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本文(DLA SMD-5962-90940 REV B-2012 MICROCIRCUIT DIGITAL BIPOLAR CMOS OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf)为本站会员(赵齐羽)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-90940 REV B-2012 MICROCIRCUIT DIGITAL BIPOLAR CMOS OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redraw the switching waveforms in figure 4, switching waveforms and test circuit. Update boilerplate to MIL-PRF-38535 requirements. Editorial changes throughout. - LTG 06-05-09 Thomas M. Hess B Update boilerplate to MIL-PRF-38535 requirements. Ed

2、itorial changes throughout. jak 12-06-04 Thomas M. Hess REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Marcia B. Kelleher DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD M

3、ICROCIRCUIT DRAWING CHECKED BY Thomas J. Ricciuti THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE

4、DRAWING APPROVAL DATE 90-10-02 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-90940 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E211-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90940 DLA ALND AND M

5、ARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes a

6、re available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 90940 01 M R A Federal stock class designator RHA designator (see 1.2.1

7、) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device cla

8、ss M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01

9、 54BCT623 Octal bus transceiver with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirem

10、ents for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator

11、Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot

12、 for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90940 DLA ALND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) -0.5 V dc to +7.0

13、 V dc DC input voltage range (VIN): Including I/O ports -0.5 V dc to +5.5 V dc Excluding I/O ports . -0.5 V dc to +7.0 V dc Voltage applied to any output in the high state (VOUT) . -0.5 V dc to VCCVoltage applied to any output in the disabled state (VOUT) . -0.5 V dc to +5.5 V dc Current into any ou

14、tput in the low state 96 mA Input clamp current (IIC) . -30 mA Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) . 717 mW 2/ Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 R

15、ecommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) . 2.0 V dc Maximum low level input voltage (VIL) 0.8 V dc Maximum high level output current (IOH): A port . -3.0 mA B port . -12 mA Maximum low level output current (IOL): A port

16、 . +20 mA B port . +48 mA Case operating temperature range (TC) . -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Must be able to withstand the additional

17、 PDdue to the short circuit test, e.g., IOS. The PDlimit is based upon dc values. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90940 DLA ALND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4

18、 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the so

19、licitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMEN

20、T OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Ph

21、iladelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has b

22、een obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect

23、 the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physi

24、cal dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be a

25、s specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. 3.3 Electri

26、cal performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test req

27、uirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90940 D

28、LA ALND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to

29、 space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance w

30、ith MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. F

31、or device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an a

32、pproved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-P

33、RF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot

34、 of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verific

35、ation and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option

36、 of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

37、 MICROCIRCUIT DRAWING SIZE A 5962-90940 DLA ALND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Test conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min M

38、ax High level output voltage A port VOHVCC= 4.5 V VIH= 2.0 V or VIL= 0.8 V IOH= -1 mA 1, 2, 3 All 2.5 V IOH= -3 mA 2.4 B port IOH= -3 mA 2.4 IOH= -12 mA 2.0 Low level output voltage A port VOLVCC= 4.5 V VIH= 2.0 V or VIL= 0.8 V IOL= 20 mA 1, 2, 3 All 0.50 V B port IOL= 48 mA 0.55 Input clamp voltage

39、 VICVCC= 4.5 V, IIN= -18 mA 1, 2, 3 All -1.2 V High level input current A or B port IIH11/ VCC= 5.5 V, VIN= 5.5 V 1, 2, 3 All 1.0 mA OEAB or OEBA 0.1 A or B port IIH21/ VCC= 5.5 V, VIN= 2.7 V 70 A OEAB or OEBA 20 Low level input current A or B port IIL1/ VCC= 5.5 V, VIN= 0.5 V 1, 2, 3 All -0.65 mA O

40、EAB or OEBA -0.60 Short-circuit output current A port IOS2/ VCC= 5.5 V, VOUT= 0.0 V 1, 2, 3 All -60 -150 mA B port -100 -225 Supply current, outputs high ICCH3/ VCC= 5.5 V Outputs open 1, 2, 3 All 53 mA Supply current, outputs low ICCL3/ 92 Supply current, outputs disabled ICCZ11 Functional tests 4/

41、 See 4.4.1b 7, 8 All Propagation delay time, Am to Bm tPLH1CL= 50 pF R1 = R2 = 500 See figure 4 VCC= 5.0 V 9 All 0.5 4.7 ns VCC= 4.5 V and 5.5 V 10, 11 0.5 5.3 tPHL1VCC= 5.0 V 9 All 1.7 6.9 VCC= 4.5 V and 5.5 V 10, 11 1.7 7.6 Propagation delay time, Bm to Am tPLH2VCC= 5.0 V 9 All 0.9 5.9 ns VCC= 4.5

42、 V and 5.5 V 10, 11 0.9 6.8 tPHL2VCC= 5.0 V 9 All 1.8 7.6 VCC= 4.5 V and 5.5 V 10, 11 1.8 8.3 Propagation delay time, output enable, OEBA to Am tPZH1VCC= 5.0 V 9 All 3.1 9.1 ns VCC= 4.5 V and 5.5 V 10, 11 3.1 10.7 tPZL1VCC= 5.0 V 9 All 3.3 9.6 VCC= 4.5 V and 5.5 V 10, 11 3.3 11.3 See footnotes at en

43、d of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90940 DLA ALND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics

44、 Continued. Test Symbol Test conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Propagation delay time, output enable, OEAB to Bm tPZH2CL= 50 pF R1 = R2 = 500 See figure 4 VCC= 5.0 V 9 All 2.0 6.8 ns VCC= 4.5 V and 5.5 V 10, 11 2.0 7.8 tPZL2VCC= 5.0

45、 V 9 All 2.7 8.0 VCC= 4.5 V and 5.5 V 10, 11 2.7 9.3 Propagation delay time, output disable, OEBA to Am tPHZ1VCC= 5.0 V 9 All 1.9 8.3 ns VCC= 4.5 V and 5.5 V 10, 11 1.9 10.6 tPLZ1VCC= 5.0 V 9 All 1.1 7.0 VCC= 4.5 V and 5.5 V 10, 11 1.1 8.1 Propagation delay time, output disable, OEAB to Bm tPHZ2VCC=

46、 5.0 V 9 All 1.1 6.5 ns VCC= 4.5 V and 5.5 V 10, 11 1.1 8.0 tPLZ2VCC= 5.0 V 9 All 0.3 6.3 VCC= 4.5 V and 5.5 V 10, 11 0.3 7.2 1/ For I/O ports, the parameters IIH2and IILinclude the off-state output current. 2/ Not more than one output should be shorted at one time and the duration of the test condi

47、tion should not exceed one second. 3/ ICCHand ICCLare measured in the A to B mode. 4/ Functional tests shall be conducted at input test conditions of 0.4 V VIL 0.8 V and 2.0 V VIH 2.4 V for VCC= 4.5 V and is repeated for VCC= 5.5 V. Provided by IHSNot for ResaleNo reproduction or networking permitte

48、d without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90940 DLA ALND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type All Case outlines R, S, and 2 Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND B8 B7 B6 B5 B4 B3 B2 B1 OEBA VCCFIGURE 1. Terminal connections. Inputs Operation OEBA OEAB L L B data to A bus H H A data to B bus H L Isolation L H B data to A bus,

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