DLA SMD-5962-92166 REV C-2007 MICROCIRCUIT LINEAR ADJUSTABLE STEP-UP VOLTAGE REGULATOR MONOLITHIC SILICON《硅单块 稳压器逐渐增加可调试直线式微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add case outline Y. Make changes to 1.2.4, 1.3, figure 1, and figure 2. 95-06-01 M. A. FRYE B Drawing updated to reflect current requirements. -ro 01-09-18 R. MONNIN C Drawing updated as part of 5 year review. -rrp 07-06-06 Robert M. Heber REV SH

2、ET REV C C SHET 15 16 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RICK OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY RAJESH PITHADIA COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS

3、 AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL FRYE MICROCIRCUIT, LINEAR, ADJUSTABLE, STEP-UP, VOLTAGE REGULATOR, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-03-15 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-92166 SHEET 1 OF 16 DSCC FORM

4、 2233 APR 97 5962-E308-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92166 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This

5、 drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radia

6、tion Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 92166 01 M X X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see

7、1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the ap

8、propriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LTC1062 Adjustable, step-up voltage regulator 1.2.3 Device class designator. The device class designator

9、is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and q

10、ualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 4 Flange mount Y See figure 1 5 Single row flange mount 1.2.5 Lead finish. The lead finish is as spe

11、cified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92166 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-39

12、90 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) 45 V Output switch voltage (VSWITCH) . 65 V Output switch current (ISWITCH) 6.0 A 2/ Power dissipation (PD) . Internally limited Storage temperature range. -65C to +150C Junction temperature (TJ).

13、+150C Lead temperature (soldering, 10 seconds) . +260C Thermal resistance, junction-to-case (JC): Case X 1.5C/W Case Y 1.6C/W at 2 W Thermal resistance, junction-to-ambient (JA): Case X 35C/W Case Y 57C/W at 1 W, no air flow 1.4 Recommended operating conditions. Input voltage range (VIN) 3.5 V to 40

14、 V Output switch voltage range (VSWITCH). 0 V to 60 V Output switch current range (ISWITCH). 3.0 A Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part

15、of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARD

16、S MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available onl

17、ine at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited her

18、ein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum lev

19、els may degrade performance and affect reliability. 2/ Output current cannot be internally limited when the device is used as a step-up regulator. To prevent damage to the switch, the current must be externally limited to 6.0 A. However, output current is internally limited when the device is used a

20、s a flyback or forward converter regulator. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92166 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQ

21、UIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or f

22、unction as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall

23、 be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified

24、 on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified

25、 in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with th

26、e PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA de

27、signator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “

28、Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the req

29、uirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an appr

30、oved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conform

31、ance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product

32、(see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable re

33、quired documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 52 (see MIL-PRF-38535, appendix A).Provided by IHSNo

34、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92166 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Condit

35、ions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max SYSTEM PARAMETERS Output voltage VOUTVIN= 5 V to 10 V, 1 01 11.60 12.40 V ILOAD= 100 mA to 800 mA 2,3 11.40 12.60 Line regulation VOUT/ VIN= 3.5 V to 10 V, 1 01 50 mV VINILOAD= 300 mA 2,3 100 Load regu

36、lation VOUT/ VIN= 5 V, 1 01 50 mV ILOADILOAD= 100 mA to 800 mA 2,3 100 DEVICE PARAMETERS Input supply current ISVFEEDBACK= 1.5 V 1 01 10 mA (switch off) 2,3 14 ISWITCH= 2.0 A, VCOMP= 2.0 V, 1 50 (maximum duty cycle) 2,3 85 Input supply under- voltage lockout VUVISWITCH= 100 mA 1 01 2.70 3.10 V 2,3 2

37、.65 3.15 Reference voltage VREFMeasured at FEEDBACK pin, VCOMP= 1.0 V, 1 01 1.214 1.246 V VIN= 3.5 V to 40 V 2,3 1.206 1.254 Error amplifier input bias current IBVCOMP= 1.0 V 1 01 300 nA 2,3 800 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted witho

38、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92166 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specifie

39、d Group A subgroups Device type Limits Unit Min Max DEVICE PARAMETERS continued. Error amplifier transconductance gm ICOMP= -30 A to +30 A, 1 01 2400 4800 mho VCOMP= 1.0 V 2,3 1600 5800 Error amplifier voltage gain AVOLVCOMP= 1.1 V to 1.9 V, 2/ 1 01 500 V/V RCOMP= 1.0 M 2,3 250 Error amplifier outpu

40、t swing VEAOVFEEDBACK= 1.0 V, 1 01 2.2 5.0 V upper limit 2,3 2.0 5.0 VFEEDBACK= 1.5 V, 1 0.40 lower limit 2,3 0.55 Error amplifier output current IEAOVFEEDBACK= 1.0 V to 1.5 V, 1 01 130 300 A VCOMP= 1.0 V 2,3 90 400 Soft start current ISSVFEEDBACK= 1.0 V, 1 01 2.5 7.5 A VCOMP= 0 V 2,3 1.5 9.5 Maximu

41、m duty cycle DCISWITCH= 100 mA, 1 01 93 % VCOMP= 1.5 V 2,3 90 Switch leakage current ILVFEEDBACK= 1.5 V, 1 01 -1.0 300 A VSWITCH= 65 V, switch off 2,3 -1.0 600 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MI

42、CROCIRCUIT DRAWING SIZE A 5962-92166 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Lim

43、its Unit Min Max DEVICE PARAMETERS continued. Switch saturation voltage VSATVCOMP= 2.0 V, 1 01 0.7 V ISWITCH= 2.0 A, maximum duty cycle 2,3 0.9 NPN switch current limit INPNVCOMP= 2.0 V 1 01 3.7 5.3 A 2,3 3.0 6.0 Oscillator frequency fOMeasured at SWITCH pin, 4 01 48 56 kHz ISWITCH= 100 mA 5,6 42 62

44、 1/ VIN= 5 V, ISWITCH= 0 A, and VFEEDBACK= VREF. 2/ A 1.0 M resistor is connected to the compensation pin (error amplifier output) to ensure accuracy in measuring AVOL. In actual applications, the compensation pins load resistance should be 10 M, resulting in AVOLthat is typically twice the guarante

45、ed minimum limit. 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form,

46、fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualifica

47、tion and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883.

48、(1) Test condition A, B,C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein. Provided by IHSNot for ResaleNo