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本文(DLA SMD-5962-90902 REV B-2011 MICROCIRCUIT HYBRID LINEAR FET INPUT CLOSED LOOP BUFFER AMPLIFIER.pdf)为本站会员(wealthynice100)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-90902 REV B-2011 MICROCIRCUIT HYBRID LINEAR FET INPUT CLOSED LOOP BUFFER AMPLIFIER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change figure 1 case outline dimensioning to symbols and table format. Update drawing boilerplate. 02-04-29 Raymond Monnin B Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 11-12-13 Charles F. S

2、affle THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCU

3、IT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Gregory A. Lude MICROCIRCUIT, HYBRID, LINEAR, FET INPUT, CLOSED LOOP BUFFER AMPLIFIER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-07-08 AMSC N/A REVISION LEVEL B SIZE A CAGE

4、 CODE 67268 5962-90902 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E042-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90902 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM

5、 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation har

6、dness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 90902 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3)

7、 / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit fu

8、nction as follows: Device type Generic number Circuit function Supply voltage 01 MSK332B-12 FET input, closed loop buffer amplifier 12 V 02 MSK332B-15 FET input, closed loop buffer amplifier 15 V 1.2.3 Device class designator. This device class designator shall be a single letter identifying the pro

9、duct assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliabilit

10、y class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses th

11、e Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other c

12、lasses (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufact

13、urer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-909

14、02 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 14 Dual-in-line 1.2.5 Lead finis

15、h. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC): Device type 01 15 V dc Device type 02 18 V dc Input voltage (VIN) VCCPeak output current (IOUT) 50 mA Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds) +300C Tot

16、al hybrid power dissipation (PD) 620 mW Thermal resistance junction-to-case (JC) 20C/W Junction temperature (TJ) +150C 1.4 Recommended operating conditions. Supply voltage (VCC): Device type 01 12 V dc Device type 02 15 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUME

17、NTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFEN

18、SE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standa

19、rd Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence.

20、 In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum

21、 ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90902 DLA LAND AND M

22、ARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performan

23、ce of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534). Furthermore, the manufacturer may t

24、ake exceptions or use alternate methods to the tests and inspections herein and not perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical

25、dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Schematic diagram. The schematic diagram shall

26、 be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical te

27、st requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufa

28、cturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample

29、, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA L

30、and and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product me

31、ets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection pro

32、cedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The followin

33、g additional criteria shall apply: a. Burn-in test, method 1015 and 1030 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring a

34、ctivity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final

35、electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT

36、DRAWING SIZE A 5962-90902 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Quiescent cur

37、rent IQVIN= 0 V 1 All 25 mA 2,3 30 Input offset voltage VOSVIN= 0 V, TA= +25C 1 All -2.0 +2.0 mV Input offset voltage Temperature coefficient VOS T VIN= 0 V, TA= -55C and +125C 2,3 All -25 +25 V/C Input bias current IIBVCM= 0 V 1 All 300 pA 2,3 10 nA Output voltage swing VORL= 510, f 3.0 MHz 4,5,6 0

38、1 -7.0 +7.0 V 02 -10.0 +10.0 Full power bandwidth FBW RL= 510 VO= 7 V 4,5,6 01 3.0 MHz VO= 10.0 V 02 3.0 Slew rate SR RL= 510 VO= 7 V 4,5,6 01 250 V/s VO= 10.0 V 02 250 Voltage gain AVRL= 1 k VO= 7 V 1,2,3 01 0.995 V/V VO= 10.0 V 02 0.995 Settling time to 0.1 percent ts7.0 V step 2/ 4 01 100 ns 5,6

39、200 4.0 V step 2/ 4 All 50 5,6 100 10.0 V step 2/ 4 02 100 5,6 200 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90902 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION

40、 LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Power supply rejection PSRR VCC= 5.0 V 2/ 1,2,3 All 60 dB Input noise voltage eNf =

41、 10 Hz to 1.0 MHz 2/ TA= +25C 4 All 2.0 V Input impedance ZINf = dc, TA= +25C 2/ 1 All 1012ohms 1/ Unless otherwise specified, VCC= 12 V for device type 01, and VCC= 15 V for device type 02. 2/ Parameter shall be tested as part of device initial characterization and after design and process changes.

42、 Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90902 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 RE

43、VISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Symbol Millimeters Inches Min Max Min Max A 6.10 0.240 b 0.41 0.56 0.016 0.022 D 20.14 20.57 0.793 0.810 D1 18.29 REF 0.720 REF E 12.52 12.78 0.493 0.503 E1 10.67 REF 0.420 REF e 2.54 TYP 0.100 TYP e1 15.24 REF 0.600 REF eA 7.62 REF 0.300

44、REF L 6.10 0.240 S1 2.41 2.68 0.095 0.105 NOTES: 1. Pin 1 is indicated by the square corner on the case. 2. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pou

45、nd units, the inch-pound units shall rule. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90902 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2

46、234 APR 97 Device types 01 and 02 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Input No connection No connection No connection No connection No connection -VCCOutput No connection +VCCNo connection No connection Case ground No connection FIGURE 2. Terminal connecti

47、ons. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90902 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 FIGURE 3. Schematic diagram. Provided by IHSNot for Re

48、saleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90902 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test tabl

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