DLA SMD-5962-92049 REV C-2004 MICROCIRCUIT HYBRID LINEAR 90-VOLT SYNCHRO TO DIGITAL CONVERTER《90瓦特同步到数字转换器 直线式混合微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R113-96. 96-04-22 K. A. Cottongim B Correct drawing title. Clarify figure 2. Update drawing requirements to MIL-PRF-38534. 01-03-20 Raymond Monnin C Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-06-18

2、 Raymond Monnin REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dl

3、a.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 90-VOLT, SYNCHRO TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-01-14 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-92049 SHEET 1

4、 OF 11 DSCC FORM 2233 APR 97 5962-E253-04 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92049 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE

5、 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance level

6、s are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 92049 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2

7、.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: De

8、vice type Generic number Circuit function Frequency Accuracy 1 LSB 01 SDC-14572-112 14-bit, 90 V S/D converter 400 Hz 4 min 02 SDC-14574-112 14-bit, 90 V S/D converter 60 Hz 4 min 03 SDC-14577-112 14/16-bit, 90 V S/D converter 400 Hz 4 min 04 SDC-14579-112 14/16-bit, 90 V S/D converter 60 Hz 4 min 0

9、5 SDC-14577-114 14/16-bit, 90 V S/D converter 400 Hz 2 min 06 SDC-14579-114 14/16-bit, 90 V S/D converter 60 Hz 2 min 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38

10、534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Sta

11、ndard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited tempera

12、ture range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class.

13、 These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers in

14、ternal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92049 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C S

15、HEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 26 Rectangular, bottom leaded, chip carrier 1.2.5 Lead finish. The lead finish shall be as specified

16、in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC). +7.0 V dc Negative supply voltage (VEE) . -7.0 V dc Reference input voltage 130 V rms Digital input voltage range. -0.3 V dc to +7.0 V dc Power dissipation, TA= +125C (PD). 170 mW Thermal resistance junction-to-case (J

17、C) . 8.0C/W Thermal resistance junction-to-ambient (JA) 20C/W Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Positive supply voltage (VCC). +4.75 V dc to +5.25 V dc Negative supply voltage (VEE) . -4.75 V dc to -5.25 V d

18、c Reference input voltage range 10 V rms to 130 V rms Reference input carrier frequency range: Device types 01, 03, and 05 360 Hz to 5000 Hz Device types 02, 04, and 06 47 Hz to 1000 Hz Signal input voltage range. 81 V rms to 99 V rms Ambient operating temperature range (TA) -55C to +125C 2. APPLICA

19、BLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMEN

20、T OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List

21、of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-

22、5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stre

23、sses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI

24、ZE A 5962-92049 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with

25、MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requi

26、rements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and p

27、hysical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall

28、 be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical te

29、st requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufa

30、cturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample

31、, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-

32、VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of

33、MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with

34、MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a

35、. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the

36、inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAor TCas specified in the approved manufacturers QM plan. b. Interim and final electrical test parameters shall be as specified in table II herein, except interi

37、m electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92049 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990

38、 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A subgroups Device type Min Max Unit 01,02 14 A = 0 14 Resolution 1/ RES 2/ A = 1 7,8A,8B 03-06 16

39、Bits 01,02 -4 +4 03,04 -13 +13 Output accuracy 3/ AOUT 7,8A,8B 05,06 -7 +7 LSB Accuracy repeatability 3/ 4/ AR 7,8A,8B All -1.0 +1.0 LSB Reference input voltage range 4/ VIN14,5,6 All 10 130 V rms Single ended 270 Reference input impedance 4/ ZIN1Differential 4,5,6 All 540 k Reference input common m

40、ode range 4/ VCM14,5,6 All -200 +200 V pk Signal input common mode range 4/ VCM24,5,6 All -180 +180 V pk Line-to-line 123 Signal input impedance 4/ ZIN2 Line-to-ground 4,5,6 All 80 k Digital output low voltage 1/ VOLIOL= -1.6 mA 1,2,3 All 0.4 V Digital output high voltage 1/ VOHIOH= 0.4 mA 1,2,3 All

41、 2.8 V Output leakage current 4/ IOZ1,2,3 All -20 +20 A Digital input A. VIN= 2.0 V 03-06 pass/ fail Digital input high voltage 1/ VIHDigital inputs INH, EL, and EM. VIN= 2.0 V 1,2,3 01-06 pass/ fail See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted

42、without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92049 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C VCC= +5 V dc,

43、VEE= -5 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Digital input A. VIN= 0.8 V 03-06 pass/ fail Digital input low voltage 1/ VILDigital inputs INH, EL, and EM. VIN= 0.8 V 1,2,3 01-06 pass/ fail EL, EM, INH, internal pull-up 01,02 -2 -10 Digital input current 1/ IINA,

44、internal pull down 4,5,6 03-06 200 A Inhibit voltage 1/ VINHNo digital angles change while INH is logic 0 and analog input is rotating 7,8A,8B All 0.8 V Enable voltage 1/ VEEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device types 01, 02, and bits 9 through 14/16

45、for device types 03 through 06. 7,8A,8B All 0.8 V Disable voltage 1/ (high impedance) VDEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device types 01, 02, and bits 9 through 16 for device types 03 through 06. 7,8A,8B All 2.0 V Positive supply voltage ICCVCC= +5.25

46、V 1,2,3 All +17 mA Negative supply voltage IEEVEE= -5.25 V 1,2,3 All -17 mA Analog velocity output voltage VOUT5/ 7,8A,8B All 3.24 4.00 V Bandwidth 1/ BW 7,8A,8B All 72 134 Hz 1/ These parameters are tested on a go-no-go basis only or in conjunction with other measured parameters and are not directl

47、y testable. 2/ Programmable to 14-bit or 16-bit resolution. 3/ Output accuracy is measured at angles from 0, to 180, in 15 increments, and at 225, 270, and 315. 4/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guarantee

48、d to the limits specified in table I for all lots not specifically tested. 5/ Analog output voltage is tested at 8 revolutions per second (rps) for device type 01, 1 rps for device type 02, 2 rps for device types 03 and 05, and 0.25 rps for device types 04 and 06. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92049 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC