1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. - lgt 02-01-29 Raymond Monnin REV SHET REV SHET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Dan Wonnell DEFENSE SUPPLY CENTER COLUMBUS STANDARD
2、 MICROCIRCUIT DRAWING CHECKED BY Sandra Rooney COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, ANALOG SWITCH, SPST, QUAD, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL D
3、ATE 94-08-10 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-90891 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E216-02 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
4、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90891 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space app
5、lication (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962
6、- 90891 01 Q E X Federal stock class designator RHA designator (see 1.2.1) Devicetype (see 1.2.2) Device class designator Caseoutline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RH
7、A levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circ
8、uit function as follows: Device type Generic number Circuit function 01 DG601A Quad SPST analog switch 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certif
9、ication to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter
10、Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for R
11、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90891 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ V+ to V-. 22 V dc GND to V- . 13 V dc Dig
12、ital inputs to V- 2/. -2 V dc to (V+ plus 2 V dc) or 30 mA, whichever occurs first. VS, VDto V- 2/ . -2 V dc to (V+ plus 2 V dc) or 30 mA, whichever occurs first. Current (continuous, any terminal) . 30 mA Current (S or D, pulsed at 1 ms, 10% duty cycle max). 100 mA Storage temperature. -65C to +150
13、C Power dissipation (PD), TA= +75C: 3/ case outline E 4/ 900 mW case outline 2 5/ 750 mW 1.4 Recommended operating conditions. V+ . 12 V dc V- 0 V dc Ambient operating temperature range (TA). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following
14、specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
15、 solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. HANDBOOKS DEPARTME
16、NT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadel
17、phia, PA 19111-5094.) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Signals on Sx, Dx, or INx exceeding V+ or V- will be clamped by internal diodes. Limit forward dio
18、de current to maximum current ratings. 3/ Device mounted with all leads soldered or welded to PC board. 4/ Derate 12 mW/C above TA= +75C. 5/ Derate 10 mW/C above TA= +75C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
19、SIZE A 5962-90891 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this d
20、ocument, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the devic
21、e manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
22、herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accor
23、dance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, t
24、he electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrica
25、l tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space limitations
26、, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535,
27、 appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes
28、Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of
29、supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device cl
30、ass M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this
31、drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A. 3.9 Verification and review for device class M. For
32、 device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. De
33、vice class M devices covered by this drawing shall be in microcircuit group number 82 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90891 DEFENSE SUPPLY CENTER COLUMBUS COLU
34、MBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C VIN= 2.4 V, 0.8 V, V- = 0 V V+ = +12 V, GND = 0 V unless otherwise specified Group A subgroups Device type Limits Unit Min Max Drain-source ON res
35、istance rDS(ON)V+ = +10.8 V, IS= -10 mA, VD= 10 V, 2 V 1, 3 01 35 2 50 V+ = +4.5 V, V- = -4.5 V, IS= -10 mA, VD= 3.5 V 1, 3 40 2 60 V+ = +4.5 V, V- = 0 V, IS= -10 mA, VD= 2 V, 3.5 V 1, 3 100 2 140 Drain-source ON resistance rDS(ON)V+ = +10.8 V, IS = -10 mA, VD= 10 V, 2 V 1, 3 01 6 2 10 V+ = +4.5 V,
36、V- = -4.5 V, IS= -10 mA, VD= 3.5 V 1, 3 6 2 10 V+ = +4.5 V, V- = 0 V, IS= -10 mA, VD= 2 V, 3.5 V 1, 3 10 2 15 Switch OFF leakage current IS(OFF)V+ = +13.2 V, V- = 0 V, VS= 12.2 V, 1 V 1 01 -4 +4 nA 2, 3 -100 +100 ID(OFF)1 -4 +4 2, 3 -100 +100 Channel ON leakage current ID(ON)IS(ON)V+ = +13.2 V, V- =
37、 0 V, VS= 12.2 V, 1 V 1 01 -4 +4 nA 2, 3 -200 +200 Input current with VINlow IILVINunder test = 0 V, All other = 5 V 1, 2, 3 01 -10 A Input current with VINhigh IIHVINunder test = 5 V, All other = 0 V 1, 2, 3 01 +10 A Turn-on time tONRL= 300 , CL= 35 pF see figure 3 9, 11 01 45 ns 10 75 Turn-off tim
38、e tOFFRL= 300 , CL= 35 pF see figure 3 9, 11 01 30 ns 10 50 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90891 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 6 DSCC FORM 22
39、34 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C VIN= 2.4 V, 0.8 V, V- = 0 V V+ = +12 V, GND = 0 V unless otherwise specified Group A subgroups Device type Limits Unit Min Max Positive supply current I+ VIN= 0 V or 5 V, V+ = +13.2 V, V- = 0 V
40、 1, 2 01 6 mA 3 8 Negative supply current I- VIN= 0 V or 5 V, V+ = +13.2 V, V- = 0 V 1, 2 01 -6 mA 3 -8 Capacitance: Address CAVIL= 0 V, TA= +25C, GND = 0 V, f = 1 MHz, see 4.4.1d 4 01 16 pF Capacitance: input switch CISVIH= 5 V, TA= +25C, GND = 0 V, f = 1 MHz, see 4.4.1d 4 01 15 pF Capacitance: out
41、put switch COSVIH= 5 V, TA= +25C, GND = 0 V, f = 1 MHz, see 4.4.1d 4 01 15 pF Off isolation VISOVGEN= 1 VP-P, TA= +25C, f = 200 kHz, see 4.4.1e 12 01 60 db Crosstalk between channels VCTVGEN= 1 VP-P, TA= +25C, f = 200 kHz, see 4.4.1e 12 01 60 db Charge transfer error VCTETA= +25C, see 4.4.1e 12 01 -
42、10 10 mV Functional test FT See 4.4.1b 7, 8 01 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modificati
43、on in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall b
44、e conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. Provided by IHSNot for ResaleNo reproduction o
45、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90891 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline E 2 Terminal number Terminal symbol 1 IN1NC 2 D1IN13 S1D14 V- S15 GN
46、D V- 6 S4NC 7 D4GND 8 IN4S49 IN3D410 D3IN411 S3NC 12 NC IN313 V+ D314 S2S315 D2NC 16 IN2NC 17 - V+ 18 - S219 - D220 - IN2NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
47、SIZE A 5962-90891 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Logic Switch 0 ON 1 OFF Logic “0” 0.8 V Logic “1” 2.4 V FIGURE 2. Truth table. FIGURE 3. Timing waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted wi
48、thout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90891 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and powe
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