DLA SMD-5962-92236 REV B-1996 MICROCIRCUIT DIGITAL FAST CMOS OCTAL D REGISTERS WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING MONOLITHIC SILICON《硅单.pdf

1、DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS 3990 EAST BROAD STREET COLUMBUS, OH 43216-5000 NOV 13 896 SUBJECT: Notice of Revision (NOR) 5962-R02 1-97 for Standard Microcircuit Drawing (SMD) 5962-92236 MilitaryAndustry Distribution The enclosed NOR is approved for use effective as of the

2、 date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR should be attached to the subject SMD for future reference. Those companies who were listed as approved sources of

3、supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active current certificate of compliance on file at DSCC with a DSCC record of verbal coordination. The certificate of complia

4、nce for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Mr. Bernard Miesse at (614) 692-0543 (DSN 850). 1 Encl MONICA L. POELKING Chief, Custom Microelectronics Team Provided by IHSNot for ResaleNo rep

5、roduction or networking permitted without license from IHS-,-,-SND-5962-92236 REV B m 999999b 0090183 791 m I. DATE (YYMMDD) 96-1 0-28 NOTICE OF REVISION (NOR) THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED. Form Approved OMB NO. 0704-0188 ublic repwng burden forthis diecc

6、n is estimated io average 2 hwrs per response including the time for reviewing instnictions searching existing data sources atherin and mainiahin the data needed and completing and reviewing the colle add I1Bl1. Revisions description column; add “Changes in accordance with NOR 5962-R021-971. Revisio

7、ns date colum; add 1196-10-2881. Revision level block; change from llAol to I1B8I. Rev status of sheets; for sheets 1 and 8, change from I1Al8 to IIB“. Table I, high level VCC bounce noise, VOHP, device types 01, 02 and 03; change maximun Limit from 1b60011 to 1170081. Table I, high level VCC bounce

8、 noise, VOHV, device types 01, 02 and 03; change maximun limit from 80-5501a to 18 -650“. Revision level block; change from “A“ to “B“. Sheet 8: 9. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT DSCC-VAC c. TYPED NAME (First, Middle Initial, Last) Monica L. Poelking 15a. ACTIVITY ACCOMPLISHING

9、 REVISION DSCC-VAC i TITLE Chief, Custom Microelectronics b. REVISION COMPLETED (Signature) Bernard J. Miesse e. SIGNATURE f. DATE SIGNED (YYMMDD) Monica L. Poelking 96-1 0-28 c. DATE SIGNED (YYMMDD) 96-1 0-28 DD Form 1695, APR 92 Previous edifions are obsolete. Provided by IHSNot for ResaleNo repro

10、duction or networking permitted without license from IHS-,-,-A NOTICE OF REVISION (NR) (See MIL-STO-480 for instructions) This revision described below has been authorized for the document listed. SMD-5962-9223b REV A 9999996 00433Lb OLT Form Apprwed OMB NO. 0704-0188 (-1 93-06-18 1. ORIGII(ATOR MME

11、 AMI AWRESS 2. CA6Em 3. mwo. efense Electronics Supply Center Dayton, Ohio 45444-5270 67268 4. CAGECOOE 5962-R175-93 5. OOCUCEKT wo. 5962-92236 67268 b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT DESC-ECC 12. ACTIVITY ACCOIIPLISHINS REVISION DESC-ECC I 6. TITLEOF l“EIIT I 7. REVISION LETER

12、 HICRWIRCUITS. DIGITAL. FRST CWS WAL D REGISTERS WITH THEE-STATE SIGNATiJRE AND TITLE DATE (mr00) Honica L. Poelking 93-06-18 Chief, Custom Microelectronics REVISION COHPLETED (Signature) DATE (YYMMW) Joseph A. Kerby 93-06-18 murs, m PATIEL INPUTS AIO LIHITED OUTPUT VOLTAGE WING. cw)WoLITHIC SILICON

13、 b Form 1695, Jbt 88 Previous 1 (Current) NW I (NW) A 8. ECP MI. edttons are obsolete. I no registered users 9. COIIFIGUIUTION ITDI (OR SY!SEH) TO WHICH ECP APPLIES 10. OESCRIPTION OF REVISIOII Sheet 1: Revisions ltt column: add “A“. Revisions description column: add “Changes in accordance with Revi

14、sions date colwm: add “93-06-18“. Revision level block: add “A“. Rev status of sheets: For sheets 1. 3, 6, 8, 11, add “A“. Sheet 3: 1.4, recomnended operating conditions, low level output current, IoL, change limit from “48 mA“ to “32 mA“ Revision level block; add “A“. Sheet 6: High level output vol

15、tage, V on one line and 02.04 and 06!h another line. For device types 01.03 and 05 change the minim limit of “3.0 V“ to 2.7 V“. For device types 02,04 and 06 the minim limit will stay at “3.0 V“. Low level output voltage, V Revision level block: add fi? Sheet 8: Table I. lar level ground bounce nois

16、e, VOLP. device types 01.02 and 03, maximum limits column, add “1750“. Table I, low level ground bounce noise, V Table I, high level Vcc bounce noise, VDH;bVdevice types 01.02 and 03, maxim limits column, add “600“. Table I, high level V Rev is i on 1 eve1 block : Edd “A“ Revision level block: add “

17、A“. NOR 5962-R175-93“. , change device type from “All“ to device types 01.02,and 03 change IoL condition from “48 win to “32 a“. , device types 01.02 and 03, maximim limits column, add “-1700“. bounce noise, VOHV, device types 01.02 and 03. maxim limits column, add “-550“. Sheet Il: u, delete last s

18、entence. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SND-5962-9223b REV A 999999b 0043337 T5b LTR DESCRIPTION DATE (YR-Mo-DA) APPROVED SHEET I I I 18 REV I I I 19 20 21 REV STATUS OF SHEETS SIZE A PMIC NIA CAGE CODE 596242236 67268 STANDARDIZED M

19、ILITARY DRAWING THIS DRAWING IS AVAILABLE FDR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE SE tWH 193 JUL 91 REV I I I SHEET 111213 PREPARED BY Joseph A. Kerby CHECKED BY Thomas J. Ricciuti APPROVED BY Monica L. Poelking DRAWING APPROVAL DATE 93-03-25 REVISIOW LEVEL DEFENSE ELECT

20、RON ICs SUPPLY CENTER DAYTON, OHIO 45444 5962-Elm-93 DISTRIBUTION STATEMENT A. Approved for public release; distribution is un1 tmtted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-9223b REV A 9999996 0043338 992 STANDARDIZED MILITARY DRA

21、WING DEFENSE ELECTRONCS SUPPLY CENTER 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part nunter documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V)

22、, and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Nunber (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STO-883, “Provisions for the use of MIL-STO-883 in conjunction with conplian

23、t non-JAN devices“. When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN. 1.2 m. The PIN shall be as shown in the following exanple: 5r i 92236 r 1 1 1 Federa 1 RHA Devi ce Device Case Lead stock class designator tupe class outline finish designator (See 1.2

24、.1) (See 1.2.2) designator (See 1.2.4) (See 1.2.5) LA (See 1.2.3) I Drawing number 1.2.1 RHA desianator. Device classes M, 8, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices sh

25、all meet the MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device t.me(sr. The device type(s) shall identify the circuit function as follows: Devi ce tm Generic number Circuit function 01, 04 02, 05 03, 06 54FCT

26、534T 54FCT534AT 54FCT534CT Octal D registers with three-state outputs, TTL compatible inputs and limited output voltage swing. Octal D registers with three-state outputs, TTL coapatible inputs and limited output voltage swing. Octal D registers with three-state outputs, lTL conpatible inputs and lim

27、ited output voltage swing. 1.2.3 Device class desianator. The device class designator shall be a single letter identifying the product assurance level as follows: Device class Devi ce reaui reinents documentat ion SIZE 5962-92236 A M Vendor self-certification to the requirements for non-JAN class B

28、microcircuits in accordance with 1.2.1 of MIL-STO-883 B or S Q or V Certification and qualification to MIL-M-38510 Certification and qualification to MIL-1-38535 1.2.4 Case outline(s1. The case outline(s) shall be as designated in MIL-STD-1835, and as follows: Outline letter Descri Dt ive des ianato

29、r Termina 1s Packaae style R S 2 GDIPl-T20 or CDIP2-T20 20 dual -in-1 ine GDFP2-F20 or CDFP3-F20 20 flat package CQCCl-N2O 20 leadless-chip-carrier package 1.2.5 Lead finish. The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-1-38535 for classes Q and V. Finish lette

30、r “X“ shall not be marked on the microcircuit or its packaging. The “X“ designation is for use in specifications when lead finishes A, El. and C are considered acceptable and interchangeable without preference. DAYTON, OHIO 45444 I I REVISION LEVEL I SHEET JUL 91 Provided by IHSNot for ResaleNo repr

31、oduction or networking permitted without license from IHS-,-,-SVD-5962-9223b REV A m 777797b 0043339 827 m 1.3 Absolute maxim ratinas. 1/ 21 3/ Supply voltage range (V ) - - - - - - - - - - - - - - - - - DC input voltage range f6 N) - - - - - - - - - - - - - - - - DC output voltage range (4 T) - - -

32、 - - - - - - - - - - - - DC input clamp current (I 7 (V - -0.5 V) - - - - - - - - - DC output clamp current (1 ) ($N - -0.5 V and +7.0 V) - - DC output source current (PK p8loutput - - - - - - - - - - DC output sifi current (oLYper output - - - - - - - - - - - Storage tenperature - OE - V or VIL vIH

33、 LH2.o v VT, 0.8 V OUT CC E - v or vIL = 0.8 V all other inms - Po v VOUT - GND TABLE I. Electrical Derforauince characteristics - continued. - Device type - Al 1 - vcc - 4.5 v Test conditions unless othenvge specif led -55OC s T +125C 2/ 4.5 v 1 f 1 5.5 v Test and MIL-STO-883 test method u Group A

34、rubgroupi Limits 3J Min 3.0 High level output voltage 3006 OH1 41 - “OH2 - voL1 !Y - VOL2 - OZH Ys/ 1.2.3 For all inputs affecting output under test IN 1 y IL YIH - 0.8 V ForIbll other inputs 4.5 v 1.2,3 2.4 ice-0.5 2.0 Icc-0.5 Icc-0. 5 - 0.20 - 0.55 - 1.0 10.0 0.1 2.0 -1.0 -10.0 -0.1 -2.0 - - - - 2

35、.4 Low level output voltage 3007 4.5 v VIN = V or VIL VI“ - 2ftl v V, 0.8 V Forkll other inputs For all inputs affecting output under test 4.5 v - 5.5 v - 5.5 v - VIN - V or VIL v - 0.8 v Forhll other inputs vIH 2!tj v rhree-state output leakage current high 3021 1.2 3 1 2.3 1.2 3 1 2.3 - Forkll oth

36、er inputs VIN - Vcc or GND bee-state output leakage current lOW 3020 I vIN = vCc or GND be footnotes at en STANMRDIZED WILITARY DRAWING DEFENSE ELECTROICS SUPPLY CENTER DAYTON, OHIO 45444 I I I I I I 5962-92236 I I REVISION LEVEL I SHEET JUL 91 Provided by IHSNot for ResaleNo reproduction or network

37、ing permitted without license from IHS-,-,-SMD-5762-92236 REV A = b 0043323 25T W ts y tiaX -1.2 -1.3 1.0 5.0 0.1 1.0 -1.0 :s - continued. - Unit v UA UA TABLE I. Electrical performance characterlsti Test conditions 4.5 V 5.5 v Hin 1,2,3 1.2 3 1.2 3 For input under test IIN - -18 nu9 01,02. 03 See 4

38、.4.1 TC = +25OC Al 1 REVISION LEVEL 5962-92236 SHEET 7 Test and MIL-STD-883 test method I/ l I- Negative input clamp voltage 3022 For input under test IIN = -15 nd 04,05, I nR Input current high 3010 For inwt under test 01,02, 03 04,051 06 v iv Forl!ll other inputs VIN - Vcc or GND Input current low

39、 3009 For input under test V - GND Forl!ll other inputs VIN = Vcc or GND Input capacitance 3012 See 4.4.1 TC - +25OC I output capacitance 301 2 Short circuit output current 3005 For all inputs I A1 ViNl=;bc or GND “OUT Dynamic Power supply current Outputs open I MHz.8 i t For input under test v =v -

40、2.1v For% 1 otker inputs VIN = Vcc or GNO Quiescent supply current delta, TTL input levels 3005 Al 1 ICCH For all inputs VIN - Vcc or GND Al 1 Qu i escent supp 1 y current output high 3005 See footnotes at end of table. STANDARDIZED MILITARY DUUING DEPIEINSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45

41、444 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SHD-Sb2-9223b REV A b O043324 196 STAHDDIZED SIZE HILITMY DRAWING A DEFENSE ELECTRONICS SUPPLY CEWTER MYTON, OHIO 45444 REVISION LEVEL Test and MIL-STD-883 test nethod I/ 5962-

42、92236 SHEET a Quiescent supply current output lOW 3005 Niescent supply current output three-state 3005 rotai supply current .OW level ground bounce mise .OW level ground bounce noise iigh level Vcc bounce noise Ugh level Vcc bounce noise ICCL - Iccz 5/ TABLE I. Electrical Derforniance characterlstic

43、s - continued. Test conditions unless otherwfge specif fed -55C 5 T I +125C 2J 4.5 v 5 f 5 5.5 v Device type For all inputs VIN - Vcc or GN Al 1 K=V For altother inputs VIN - Vcc or GND Al 1 - Outputs open, OE - GND f - 10 “2, Eh Duty cycle. One bit toggling - 5 MHz, For nonswitching inputs VIN = Vc

44、c or GND For switchlng inputs IN :i6 Or For switching inputs IN :siD Outputs open, 9 For switching OE - GN I inputs f - 10 MHz, 80% Duty cycle, Eight bit toggling For switchina Al 1 $i i: i TIL- +25 OC de figure 4 01,02, 04,05, 06 01,02, o3 04,05, o6 01,02, 03 04,05, 06 01,02 03 04.05 03 - - - vcc -

45、 i.5 V - i.5 v i.5 V - .O v - .O v - i.0 v - i.0 v Group A Unit subgroups Limits 3J 5ee footnotes at end of table. ESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-92236 REV A 9999996 0043325 O22 Group A subgroups Limits

46、y Test and HIL -STD-83 test method Unit Functional test icteristics Device All All 01.04 02.05 03.06 01.04 02.05 03.06 01.04 02,05 03.06 01.04 02,05 03.06 01.04 02,05 03.06 01.04 02.05 03,06 Propagation delay time, clock to output, CP to On 3003 Propagation delay time, output - enab le, OE to On 300

47、3 Propagation delay time, output - disable, OE to On 3003 - cc vcc 4.5 V 5.5 V 4.5 V 4.5 v 4.5 v 4.5 v 4.5 v 4.5 v Set-up time, data high and low to clock Dn to CP tpHZ, tp Hold tim, data htgh and low from clock Dn from CP CL - 50 pF minimum, sLe fiaure 5 R - 50013, Clock pulse width, CP high and lo

48、w th o/ TABLE I. Electrical Derformance chai Test conditions - 50 pF minimum, kL = 50013, s: I R - 50013, SL figure 5 STANDARDIZED MILITARY DUUING DEFENSE ELECTRONICS SUPPLY CENTKR MYTON, OHIO 45444 I“ 1 ;L s and the preferred method and limits are guaranteed. 5962-92236 SHEET 10 Provided by IHSNot

49、for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92236 REV A D 9999996 0043327 9T5 D STANDIIIUIIZED MILITARY DRAWING DEFENSE ELECTitONCS SUPPLY CENTER DAYTON, OHIO 45444 LiJ ICCT is calculated as follows: IccT where Icc + T TAI CC + ICm(fcp/2 +fiHi) Quiescent supply current (any I Number of TTL