc Voltage applied to any output in the high state (VOUT) . -0.5 V dc to VCCVoltage applied to any output in the disabled state (VOUT) . -0.5 V dc to +5.5 V dc

14、Current into any output in the low state 96 mA Input clamp current (IIC) . -30 mA Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) . 602 mW 2/ Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperatu

15、re (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) . 2.0 V dc Maximum low level input voltage (VIL) 0.8 V dc Setup time, data before latch enable going high (ts) 5.5 ns Hold time, data after latch enable going

16、high (th) . 1.5 ns Pulse duration, latch enable low (tw) 8 ns Maximum high level output current (IOH): A port . -3.0 mA B port . -12 mA Maximum low level output current (IOL): A port . +20 mA B port . +48 mA Case operating temperature range (TC) . -55C to +125C 1/ Stresses above the absolute maximum

17、 rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Must be able to withstand the additional PDdue to the short circuit test, e.g., IOS. The PDlimit is based upon dc values. Provided by IHSNot for ResaleNo repr

18、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90870 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following s

19、pecification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, Genera

20、l Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Dra

21、wings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and t

22、he references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall

23、 be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accor

24、dance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix

25、 A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. Th

26、e logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrica

27、l performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-9

28、0870 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part sh

29、all be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using th

30、is option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V

31、shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order

32、 to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and M

33、aritime -VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate o

34、f conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notifi

35、cation to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime s agent, and the

36、 acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawin

37、g shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90870 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC

38、 FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Test conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max High level output voltage VOHVCC= 4.5 V VIH= 2.0 V or VIL= 0.8 V IOH= -3 mA 1, 2, 3 All 2.4 V IOH= -12 mA 2.0 Low

39、level output voltage VOLVCC= 4.5 V VIH= 2.0 V or VIL= 0.8 V IOL= 48 mA 1, 2, 3 All 0.55 V Input clamp voltage VICVCC= 4.5 V, IIN= -18 mA 1, 2, 3 All -1.2 V High level input current Control inputs IIH11/ VCC= 5.5 V, VIN= 5.5 V 1, 2, 3 All 0.4 mA A or B port IIH21/ VCC= 5.5 V, VIN= 2.7 V 70 A Control

40、inputs 20 Low level input current A or B port IIL1/ VCC= 5.5 V, VIN= 0.5 V 1, 2, 3 All -0.65 mA Control inputs -0.60 Short-circuit output current IOS2/ VCC= 5.5 V, VOUT= 0.0 V 1, 2, 3 All -100 -225 mA Supply current, outputs high ICCH3/ VCC= 5.5 V Outputs open 1, 2, 3 All 8 mA Supply current, output

41、s low ICCL3/ 71 Supply current, outputs disabled ICCZ15 Functional tests 4/ See 4.4.1b 7, 8 All Propagation delay time, Am to Bm or Bm to Am tPLH1CL= 50 pF R1 = R2 = 500 See figure 4 VCC= 5.0 V 9 All 2.0 7.5 ns VCC= 4.5 V and 5.5 V 10, 11 2.0 9.9 tPHL1VCC= 5.0 V 9 All 2.0 8.2 VCC= 4.5 V and 5.5 V 10

42、, 11 2.0 9.7 Propagation delay time, LEAB to Bm or LEBA to Am tPLH2VCC= 5.0 V 9 All 2.0 10.3 ns VCC= 4.5 V and 5.5 V 10, 11 2.0 13.9 tPHL2VCC= 5.0 V 9 All 2.0 10.6 VCC= 4.5 V and 5.5 V 10, 11 2.0 13.2 Propagation delay time, output enable, OEBA to Am or OEAB to Bm tPZH1VCC= 5.0 V 9 All 1.0 8.6 ns VC

43、C= 4.5 V and 5.5 V 10, 11 1.0 11.4 tPZL1VCC= 5.0 V 9 All 1.0 10.8 VCC= 4.5 V and 5.5 V 10, 11 1.0 12.8 See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90870 DLA LAND AND MARITIME

44、 COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Test conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Propagation delay time, output disable, OEBA to

45、Am or OEAB to Bm tPHZ1CL= 50 pF R1 = R2 = 500 See figure 4 VCC= 5.0 V 9 All 1.0 7.2 ns VCC= 4.5 V and 5.5 V 10, 11 1.0 8.8 tPLZ1VCC= 5.0 V 9 All 1.0 6.4 VCC= 4.5 V and 5.5 V 10, 11 1.0 8.1 Propagation delay time, output enable, CEBA to Am or CEAB to Bm tPZH2VCC= 5.0 V 9 All 1.0 9.8 ns VCC= 4.5 V and

46、 5.5 V 10, 11 1.0 12.8 tPZL2VCC= 5.0 V 9 All 1.0 11.6 VCC= 4.5 V and 5.5 V 10, 11 1.0 13.8 Propagation delay time, output disable, CEBA to Am or CEAB to Bm tPHZ2VCC= 5.0 V 9 All 1.0 7.5 ns VCC= 4.5 V and 5.5 V 10, 11 1.0 9.3 tPLZ2VCC= 5.0 V 9 All 1.0 6.7 VCC= 4.5 V and 5.5 V 10, 11 1.0 8.4 1/ For I/

47、O ports, the parameters IIH2and IILinclude the off-state output current. 2/ Not more than one output should be shorted at one time and the duration of the test condition should not exceed one second. 3/ ICCHand ICCLare measured in the A to B mode. 4/ Functional tests shall be conducted at input test

48、 conditions of 0.4 V VIL 0.8 V and 2.0 V VIH 2.4 V for VCC= 4.5 V and is repeated for VCC= 5.5 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90870 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type All Case outlines L and K 3 Terminal number Terminal symbol Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 LEBA OEBA A1

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1