DLA SMD-5962-92034 REV G-2013 MICROCIRCUIT LINEAR OPERATIONAL AMPLIFIER WIDEBAND LOW DISTORTION MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make changes to case outline 2 pin assignments; for pin 2, delete “NC” and substitute “VNONIN”; for pin 4 delete “NC” and substitute “-VCC”; for pin 6, delete “VINV” and substitute “NC”; for pin 8, delete “VNONINV” and substitute “NC”; for pin 9,

2、 delete “-VCC” and substitute “NC”; pin 12, delete “NC” and substitute “VOUT”; for pin 14, delete “VOUT” and substitute “+VCC”; for pin 16, delete “+VCC” and substitute “NC”; for pin 20, delete “NC” and substitute “VINV”. Changes in accordance with N.O.R. 5962-R140-94. 94-03-30 M. A. FRYE B Table I;

3、 Common mode rejection ratio, CMRR, test: In symbol column, delete “4/” and substitute “3/”. Changes in accordance with N.O.R. 5962-R011-95. 94-10-14 M. A. FRYE C Table I. 2nd harmonic distortion test. With a condition of “2 VPP at 20 MHz”, for a group A subgroup 5, delete the max limit of “-60 dBc”

4、 and substitute “-57 dBc”. Changes in accordance with N.O.R. 5962-R202-97. 97-02-07 R. MONNIN D Make change to second harmonic distortion test as specified in TABLE I. Redrawn. - ro 97-12-11 R. MONNIN E Make changes to theta JC and theta JA as specified under 1.3. Make changes +VO, -VO, GFPL, GFPH,

5、GFR1, GFR2, HD2, and HD3 tests as specified under table I. - ro 99-02-26 R. MONNIN F Replaced reference to MIL-STD-973 with reference to MIL-PRF-38535. - ro 05-04-01 R. MONNIN G Update document paragraphs to current MIL-PRF-38535 requirements. - ro 13-08-07 C. SAFFLE REV SHEET REV SHEET REV STATUS R

6、EV G G G G G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY DAN WONNELL DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEF

7、ENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, OPERATIONAL AMPLIFIER, WIDEBAND, LOW DISTORTION, MONOLITHIC SILICON DRAWING APPROVAL DATE 93-02-01 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 67268 5962-92034 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E394-13 Provided

8、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92034 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance cl

9、ass levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is refle

10、cted in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 92034 01 M P A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator

11、. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicat

12、es a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 CLC409 Operational amplifier, wideband, low distortion 1.2.3 Device class designator. The device class designator is a single letter identifying the

13、product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4

14、 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535

15、for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92034 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 3 DSCC

16、FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) 7 V dc Common mode input voltage (VCM) . VCCDifferential input voltage . +10 V dc Output current (IO) 70 mA Power dissipation (PD) 1.2 W Junction temperature (TJ) . 175C Lead temperature (soldering, 10 seconds) +300C Storage temp

17、erature range . -65C to +125C Thermal resistance, junction to ambient (JA): Case P . 132C/W 77C/W at 500 linear feet per minute (LFPM) Case 2 . 97C/W 67C/W at 500 linear feet per minute (LFPM) Thermal resistance, junction to case (JC): Case P . 26C/W Case 2 . 27C/W 1.4 Recommended operating conditio

18、ns. Supply voltage (VCC) 5 V dc Gain range 1 to 10 Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein

19、. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcirc

20、uits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil or from the S

21、tandardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, super

22、sedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo repr

23、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92034 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q an

24、d V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in

25、 accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, ap

26、pendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless oth

27、erwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified

28、in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations

29、, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535,

30、 appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes

31、Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of

32、supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein

33、 or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits d

34、elivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for

35、 device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.1

36、0 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

37、 SIZE A 5962-92034 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Input bias curren

38、t, noninverting IBN1,2 01 -22 +22 A 3 -44 +44 Input bias current, average temperature coefficient, noninverting DIBN3/ 2 01 -125 +125 nA/C 3 -275 +275 Input bias current, inverting IBI1 01 -20 +20 A 2 -30 +30 3 -36 +36 Input bias current, average temperature coefficient, inverting DIBI3/ 2 01 -100 +

39、100 nA/C 3 -200 +200 Input offset voltage VIO1 01 -4.5 +4.5 mV 2 -9.5 +9.5 3 -8.5 +8.5 Input offset voltage, average temperature coefficient DVIO3/ 2 01 -50 +50 V/C 3 Supply current, no load ICC1,2,3 01 14.2 mA Power supply rejection ratio PSRR -VCC= -4.5 V to -5.0 V, +VCC= +4.5 V to +5.0 V 1,2,3 01

40、 45 dB Output current +IO3/ 1,2 01 +50 mA 3 +36 -IO1,2 -50 3 -36 Output voltage range +VO3/ 1,2 01 +3.2 V 3 +3.0 -VO1,2 -3.2 3 -3.0 Noninverting input resistance RIN3/ 1 01 500 k 2 1000 3 250 Noninverting input capacitance CIN3/ 4,5,6 01 2 pF See footnotes at end of table. Provided by IHSNot for Res

41、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92034 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1

42、/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Output impedance RO3/ 1,2 01 0.2 3 0.3 Common mode rejection ratio CMRR VCM= 1.0 V 3/ 4,5,6 01 45 dB Small signal bandwidth SSBW -3 dB bandwidth 3/ 4,6 01 250 MHz VOUT75 MHz, 4 0.8 VOUT1 MHz 3/ 4,6 01 2.8

43、 nV / 5 3.1 Hz Equivalent input noise, inverting current ICN 1 MHz 3/ 4,6 01 18 pA / 5 20 Hz Equivalent input noise, noninverting current NCN 1 MHz 3/ 4,6 01 4.0 pA / 5 4.5 Hz Equivalent input noise, total noise floor SNF 1 MHz 3/ 4,6 01 -155 dBm 5 -154 1 Hz Equivalent input noise, total integrated

44、noise INV 1 MHz to 150 MHz 3/ 4,6 01 47 V 5 52 1/ Unless otherwise specified, RL= 100 , VCC= 5 V dc, AV= +2, feedback resistor (RF) = 250 , gain resistor (RG) = 250 . 2/ The algebraic convention, whereby the most negative value is a minimum and the most positive a maximum, is used in this table. Neg

45、ative current shall be defined as conventional current flow out of a device terminal. 3/ Guaranteed, if not tested. 4/ This parameter is group A sample tested only and is excluded from final electrical testing, but is guaranteed to the limits specified. Provided by IHSNot for ResaleNo reproduction o

46、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92034 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines P 2 Terminal number Terminal symbol 1 NC NC 2 VINVVNONINV3 VNONINVNC 4 -VCC-

47、VCC5 NC NC 6 VOUTNC 7 +VCCNC 8 NC NC 9 - NC 10 - NC 11 - NC 12 - VOUT13 - NC 14 - +VCC15 - NC 16 - NC 17 - NC 18 - NC 19 - NC 20 - VINVFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

48、A 5962-92034 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accord