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本文(DLA SMD-5962-92238 REV D-2008 MICROCIRCUIT DIGITAL FAST CMOS OCTAL TRANSPARENT LATCH WITH THREESTATE OUTPUTS TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING MONOLITHIC SILIC.pdf)为本站会员(李朗)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-92238 REV D-2008 MICROCIRCUIT DIGITAL FAST CMOS OCTAL TRANSPARENT LATCH WITH THREESTATE OUTPUTS TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING MONOLITHIC SILIC.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes are in accordance with the notice of revision 5962-R213-93. - jak 93-08-17 Monica L. Poelking B Changes are in accordance with the notice of revision 5962-R100-94. - tvn 94-03-09 Monica L. Poelking C Changes are in accordance with the not

2、ice of revision 5962-R022-97. - bjm 96-10-28 Monica L. Poelking D Redrawn with changes. Update the boilerplate to the current requirements of MIL-PRF-38535. - jak 08-04-22 Thomas M. Hess REV SHET REV D D D D SHEET 15 16 17 18 REV STATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8

3、 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas J. Ricciuti DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE D

4、EPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-03-25 MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-92238 SHEET 1 OF 18 DSCC FORM 2233

5、APR 97 5962-E302-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92238 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawi

6、ng documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation H

7、ardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 92238 01 M R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3)

8、 / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropri

9、ate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01, 04 54FCT573T Octal transparent latch with three-state outputs, TTL compatible inputs and limited output voltag

10、e swing 02, 05 54FCT573AT Octal transparent latch with three-state outputs, TTL compatible inputs and limited output voltage swing 03, 06 54FCT573CT Octal transparent latch with three-state outputs, TTL compatible inputs and limited output voltage swing 1.2.3 Device class designator. The device clas

11、s designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certif

12、ication and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-T20 20 Flat pack 2 CQCC1-N20 20 Leadless

13、-chip-carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92

14、238 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC+ 0.5 V dc 4/ DC output voltage range (VOUT) -0.5 V dc t

15、o VCC+ 0.5 V dc 4/ DC input clamp current (IIK) (VIN= -0.5 V ) -20 mA DC output clamp current (IOK) (VOUT-0.5 V and +7.0 V) 20 mA DC output source current (IOH) (per output) -30 mA DC output sink current (IOL) (per output) . +70 mA DC VCCcurrent (ICC) . 260 mA Ground current (IGND) +550 mA Storage t

16、emperature range (TSTG) -65C to +150C Case temperature under bias (TBIAS) -65C to +135C Maximum power dissipation (PD) 500 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating condit

17、ions. 2/ 3/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT) . +0.0 V dc to VCCMaximum low level input voltage (VIL) . 0.8 V Minimum high level input voltage (VIH) . 2.0 V Case operating temperature range (TC) . -55C to +125C Max

18、imum input rise or fall rate (t/V): (from VIN= 0.3 V to 2.7 V, 2.7 V to 0.3 V) 5 ns/V Maximum high level output current (IOH) . -12 mA Maximum low level output current (IOL) 32 mA 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximu

19、m levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ For VCC 6.5 V, the upper limit on the

20、 range is limited to 7.0 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92238 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENT

21、S 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE

22、 SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of

23、 Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-50

24、94.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIR

25、EMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or func

26、tion as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be

27、 as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.

28、2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and

29、test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specifi

30、ed in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction o

31、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92238 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufa

32、cturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device

33、classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mar

34、k for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For d

35、evice class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm

36、 that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-

37、PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this

38、 drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall

39、be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 38 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted

40、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92238 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions

41、2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Min Max Unit VOH14/ For all inputs affecting output under test VIN= 2.0 V or 0.8 V For all other inputs VIN= VCCor GND IOH= -300 A All 4.5 V 1, 2, 3 3.0 VCC-0.5 V IOH= -6 mA 2.4 VCC-0.5IOH= -12 mA 01, 02,

42、03 2.0 VCC-0.5High level output voltage 3006 VOH2For all inputs affecting output under test VIN= 2.0 V or 0.8 V For all other inputs VIN= VCCor GND IOH= -12 mA 04, 05, 06 4.5 V 1, 2, 3 2.4 VCC-0.5V VOL14/ For all inputs affecting output under test VIN= 2.0 V or 0.8 V For all other inputs VIN= VCCor

43、GND IOL= 300 A All 4.5 V 1, 2, 3 0.20 V Low level output voltage 3007 VOL2For all inputs affecting output under test VIN= 2.0 V or 0.8 V For all other inputs VIN= VCCor GND IOL= 32 mA All 4.5 V 1, 2, 3 0.55 V 1, 2 1.0 01, 03, 05 3 10.0 1, 2 1.0 Three-state output leakage current high 3021 IOZH5/ 6/

44、OE = 2.0 V or 0.8 V For input under test, VIN= VCCFor all other inputs, VIN= VCCor GND VOUT= VCC02, 04, 06 5.5 V 3 10.0 A 1, 2 -1.0 01, 03, 05 3 -10.0 1, 2 -1.0 Three-state output leakage current low 3020 IOZL5/ 6/ OE = 2.0 V or 0.8 V For input under test, VIN= GND For all other inputs, VIN= VCCor G

45、ND VOUT= GND 02, 04, 06 3 -10.0 A For input under test, IIN= -18 mA 01, 03, 05 -1.2 Negative input clamp voltage 3022 VIC-For input under test, IIN= -15 mA 02, 04, 06 4.5 V 1, 2, 3 -1.3 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

46、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92238 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2

47、/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Min Max Unit 1, 2 1.0 01, 03, 05 3 5.0 1, 2 1.0 Input current high 3010 IIHFor input under test, VIN= VCCFor all other inputs, VIN= VCCor GND 01, 03, 05 5.5 V 3 5.0 A 1, 2 -1.0 01, 03, 05 3 -5.0 1, 2 -1.0 I

48、nput current low 3009 IILFor input under test, VIN= GND For all other inputs, VIN= VCCor GND 02, 04, 06 3 -5.0 A Input capacitance 3012 CIN7/ See 4.4.1c TC= +25C All GND 4 10 pF Output capacitance 3012 COUT5/ See 4.4.1c TC= +25C All GND 4 12 pF Short circuit output current 3005 IOS8/ For all inputs, VIN= VCCor GND VOUT= GND All 5.5 V 1, 2, 3 -60 -225 mA Dynamic power supply current ICCD4/ 9/ Outputs open All 5.5 V 4, 5, 6 0.25 mA/ MHzBitQuiescent supply current delta, TTL input level 3005 ICC10/ For input under test VIN= VCC- 2.1 V For all other inputs VIN= VCCor GND All 5

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