1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes are in accordance with the notice of revision 5962-R279-92. - jak 92-09-08 Monica L. Poeking B Changes are in accordance with the notice of revision 5962-R176-95. - jak 95-09-07 Thomas M. Hess C Redrawn with changes. Update boilerplate to
2、 the current requirements of MIL-PRF-38535. - phn 08-04-02 Thomas M. Hess REV SHET REV SHET REV STATUS REV C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Marcia B. Kelleher CHECKED BY Thomas J. Ricciuti DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http
3、:/www.dscc.dla.mil APPROVED BY Michael A. Frye DRAWING APPROVAL DATE 90-10-11 MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, QUADRUPLE BUS BUFFER GATE WITH THREE-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF
4、 THE DEPARTMENT OF DEFENSE AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-90937 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E313-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90937 DEFENSE SUPPLY CEN
5、TER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finis
6、hes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 90937 01 M C A Federal stock class designator RHA designator (see
7、 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device
8、 class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit functio
9、n 01 54BCT125A Quadruple bus buffer gate with three-state outputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-S
10、TD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Pack
11、age style C CDIP3-T14 14 Dual-in-line D GDFP1-F14 14 Flat pack 2 CQCC1-N20 20 Square chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking
12、 permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90937 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage (VIN) -0
13、.5 V dc to +7.0 V dc Voltage applied to a disabled three-state output -0.5 V dc to +5.5 V dc Voltage applied to any output in the high state -0.5 V dc to VCCCurrent into any output in the low state . 96 mA Input clamp current (IIC) . -30 mA Storage temperature range (TSTG) . -65C to +150C Lead tempe
14、rature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C Power dissipation (PD) . 375.1 mW 2/ 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) . 2.0
15、V Maximum low level input voltage (VIL) . 0.8 V Maximum high level output current (IOH) -12 mA Maximum low level output current (IOL) 48 mA Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification,
16、 standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specificati
17、on for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copie
18、s of these documents are available online at http:/assist.daps.dla.mil;quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this draw
19、ing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Exten
20、ded operation at the maximum levels may degrade performance and affect reliability. 2/ Must be able to withstand the additional PDdue to that circuit test, e.g., IOS. The PDnumber is based upon dc values. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
21、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90937 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and
22、as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for
23、non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 C
24、ase outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Block diagram. The block diagram shall be as specified on
25、figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirr
26、adiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Ma
27、rking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RH
28、A product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for devic
29、e classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed man
30、ufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted
31、 to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate o
32、f conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notifi
33、cation to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the m
34、anufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-
35、PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90937 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical perfor
36、mance characteristics. Limits Test Symbol Test conditions -55C TC +125C unless otherwise specified Group A subgroups Min Max Unit IOH= -3 mA 2.4 High level output voltage VOHVCC= 4.5 V, VIH= 2.0 V, VIL= 0.8 V IOH= -12 mA 1, 2, 3 2.0 V Low level output voltage VOLVCC= 4.5 V, IOL= 48 mA VIH= 2.0 V, VI
37、L= 0.8 V 1, 2, 3 0.55 V Input clamp voltage VICVCC= 4.5 V, IIN= -18 mA 1, 2, 3 -1.2 V IIH1VCC= 0.0 V VIN= 7.0 V 100 High level input current IIH2VCC= 5.5 V VIN= 2.7 V 1, 2, 3 35 A Low level input current IILVCC= 5.5 V, VIN= 0.5 V 1, 2, 3 -20 A Output current IOSVCC= 5.5 V, VOUT= 0.0 V 1/ 1, 2, 3 -10
38、0 -225 mA ICCHOutputs high 31 ICCLOutputs low 49 Supply current ICCZVCC= 5.5 V, Outputs disabled 1, 2, 3 14 mA IOZHVOUT= 2.7 V 50 Off state output leakage current IOZLVCC= 5.5 V VOUT= 0.5 V 1, 2, 3 -50 A Functional test See 4.4.1b 2/ 7, 8 tPLH1.6 5.2 tPHLVCC= 5.0 V, CL= 50 pF R1= R2= 500 , See figur
39、e 4 9 2.7 6.9 tPLH6.0 Propagation delay time, nA to nY tPHLVCC= 4.5 V and 5.5 V dc, CL= 50 pF R1= R2= 500 , See figure 4 10, 11 2.7 8.0 tPZH3.4 9.0 tPZLVCC= 5.0 V, CL= 50 pF R1= R2= 500 , See figure 4 9 5.0 10.4 tPZH11.1 Output enable time, n G to nY tPZLVCC= 4.5 V and 5.5 V dc, CL= 50 pF R1= R2= 50
40、0 , See figure 4 10, 11 5.0 12.8 tPHZ3.0 7.4 tPLZVCC= 5.0 V, CL= 50 pF R1= R2= 500 , See figure 4 9 2.8 7.3 tPHZ9.4 Output disable time, n G to nY tPLZVCC= 4.5 V and 5.5 V dc, CL= 50 pF R1= R2= 500 , See figure 4 10, 11 2.8 9.9 ns 1. Not more than one output should be tested at one time and the dura
41、tion of the test condition shall not exceed one second. 2. Functional tests shall be conducted at input test conditions of 0.4 V VIL 0.8 V and 2.0 V VIH 2.4 V, for VCC= 4.5 V and repeated at VCC= 5.5 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
42、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90937 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Case outline C and D 2 Case outline C and D 2 Terminal number Terminal symbol Terminal number Terminal symbol 1 1 G NC 11 4Y NC 2 1A 1 G 12 4A 3Y 3
43、 1Y 1A 13 4 G 3A 4 2 G 1Y 14 VCC3 G 5 2A NC 15 - NC 6 2Y 2 G 16 - 4Y 7 GND NC 17 - NC 8 3Y 2A 18 - 4A 9 3A 2Y 19 - 4 G 10 3 G GND 20 - VCCNC = No internal connection FIGURE 1. Terminal connections. Inputs Outputs G A Y L H H L L L H X Z H = High voltage level Z = High impedance L = Low voltage level
44、 X = Irrelevant FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90937 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 FIGURE 3. B
45、lock diagram. NOTES: 1. CL = 50 pF, includes probe and jig capacitance. 2. RL = R1 = r2 = 500 Test S1 tPLHOpen tPHLOpen tPZHOpen tPZLClosed tPHZOpen tPLZClosed FIGURE 4. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH
46、S-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90937 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 NOTES: 1. Output with internal conditions such that the output is low except when disabled by the output control. 2. Output with internal cond
47、itions such that the output is high except when disabled by the output control. 3. All input pulses are supplied by the generators having the following characteristics: PRR 10 MHz, ZO= 50, tr 2.5 ns, tf 2.5 ns. 4. The outputs are measured one at a time with one transition per measurement. FIGURE 4.
48、Test circuit and switching waveforms - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90937 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device man
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