DLA SMD-5962-92009 REV B-1995 MICROCIRCUIT DIGITAL CMOS VMEBUS ADDRESS CONTROLLER MONOLITHIC SILICON《硅单块 VME总线地址控制器 互补金属氧化物半导体 数字微型电路》.pdf

1、 H 9999996 0068304 999 H DEFENSE LOGISTICS AGENCY DEFENSE ELECTRONICS SUPPLY CENTER 1507 WILMINGTON PIKE DAYTON, OH 45444- 5765 DESC-ELDC (Mr. L. Gauder/(AV 986) 513-296-8526/1tg) 2 0 1995 SUBJECT: Notice of Revision (NOR) 5962-R074-95 for Standardized Military Drawing (SMD) 5962-92009. Military/Ind

2、ustry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR should be attached to the subject SMD fo

3、r future reference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DESC a certificate of compliance. This is evidenced by an existing active current certificate of compliance on file at

4、 DESC along with a DESC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DESC is otherwise notified. If you have comments or questions, please contact Larry T. Gauder at (AV)986-8526/(513)296-8526. 2 Encl / LKhn-s-

5、Ar. AL- MONICA L. POELKING /.- Chief, Custom Microelectronics Branch Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-b 0068105 825 1. DATE (YYMMDD 1 95 - 03 -30 NOTICE OF REVISION (NOR) This revision described belou has been authorized for the docune

6、nt listed. Form Approved OMB No. 0704-0188 2- ACTIVITY NO. t- 3. DOOAAC 4. ORIGINATOR b. ADDRESS (Street, City, State, Zip Code) 6. NOR NO. 5. CAGE CODE 5962-R074-95 7. CAGE CODE 8. DOCUMENT NO. Last) Dayton, OH 45444-5765 . 67268 5962-92009 Defense Electronics Supply Center 1507 Uilmington Pike MIC

7、ROCIRCUIT, DIGITAL, CMOS, VMEbus ADDRESS CONTROLLER, MONOLITHIC SILICON I 9. TITLE OF DOCUMENT a. CURRENT b. NEU N/A A B I 11. ECP NO. I 10. REVISION LETTER a. (X one) X (1) Existing docunent supplemented by the NOR may be used in manufacture. (2) Revised docunent must be received before manufacture

8、r may incorporate this change. (3) Custodian of master docunent shall make above revision and furnish revised document. Sheet 1: Revisions ltr colum; add 8W1. Revisions description colum; add “Changes in accordance with NOR 5962-R074-95“ Revisions date colum; add 1195-03-30 II. Revision level block;

9、 add WI. Rev status of sheets; For sheets 1 and 13 change to “Bn8. e. SIGNATURE Monica L. Poelking b. REVISION COMPLETED (Signature) Larry T. Gauder Sheet 13: FIGURE 1. Case outline. - continued, delete table in its entirety and replace as follows: f. DATE SIGNED (Y YMMDD ) 95 - 03-30 c. DATE SIGNED

10、 (YYMMDD 1 95- 03-30 DESC-ELDC d. TITLE Chief, Custom Microelectronics 15a. ACTIVITY ACCOMPLISHING REVISION DESC-ELDC DD Fora 1695, APR 92 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-W 9999996 OOb8LOb 761 W N ND/NE R R1 NOTES 13. DESCRIPTIOI OF R

11、EVISIOI - COIITIYUED 160 160 4 40 40 5 - 0.28 0.64 0.011 O. 025 2.55 0.010 6 Docunent No.: 5962-92009 Revision: Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE LOGISTICS ACjtNLY DEFENSE ELECTRONICS SUPPLY CENTER 1507 WILMINGTON PIKE DAYTON, O

12、H 45444- 5765 DESC-ELDC (Mr. Hess/(AV 986) 513-296-8526/tmh) SUBJECT: Notice of Revision (NOR) 5962-R052-95 for Standardized Military Drawing (SMD) 5962-92009. MilitarylIndustry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD

13、holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR should be attached to the subject SMD for future reference. Those companies who were listed as approved sources of supply prior to this action have ?greed to actions ta

14、ken on devices for which they had previously provided DESC a certificate of compliance. This is evidenced I;- an existing active current certificate of compliance on file at DESC along with a DESC record of verbal coordination. The certificate of compliance for these devices is considered concurrenc

15、e with the new revision unless DESC is otherwise notified. If you have comments or questions, please contact Tom Hess at (AV)986-8526 /(513)296-8526. 1 Encl MONICA L. POELKING Chief, Custom Microelectronics Branch Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

16、rom IHS-,-,- b OOb8LO8 534 b. ADDRESS (Street, City, State, Zip Code) 5. CAGE CODE 4. ORIGINATOR a. TYPED NME (First, Middle Initial, Defense Electronics Supply Center 67268 7. CAGE CODE 1507 Wilmington Pike Dayton, OH 45444-5765 67268 Last) NOTICE OF REVISION (NOR) This revision described below has

17、 been authorized for the document listed. 6. NOR NO. 5962-R052-95 8. DOCUMENT NO. 5962-92009 1. UAlt Form Approved OME NO. 0704-0188 (YYMMDD) 1 94-12-21 1 9. TITLE OF DOCUMENT MICROCIRCUIT, DIGITAL, CMOS, VMEBUS ADDRESS CONTROLLER, MONOLITHIC SIL ICON 11. ECP NO. 10. REVISION LETTER a. CURRENT b. NE

18、W Initial A a. (X one) Al 1 13. DESCRIPTION OF REVISION X (1) Existing document supplemented by the NOR may be used in manufacture. (2) Revised document must be received before manufacturer may incorporate this change. (3) Custodian of mister document shall make above revision and furnish revised do

19、cument. Sheet 1: Revisions ltr column; add “A“. Revisions description column; add “Changes in accordance with NOR 5962-R052-95“. Revisions date culumn; add “94-12-21“. Revision level block; add “A“. Rev status of sheets; For sheets 1, 15, add “A“. Sheet 15: Change terminal connections of Case outlin

20、e Y the following: See continuation page. Change status of revision level to A. b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT DESC-ELDC 14. THIS SECTION FOR GOVERNMENT USE ONLY c. TYPED NAME (First, Middle Initial, Last) Thomas M. Hess d. TITLE Acting Chief, Custom Microelectronics Branch

21、15a. ACTIVITY ACCOMPL IStiING RIVISION DESC-ELDC e. SIGNATURE f. DATE SIGNED (YYMMDD) Thomas M. Hess 94-12-21 ti. REV I SION COMPi ETED (Signature) c. DATE SIGNED (YYMMDD) Thomas M. Hess 94- 12-21 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-l 1 1

22、3. DESCRIPTION OF REVISION - CONTINUED vss vss LADO SWDCN AS LDMACK rmIR ABLN PIO11 vss PO4 IORD LAD1 VsSt-L LER BLT RE FGT SLSELO GFSEL VDD vss SISELI ID8 IOIO ID9 VSS ID1 I ID12 1013 ID14 WORD IO( 15) cclAcuLL 7 vss Rev is ion: A NOR No.: 5962-R052-95 Sheet: 1 OF 2 I 9 10 11 12 13 14 15 16 17 18 1

23、9 20 21 12 23 24 25 76 27 28 29 30 31 32 33 34 35 36 31 38 39 40 99P“z 96 LA1 92 p LA! 89 e IA1 J Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-999999b 0068110 192 LTR REVISIONS I I I DESCRIPTION DATE (YR-M-DA) APPROVED PMIC N/A - STANDARDIZED MILI

24、TARY PREPARED BY Thomas M. Hess DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 CHECKED BY Thanas M. Hess DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A MICROCIRCUIT, DIGITAL, CMOS, VMEbus ADDRESS CONTROLLER, MONOLITHIC SILICON AP

25、PROVED BY Monica L. Poelking 8 DRAWING APPROVAL DATE 93- 05-07 I 1 REVISIOW LEVEL SHEET 1 OF 33 I ESC FORM 193 SIZE CAGE CODE 5962-92009 A 67268 JUL 91 DISTRIBUTION STATlhENT A. Approved for public release; distribution is unlimited. 5962-Em-93 Provided by IHSNot for ResaleNo reproduction or network

26、ing permitted without license from IHS-,-,-1. SCOPE 1.1 Scape. This drawing forms a part of a one part - me part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and MI and space application (device classes S an

27、d VI, and a choice of case outlines and lead finishes are aveilable and are reflected in the Part or Identifying Number (PIN). Device class H microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with comp

28、liant non-JAN devices“. available, a choice of Radiation Hardness Assurance (RHAI levels are reflected in the PIN. When I 1.2 K. The PIEI shall be as shown in the following example: STANDARDIZED MILITARY DUWING DEFENSE ELECTRONICS SUPPLY CENTER DATTON, OHIO 45444 5 962 - 92009 l I SIZE 5962-92009 b

29、REVISION LEVEL SHEET 2 o1 - I R -i- X - I i i i i I I Lead _I Case I Devi ce Devi ce II Federal RHA stock class designator type class out line finish designator (see 1.2.1) (see 4.2.2) designator (See 1.2.4) (see 1.2.5) 1 (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes M, B, and S

30、RHA marked devices shall meet the MIL-H-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-1-38535 specified RHA levels and shall be niarked with the appropriate RHA designator. A dash (-1 indicates a non-R

31、HA device. 1.2.2 Device typeW. The device type(s) shall identify the circuit function as foklows: Device type Generic number Circuit function o1 VAC068A VldEbus address controller 1.2.3 Device class designator. The device class designator shall be a single Letter identifying the product assurance le

32、vel as follows: Device class Device reauirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of HIL-STO-883 B or S Q or V Certification and qualification to MIL-it-38540 Certification and qualification to MIL-1-38535 1.2.4

33、Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follaws: Outline letter Descriptive desiqnator Terminals Package style X Y CMGA7-PI 45 See figure 1 145 Pin grid array 450 Flat pack 1.2.5 Lead finish. The Lead finish shall be as specified in ML-M-38510 Sor classes M

34、, B, and S OP MIL-1-38535 for classes Q and V. Finish letter “X“ shall not be marked en the microcircuit or its packaging. The “X“ designation is I for use in specifications when lead finishes A, 6, and C are considerrd acceptable and interchangeable without preference. DESC FORM 193A JUL 91 Provide

35、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-= 9999996 00b112 Tb5 m STAllDARDI ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTN, OHIO 45444 1.3 Absolute maximum ratinas. I/ SIZE 5962-92009 A REVISION LEVEL SHEET 3 Storage temperature range -

36、- - - - - - - - - - - - - - - Voltage on any pin with respect to ground - - - - - - - - Power dissipation (P ) - - - - - - - - - - - - - - - - - Lead temperature (soydering, 10 seconds) - - - - - - - - Thermal resistance, junction-to-case (OJc) -65OC to +15OoC -0.5 V dc to +7.0 V dc 1.5 W +26OoC Cas

37、e outline X See MIL-STD-1835 Case outline y - - - - - - - - - - - - - - - - - - - - Junction temperature (TJ) - - - - - - - - - - - - - - - - IO C/W +175C 1.4 Recommended operating conditions. Case operating temperature range (TC) - - - - - - - - - - Supply voltage (Vcc)- - - - - - - - - - - - - - -

38、 - - - - -55C to +125C 5.0 V dc IIOX 1.5 Digital.1oqic testinq for device classes Q and V. Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . XX percent g/ 2. APPLICABLE DOCUMENTS 2.1 Government specifications, standards, bulletin, and handbook. Unles

39、s otherwise specified, the following specifications, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATIONS MILITA

40、RY MIL-M-38510 - Microcircuits, General Specification for. MIL-1-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS MILITARY MIL-STD-480 - Configuration Control-Engineering Changes, Deviations and Waivers. MIL-STD-883 - Test Methods and Procedures for Microelectronics.

41、MIL-STD-1835 - Microcircuit Case Outlines. BULLETIN MILITARY MIL-BUL-103 - List cf Standardized Military Drawings (SMDs). HANDBOOK MILITARY MIL-HDBK-780 - Standardized Military Drawing.,. (Copies of the specifications, standards, buttetin, and handbock required by manufacturers in connection with sp

42、ecific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-= 99999b OOb8LL3 TL STANDARDIZED MILITARY DRAWING 2.2 Order of Precedence. In t

43、he event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in

44、 conjunction with compliant non-JAN devices“ and as specified herein. The individual item requirements for device classes B and S shall be in accordance with MIL-M-38510 and as specified herein. included in this SMD. MIL-1-38535, the device manufacturers Quality Management (QM) plan, and as specifie

45、d herein. Item reauirements. For device classes B and S, a full electrical characterization table for each device type shall be The individual item requirements for device classes Q and V shall be in accordance with 3.2 Desian, construction, and physical dimensions. The design, construction, and phy

46、sical dimensions shall be as specified in MIL-M-38510 for device classes M, 8, and S and MIL-1-38535 for device classes Q and V and herein. 3.2.1 3.2.2 Terminal connections. Case outline(s1. The case outline($) shall be in accordance with 1.2.4 herein and figure 1. The terminal connections shall be

47、as specified on figure 2. SIZE 5962-92009 A 3.2.3 Block diagram. 3.2.4 Radiation exposure circuit. The block diagram shall be as specified on figure 3. The radiation exposure circuit shall be specified when available. I 3.3 Electrical performance characteristics and postirradiation Parameter limits.

48、 Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups sp

49、ecified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M shall be in accordance with MIL-STD-883 (see 3.1 herein). MIL-BUL-103. Q and V shall be in accordance with MIL-1-38535. Certification/compliance mark. In addition, the manufactu