DLA SMD-5962-92232-1993 MICROCIRCUIT DIGITAL FAST CMOS OCTAL BUFFER LINE DRIVER WITH NONINVERTING THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING MONOLIT.pdf

1、SMD-59b2-92232 E 7999996 0047384 22T D LTR DESCRI PTION DATE (YR-MO-DA) APPROVED PMIC N/A STANDARDIZED MILITARY DRAWING REV SHEET REV SHEET THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE t 15 16 17 AMSC N/A I m 193 JUL 91 DISTRIBUTION STATEMENT A. I PR

2、EPARED BY Joseph A. Kerby SIZE A CAGE CODE 5962-92232 67268 CHECKED BY Thomas J. Ricciuti APPROVED BY Monica L. Poelking DRAW I NG APPROVAL DATE 93-08-27 REVISION LEVEL DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 5962-E152-93 Approved for public release; distribution is unlimited. Provided

3、by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-92232 9999996 0047385 Lbb I 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high

4、 reliability (device classes B, QI and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class 6 microcircuits in accordance with 1

5、.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN. 1.2 m. The PIN shall be as shown in the following example: 5962 92232 o1 M R X T 1- Lead T 1 Cas

6、e I 1 Devi ce I Devi ce I RHA I Federa 1 stock class designator tw class outline finish designator (See 1.2.1) (See 1.2.2) designator (See 1.2.4) (See 1.2.5) LA (See 1.2.3) / Draw i ng number 1.2.1 RHA desiqnator. Device classes M, 6, and S RHA marked devices shall meet the MIL-M-38510 specified RHA

7、 levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s1. The device type(s) shall id

8、entify the circuit function as follows: Device type Generic number Circuit function 01, o2 54FCT241T Octal buffer/line driver with noninverting three-state outputs, TTL conpatible inputs and limited output voltage swing. Octal buffer/line driver with noninverting three-state outputs, TTL corrpatible

9、 inputs and limited output voltage swing. Octal buffer/line driver with noninverting three-state outputs, TTL compatible inputs and limited output voltage swing. 03, 04 54FCT241AT 05, 06 54F CT24 1 CT 1.2.3 Device class desimator. The device class designator shall be a single letter identifying the

10、product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STO-883 B or S Q or V Certification and qualification to MIL-M-38510 Certification and qualification to

11、 MIL-1-38535 1.2.4 Case outline(s1. The case outline(s) shall be as designated in MIL-STO-1835, and as follows: Outline letter Descriptive des i qnator Termi na 1 s Packaqe style R S 2 GDIPl-T20 or CDIP2-T20 20 dual-in-1 ine GDFPZ-F20 or CDFP3-F20 20 flat package CQCC1-N2O 20 leadless-chip-carrier p

12、ackage 1.2.5 Lead finish. The lead finish shall be as specified in MIL-M-38510 for classes M, B. and S or MIL-1-38535 for classes Q and V. Finish letter “X“ shall not be marked on the microcircuit or its packaging. for use in specifications when lead finishes A, E, and C are considered acceptable an

13、d interchangeable without preference. The “X“ designation is S TANDAID1 Z ED 5962-92232 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92232 9999996

14、 0047386 OT2 W 1.3 Absolute maximum ratinas. I/ 2J 3/ Supply voltage range (V ) - - - - - - - - - - - - - - - - - DC input votage range fb - - - - - - - - - - - - - - - - DC output voltage range (6, T) - - - - - - - - - - - - - - - DC input clamp current (I y (V - - - - - - - - DC output clamp curre

15、nt (iK ) (iOUT - -0.5 V and +7.0 V) - - DC output source current (P DC output sink current (IoL?Heu$t- - - - - - - - - - DC ground current IGND) - - - - - - - - - - - - - - - - - - Storage temperature range (T G) - - - - - - - - - - - - - - Case temperature under bias - - - - - - - - - - - - Maximum

16、 power dissipation (PD) - - - - - - - - - - - - - - - Lead tenperature (soldering, 10 seconds) - - - - - - - - - - Thermal resistance, junction-to-case (OJc) - - - - - - - - - Junction tenperature (TJ) - - - - - - - - - - - - - - - - - 1.4 Recomnded overatins conditions. 2/ 3/ Supply voltage range (

17、Vc ) - - - - - - - - - - - - - - - - - input voltage range (V ,j - - - - - - - - - - - - - - - - - Output voltage range - - - - - - - - - - - - - - - - Maximum low level input voltage (V ) - - - - - - - - - - - Minimum high level input voltage (6: ) - - - - - - - - - - - Case operating temperature r

18、ange (7 - - - - - - - - - - - Maximum input rise and fall rate (tr, td): (from VIN - 0.3 V to 2.7 V, 2.7 V to .3 V) - - - - - - - Maximum high level output current (Io ) - - - - - - - - - - Maximum low level output current (IoLy - - - - - - - - - - - 1.5 Disital loqic testina for device classes Q an

19、d V. Fault coverage masuremnt of manufacturing - -0.5 V) -_- DC Vcc current (Ic ) - - - - - - - - - - - - - - - - - - - - logic tests (MIL-STD-883, test method 5012) - - - - - - - -0.5 V dc to +7.0 V dc -0.5 V dC to Vcc + 0.5 V dC -0.5 V dc to Vcc + 0.5 V dc -20 nd I20 nd -30 m4 +70 m4 1260 nd +550

20、ml -65C to +135OC 500 mW +3OO0C See MIL -STD- 1835 +175OC 4/ 4J -65C to +15OoC +4.5 V dc to +5.5 V dc t0. V dc to Vcc +OSO V dc to Vcc 0.8 V 2.0 v -55OC to +125OC 5 ns/V -12 nd 48 mA XX percent s/ - iJ Stresses above the absolute maximm rating may cause permanent damage to the device. Extended opera

21、tion at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. $1 The limits for the parameters specified herein shall apply over the full specified Vcc range and case temperature range of -55C to +125OC. 4J For Vcc 2 6.5 V,

22、the upper limit on the range is limited to 7.0 V. CI/ Values will be added when they become available. STANDARDIZED 1- SYE I I 5962-9r32 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET iESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or ne

23、tworking permitted without license from IHS-,-,-SMD-5962-92232 W 9999996 0047387 T39 M 2. APPLICABLE DOCUMENTS 2.1 Government specifications, standards, bullettn, and handbook. Unless otherwise specified, the following specifications. standards, bulletin, and handbook of the issue listed in that iss

24、ue of the Department of Defense Inde of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified here in . SPEC IF I CATIONS MIL I TARY MIL-M-38510 - Microcircuits, General Specification for. MIL- 1-38535 - Integrated Circuits, Manufacturing, Ge

25、neral Specification for. STANDARDS MILITARY MIL-STD-480 - Configuration Control-Engineering Changes, Deviations and Waivers. MIL -STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-1835 - Microcircuit Case Outlines BULLETIN MILITARY MIL-BUL-103 - List of Standardized Military Drawin

26、gs (SMDs). HANDBOOK MIL I TARY MIL -HDBK - 780 - Standardized Military Drawings. (Copies of the specifications, standards, bulletin, and handbook required by manufacturers in connection with specifi acquisition functions should be obtained from the contracting activity or as directed by the contract

27、ing activity.) herein, the text of this drawing shall take precedence. 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device class M shall be in accordance with

28、1.2.1 Of MIL-STD-883, “Provisions for the use of MIL-STO-883 in conjunction with compliant non-JAN devices“ and as specified herein. The individual item requirements for device classes B and S shall be in accordance with MIL-M-38510 and as specified herein. MIL-1-38535, the device manufacturers Qual

29、ity Management (QM) plan, and as specified herein. specified in MIL-M-38510 for device classes M, B, and S and MIL-1-38535 for device classes Q and V and herein. The individual item requirements for device classes Q and V shall be in accordance with 3.2 Desiqn, construction, and physical dimensions.

30、 The design, construction, and physical dimensions shall be as 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Loqic diaqram. The logic diagram shall be as specified

31、 on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The terminal connections shall be as specified on figure 1. The ground bounce load circuit and waveforms sha on figure 4. 1 be as speci 3.2.6 Switchinq waveforms and test circuit. The switching waveforms and test circuit shall be as speci

32、fied on figure 5. i el STANDARDIZED 5962-92232 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CWTER DAYTON, OHIO 45444 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-72232 ri99799L 0047388 975 STANDARDIZED MILITARY DRAWIN

33、G DEFENSE ELECTRONICS SUPPLY CENTER 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified ierein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I md shall apply over the full case operat

34、ing temperature range. Test conditions for these specified characteristics and imits are as specified in table i. 3.4 Electrical test requirements. The electrical test requiremrnts shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Markin

35、q. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M shall be in accordance with MIL-STD-883 (see 3.1 herein). (IL-EUL-103. Marking for device classes B and S shall be in accordance with MIL-M-38510. 1 and V shall be in accordance with MIL-1-38535. YIL-STD-883 (s

36、ee 3.1 herein). in MIL-M-38510. In addition, the manufacturers PIN may also be marked as listed in Marking for device classes 3.5.1 Certification/comliance mark. The compliance mark for device class M shall be a “C“ as required in The certification mark for device classes B and S shall be a “J“ or “

37、JAN“ as required The certification mark for device classes Q and V shall be a “QML“ as required in MIL-1-38535. 3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a mnufacturer in order to be listed as an approved source of supply in MIL-BUL-103 (se

38、e 6.7.3 herein). For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.2 herein). listing as an approved source of supply for this drawing shall affirm that the nianufacturers pro

39、duct meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of MI L-I -38535 and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STD-883 (see 3.1 herein) o

40、r device classes E and S in MIL-M-38510 or for device classes Q and V in MIL-1-38535 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of chanqe for device class M. For device class M, notification to DESC-EC of change of product (see 6.2 herein) involving

41、devices acquired to this drawing is required for any change as defined in MIL-STD-480. 3.9 Verification and review for device class M. For device class M, DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offsh

42、ore documentation shall be mde available onshore at the option of the reviewer. this drawing shall be in microcircuit group number 37 (see MIL-M-38510, appendix E). The certificate of compliance submitted to DESC-EC prior to 3.10 Microcircuit qroup assiqnment for device classes M, E. and S. Device c

43、lasses M, E, and S devices covered by 3.11 Serialization for device class S. All device class S devices shall be serialized in accordance with MIL-M-38510. SIZE 5962-92232 A I DAYTON, OHIO 45444 I REVISION LEVEL I SHEET 5 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networki

44、ng permitted without license from IHS-,-,-SMD-5762-92232 9991776 0047387 801 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962-92232 A REVISION LEVEL SHEET 6 TABLE I. Electrical performance characteristics - continued. IUnlt Limits 31 Test and MIL-STD-883 t

45、est mthod L/ 1 Test conditions -55C S T S +125OC 2/ 4.5 v 5 b, 5 5.5 v unless otherwise specified vcc Group A subgroups Devi ce tnJe Al 1 Icc-0.5 v 7- Min 3.0 High level output vol tage 3006 OH1 4/ 4.5 v 1.2.3 For all inputs affecting output under test Forb11 other inputs IOH = -306pA or GND IN I Fo

46、r all inputs affecting output under test 1.2.3 2.4 Al 1 Al 1 Al 1 01.03. 05 02.04. 06 OH2 VOL 1 41 - VOL2 4.5 v 4.5 v 4.5 v 5.5 v Forl1 other inputs VIN - Vcc or GND 10“ = -12 ln4 Low level output vol tage 3007 For all inputs affecting output under test VIN = VI or VIL VIL = 0.8 V For all other inpu

47、ts VIN = Vcc or GND VIH = 2.1 v IoL = 300 I For all inputs affecting output under test 1.2.3 1,2 3 1 2,3 VIN = VI or VIL for all other inputs ;IH = 2.1 v IL = 0.8 V VIN = V or GND IoL = 48 I% Three-state output leakage current high 302 1 IOZH 51 61 “OUT = CC - OE1 = OE2 - VIH or V VIN = Vcc or GND S

48、ee footnotes at end of table. I -r 1 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SND-5762-92232 II ci99991L 0047390 523 Group A Vcc subgroups Limits 3J Min Max 5.5 v 1,2 -1.0 3 -10.0 1 -0.1 2.3 -2.0 4.5 V 1,2,3 -1.2 -1.3 5.5 v 1,2 1.0 3 5.0 1.2 o

49、. 1 3 1.0 5.5 v 1,2 -1.0 3 -5.0 1,2 -0.1 3 -1.0 4 10 GND GND 4 12 5.5 V 1,2,3 -60 -225 Test and MI L-STO-883 test mthod Unit pA v pl pA pF PF mR Three-state output leakage current low 3020 VIc- Negative input claw voltage 3022 VIN - vCc or GND For input under test IIN - -18 mR For input under test IIN = -15 mA Input current high 3010 IIL Input current low 3009 For input under test For all other inputs VIN = Vcc or G