DLA SMD-5962-91712 REV A-2009 MICROCIRCUIT HYBRID LINEAR 16-BIT ANALOG TO DIGITAL CONVERTER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add note to table II, Group C end-point test parameters. -gz 09-04-16 Joseph D. RodenbeckTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 1

2、1 12 PMIC N/A PREPARED BY Shelly Jenkins DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Alan Barone MICROCIRCUIT, HYBRID, LINEAR, 16-BIT, ANALOG

3、 TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-03-10 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-91712 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E274-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-

4、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlin

5、es and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 91712 01 H X X Federal RHA Device Device C

6、ase Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked

7、 with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 AD1385TD/883B A/D converter, 16-bit, sampling, 500 kHz 1.2.3 Device class designator. This de

8、vice class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows:

9、Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing

10、version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, an

11、d D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception

12、(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835

13、and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 48 Dual-in-line Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

14、 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (+VS). +18 V dc Negative supply voltage (-VS) -18 V dc Positive logic supply voltage (VDD). +7 V dc Negative

15、logic supply voltage (VEE) . -7 V dc Power dissipation (PD) . 4.125 W Thermal resistance, junction-to-case (JC). 12C/W Thermal resistance, junction-to-ambient (JA) 38C/W Storage temperature range -65C to +150C Lead temperature (soldering, 60 seconds) +300C Electrostatic discharge sensitivity (ESDS)

16、. Class 1 Constant acceleration 10,000 G Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Positive supply voltage range (+VS). +15 V dc Negative supply voltage range (-VS) -15 V dc Positive logic supply voltage (VDD). +5 V dc Negative logic supply voltage (VEE) . -5 V dc Analog

17、input voltage range 5 V dc and 10 V dc Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwi

18、se specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface

19、 Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ from the Standardization D

20、ocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable

21、 laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or netwo

22、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes

23、D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, mod

24、ify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2

25、 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall

26、be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operati

27、ng temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device s

28、hall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables f

29、ormat) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control b

30、y the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall aff

31、irm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and in

32、spection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accord

33、ance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring act

34、ivity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electri

35、cal test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

36、 SIZE A 5962-91712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit Analog inpu

37、t impedance AIZ 7 01 2.45 2.55 k Differential non-linearity DNL 2/ 4,5,6 01 -1.0 +1.0 LSB Gain error GE 5 V dc and 10 V dc ranges 1 01 -0.15 +0.15 %FSR Gain drift GE T 5 V dc and 10 V dc ranges 2,3 01 -15 +15 ppm/C Bipolar zero BPZ 5 V dc and 10 V dc ranges 1 01 -0.1 +0.1 %FSR Bipolar zero drift BPZ

38、 T 5 V dc and 10 V dc ranges 2,3 01 -15 +15 ppm/C Power supply rejection ratio 3/ PSRR +VS= +14.25 V to +15.75 V -VS= -14.25 V to -15.75 V VDD= +4.75 V to +5.25 V VEE= -4.75 V to -5.25 V 1,2,3 01 -0.1 +0.1 %FSR/VSignal to noise ratio SNR1 f = 5.371 kHz, 5 V FSR, VIN= -0.4 dB 4,5,6 01 90 dB Signal to

39、 noise ratio SNR2 f = 98.389 kHz, 5 V FSR, VIN= -0.4 dB 4,5,6 01 90 dB Signal to noise ratio SNR3 f = 197.510 kHz, 5 V FSR, VIN= -0.4 dB 4,5,6 01 88 dB Peak distortion PHD1 f = 5.371 kHz, 5 V FSR, VIN= -0.4 dB 4,5,6 01 -90 dB Peak distortion PHD2 f = 98.389 kHz, 5 V FSR, VIN= -0.4 dB 4,5,6 01 -88 dB

40、 Peak distortion PHD3 f = 197.510 kHz, 5 V FSR, VIN= -0.4 dB 4,5,6 01 -82 dB See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

41、43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit Total harmonic distortion THD1 f = 5.371 kHz, 5 V FSR, VIN= -0.4

42、 dB 4,5,6 01 -90 dB Total harmonic distortion THD2 f = 98.389 kHz, 5 V FSR, VIN= -0.4 dB 4,5,6 01 -88 dB Total harmonic distortion THD3 f = 197.510 kHz, 5 V FSR, VIN= -0.4 dB 4,5,6 01 -82 dB Signal to noise ratio SNR4 f = 5.371 kHz, 10 V FSR, VIN= -0.4 dB 4,5,6 01 90 dB Signal to noise ratio SNR5 f

43、= 98.389 kHz, 10 V FSR, VIN= -0.4 dB 4,5,6 01 90 dB Signal to noise ratio SNR6 f = 197.510 kHz, 10 V FSR, VIN= -0.4 dB 4,5,6 01 88 dB Peak distortion PHD4 f = 5.371 kHz, 10 V FSR, VIN= -0.4 dB 4,5,6 01 -90 dB Peak distortion PHD5 f = 98.389 kHz, 10 V FSR, VIN= -0.4 dB 4,5,6 01 -80 dB Peak distortion

44、 PHD6 f = 197.510 kHz, 10 V FSR, VIN= -0.4 dB 4,5,6 01 -74 dB Total harmonic distortion THD4 f = 5.371 kHz, 10 V FSR, VIN= -0.4 dB 4,5,6 01 -90 dB Total harmonic distortion THD5 f = 98.389 kHz, 10 V FSR, VIN= -0.4 dB 4,5,6 01 -80 dB Total harmonic distortion THD6 f = 197.510 kHz, 10 V FSR, VIN= -0.4

45、 dB 4,5,6 01 -74 dB See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97

46、 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit Digital input voltage, logic 1 VIH3/ 7,8 01 2.25 V Digital input voltage, logic 0 VIL3/ 7,8 01 0.8 V IILVIN= 0 V 3/ 7,8 0

47、1 -200 +200 A Digital input current IIHVIN= 5 V 3/ 7,8 01 -200 +200 A Digital output voltage, logic 1 VOHIOH= -3.2 mA 3/ 7,8 01 2.4 V Digital output voltage, logic 0 VOLIOL= +3.2 mA 3/ 7,8 01 0.4 V VREFIL= 2 mA, RL= 5 k, Pin 32 connected to Pin 39 1 01 9.990 10.010 V Internal reference voltage VREF

48、2,3 01 -15 +15 ppm/C Supply currents +IS-ISIDDIEE3/ 1,2,3 01 80 75 160 200 mA mA mA mA Power dissipation PD3/ 7,8 01 4.125 ns 1/ Unless otherwise specified, all tests are performed using a 50 percent duty cycle, 10 MHz clock, 15 V dc and 5 V dc power supply voltages, and a 500 kHz conversion rate. 2/ No missing codes; DNL is derived from a histogram test using a full scale sine wave input. 3/ Subgroups 2, 3, and 8 shall be tested for ini