DLA SMD-5962-91516 REV B-2009 MICROCIRCUIT DIGITAL HIGH SPEED CMOS 3-TO-8 LINE DECODER DEMULTIPLEXER WITH ADDRESS LATCH MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate to current criteria and form. Make corrections to 1.3, 1.4, and 1.5. Make corrections to ICC. Add RLto test circuit in figure 5. - jak 97-10-03 Monica L. Poelking B Update boilerplate paragraphs to current MIL-PRF-38535 require

2、ments. Correct low level output voltage (VOL) test condition current IOHto IOLin the Table I - MAA 09-01-26 Charles F. Saffle REV SHEET REV B B SHEET 15 16 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby STANDARD MICROC

3、IRCUIT DRAWING CHECKED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 3-TO-8 LINE DECODER/DEMULTIPLEXER WITH ADDRESS LATC

4、H, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-04-16 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-91516 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E068-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-

5、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91516 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space ap

6、plication (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962

7、- 91516 01 Q E A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified

8、RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the ci

9、rcuit function as follows: Device type Generic number Circuit function 01 54HC137 3-to-8 line decoder/demultiplexer with address latches, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device cla

10、ss Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as d

11、esignated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 16 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for R

12、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91516 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V d

13、c to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC + 0.5 V dc DC output voltage range (VOUT). -0.5 V dc to VCC+ 0.5 V dc DC input clamp current (IIK) (VI 0 V, VI VCC) . 20 mA DC output clamp current (IOK) (VO 0 V, VO VCC) . 20 mA DC output current (IOUT) (VOUT= 0 to VCC) (per output) 25 mA

14、 DC VCCor GND current . 50 mA Maximum power dissipation (PD). 500 mW 4/ Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC). See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. 1/

15、 2/ 3/ 5/ Supply voltage range (VCC) 2.0 V dc to +6.0 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT) +0.0 V dc to VCCCase operating temperature range (TC) -55C to +125C Minimum high level input voltage (VIH): VCC= 2.0 V 1.5 V dc VCC= 4.5 V 3.15 V dc VCC= 6.0 V 4.2 V dc Ma

16、ximum low level input voltage (VIL): VCC= 2.0 V 0.3 V dc VCC= 4.5 V 0.9 V dc VCC= 6.0 V 1.2 V dc Input rise and fall time (tr, tf): VCC= 2.0 V 1000 ns VCC= 4.5 V 500 ns VCC= 6.0 V 400 ns Minimum pulse duration; GL low (tw): VCC= 2.0 V 120 ns VCC= 4.5 V 24 ns VCC= 6.0 V 20 ns Minimum setup time; A, B

17、, and C before GL (tSU) VCC= 2.0 V 115 ns VCC= 4.5 V 23 ns VCC= 6.0 V 20 ns Minimum hold time; A, B, and C after GL (th) VCC= 2.0 V 5 ns VCC= 4.5 V 5 ns VCC= 6.0 V 5 ns Maximum high level output current (IOH)-5.2 mA Maximum low level output current (IOL)+5.2 mA 1/ Stresses above the absolute maximum

18、 rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. The maximum junction temperature may be exceeded for allowable short duration burn-in screening conditions in accordance with method 5004 of MIL-STD-883. 2/ Unle

19、ss otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ For packages with multiple VCCand GND pins, this value represents the total current into all VCC or G

20、ND. 5/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91516 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHE

21、ET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in th

22、e solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPART

23、MENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, P

24、hiladelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has

25、been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affec

26、t the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and phys

27、ical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be

28、as specified on figure 1. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. Prov

29、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91516 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirr

30、adiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements

31、 shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not

32、 feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be

33、 in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate

34、of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to b

35、e listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF

36、-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot o

37、f microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for

38、 device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment fo

39、r device class M. Device class M devices covered by this drawing shall be in microcircuit group number 37 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91516 DEFENSE SUPPLY

40、CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Table I. Electrical performance characteristics. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +6.0 V unless otherwise specified VCCGroup A subgroups Min Max Un

41、it VOH1 For all inputs affecting output under test VIN= VIHor VIL, VIH= 1.5 V, VIL= 0.3 V For all other inputs, VIN= VCCor GND IOH= -20A 2.0 V 1, 2, 3 1.9 VOH2 For all inputs affecting output under test VIN= VIHor VIL, VIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOH= -20A 4.5 V 1, 2

42、, 3 4.4 VOH3 For all inputs affecting output under test VIN= VIHor VIL, VIH= 4.2 V, VIL= 1.2 V For all other inputs, VIN= VCCor GND IOH= -20A 6.0 1, 2, 3 5.9 1 3.98 VOH4 For all inputs affecting output under test VIN= VIHor VIL, VIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOH= -4 mA

43、 4.5 V 2, 3 3.7 1 5.48 High level output voltage 3006 VOH5 For all inputs affecting output under test VIN= VIHor VIL, VIH= 1.5 V, VIL= 0.3 V For all other inputs, VIN= VCCor GND IOH= -5.2 mA 6.0 V 2, 3 5.2 V VOL1For all inputs affecting output under test VIN= VIHor VIL, VIH= 1.5 V, VIL= 0.3 V For al

44、l other inputs, VIN= VCCor GND IOL= +20A 2.0 V 1, 2, 3 0.1 VOL2For all inputs affecting output under test VIN= VIHor VIL, VIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOL= +20A 4.5 V 1, 2, 3 0.1 VOL3For all inputs affecting output under test VIN= VIHor VIL, VIH= 4.2 V, VIL= 1.2 V For

45、 all other inputs, VIN= VCCor GND IOL= +20A 6.0 1, 2, 3 0.1 1 0.26 VOL4For all inputs affecting output under test VIN= VIHor VIL, VIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOL= +4 mA 4.5 V 2, 3 0.4 1 0.26 Low level output voltage 3007 VOL5For all inputs affecting output under test

46、 VIN= VIHor VIL, VIH= 1.5 V, VIL= 0.3 V For all other inputs, VIN= VCCor GND IOL= +5.2 mA 6.0 V 2, 3 0.4 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91516 DEFENSE SUPPLY C

47、ENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Table I. Electrical performance characteristics - Continued. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +6.0 V unless otherwise specified VCCGroup A subgroups

48、 Min Max Unit 1 +0.1 Input leakage current high 3010 IIHFor input under test, VIN= VCCFor all other inputs, VCCor GND 6.0 V 2, 3 +1.0 A 1 -0.1 Input leakage current low 3009 IILFor input under test, VIN= VCCFor all other inputs, VCCor GND 6.0 V 2, 3 -1.0 A 1 8.0 Quiescent supply current ICCFor all inputs, VIN= VCCor GND 6.0 V 2, 3 160 A Input capacitance CINTA= +25C, VIN= VCCor GND See 4.4.1c 5.0 V 4 10 pF Power dissipation capacitance CPD4/ CL= 50 pF minimum, f = 1 MHz See 4.4.1c 5.0 V 4 85 pF VIL= 0.3 V, VIH= 1.5 V 2.0 V VIL= 0.9 V,