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本文(DLA SMD-5962-92167 REV B-2007 MICROCIRCUIT LINEAR POSITIVE FIXED 12 VOLT STEP-UP VOLTAGE REGULATOR MONOLITHIC SILICON《硅单块 逐渐增加稳压器12瓦特固定正极直线式微型电路》.pdf)为本站会员(eastlab115)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-92167 REV B-2007 MICROCIRCUIT LINEAR POSITIVE FIXED 12 VOLT STEP-UP VOLTAGE REGULATOR MONOLITHIC SILICON《硅单块 逐渐增加稳压器12瓦特固定正极直线式微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. 01-10-16 R. MONNIN B Update drawing as part of 5 year review. -rrp 07-06-08 Robert M. Heber REV SHET REV SHET REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 1

2、3 14 PMIC N/A PREPARED BY MARCIA B. KELLEHER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, POSITIVE, FIX

3、ED, 12 VOLT, STEP-UP VOLTAGE REGULATOR, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-04-06 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-92167 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E340-06 Provided by IHSNot for ResaleNo reproduction or networking

4、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92167 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability

5、(device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as

6、 shown in the following example: 5962 - 92167 01 M X X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devic

7、es meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s)

8、. The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LM1577-12 Positive, fixed, 12 volt, step-up voltage regulator 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows

9、: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline

10、(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 4 Flange mount 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided b

11、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92167 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) 45 V Ou

12、tput switch voltage (VSWITCH) . 65 V Output switch current (ISWITCH) 6.0 A 2/ Power dissipation (PD) . Internally limited Storage temperature range. -65C to +150C Junction temperature (TJ). +150C Lead temperature (soldering, 10 seconds) . +260C Thermal resistance, junction-to-case (JC) 1.5C/W Therma

13、l resistance, junction-to-ambient (JA) . 35C/W 1.4 Recommended operating conditions. Input voltage range (VIN) 3.5 V to 40 V Output switch voltage range (VSWITCH). 0 V to 60 V Output switch current range (ISWITCH). 3.0 A Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS

14、2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE S

15、PECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of S

16、tandard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 1911

17、1-5094.) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Output current cannot be internally limited when the device is used as a step-up regulator. To prevent damage t

18、o the switch, the current must be externally limited to 6.0 A. However, output current is internally limited when the device is used as a flyback or forward converter regulator. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DR

19、AWING SIZE A 5962-92167 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in

20、this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the

21、 device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as spec

22、ified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outline shall be i

23、n accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless other

24、wise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in

25、 table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations,

26、the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, a

27、ppendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q

28、and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of su

29、pply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device clas

30、s M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this dr

31、awing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M,

32、 DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M dev

33、ices covered by this drawing shall be in microcircuit group number 52 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92167 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218

34、-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max SYSTEM PARAMETERS Output voltage VOUTVIN= 5 V to 10 V, 1 01 11.60 12.40 V ILOAD=

35、100 mA to 800 mA 2,3 11.40 12.60 Line regulation VOUT/ VIN= 3.5 V to 10 V, 1 01 50 mV VINILOAD= 300 mA 2,3 100 Load regulation VOUT/ VIN= 5 V, 1 01 50 mV ILOADILOAD= 100 mA to 800 mA 2,3 100 DEVICE PARAMETERS Input supply current ISVFEEDBACK= 14 V 1 01 10 mA (switch off) 2,3 14 ISWITCH= 2.0 A, VCOMP

36、= 2.0 V, 1 50 (maximum duty cycle) 2,3 85 Input supply under- voltage lockout VUVISWITCH= 100 mA 1 01 2.70 3.10 V 2,3 2.65 3.15 Reference voltage VREFMeasured at FEEDBACK pin, VCOMP= 1.0 V, 1 01 11.76 12.24 V VIN= 3.5 V to 40 V 2,3 11.64 12.36 Error amplifier transconductance gm ICOMP= -30 A to +30

37、A, 1 01 225 515 mho VCOMP= 1.0 V 2,3 145 615 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92167 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEE

38、T 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max DEVICE PARAMETERS continued. Error amplifier voltage gain AVOLVCOMP= 1.1 V to 1.6 V, 2/ 1 01 50 V/

39、V RCOMP= 1.0 M 2,3 25 Error amplifier output swing VEAOVFEEDBACK= 10.0 V, 1 01 2.2 5.0 V upper limit 2,3 2.0 5.0 VFEEDBACK= 15.0 V, 1 0.40 lower limit 2,3 0.55 Error amplifier output current IEAOVFEEDBACK= 10.0 V to 15.0 V, 1 01 130 300 A VCOMP= 1.0 V 2,3 90 400 Soft start current ISSVFEEDBACK= 10.0

40、 V, 1 01 2.5 7.5 A VCOMP= 0 V 2,3 1.5 9.5 Maximum duty cycle DCISWITCH= 100 mA, 1 01 93 % VCOMP= 1.5 V 2,3 90 Switch leakage current ILVFEEDBACK= 15 V, 1 01 -1.0 300 A VSWITCH= 65 V, switch off 2,3 -1.0 600 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking per

41、mitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92167 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherw

42、ise specified Group A subgroups Device type Limits Unit Min Max DEVICE PARAMETERS continued. Switch saturation voltage VSATVCOMP= 2.0 V, 1 01 0.7 V ISWITCH= 2.0 A, maximum duty cycle 2,3 0.9 NPN switch current limit VCOMP= 2.0 V 1 01 3.7 5.3 A 2,3 3.0 6.0 Oscillator frequency fOMeasured at SWITCH pi

43、n, 4 01 48 56 kHz ISWITCH= 100 mA 5,6 42 62 1/ VIN= 5 V, ISWITCH= 0 A, and VFEEDBACK= VREF. 2/ A 1.0 M resistor is connected to the COMPENSATION pin (error amplifier output) to ensure accuracy in measuring AVOL. In actual applications, the COMPENSATION pins load resistance should be 10 M, resulting

44、in AVOLthat is typically twice the guaranteed minimum limit. 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification

45、 in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be

46、conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a.

47、 Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outp

48、uts, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92167 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97

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