ImageVerifierCode 换一换
格式:PDF , 页数:15 ,大小:91.81KB ,
资源ID:700279      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-700279.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(DLA SMD-5962-93063 REV C-2007 MICROCIRCUIT LINEAR HIGH SPEED PRECISION SAMPLE AND HOLD AMPLIFIER MONOLITHIC SILICON《硅单片 高速准确取样保持放大器 线性微型电路》.pdf)为本站会员(lawfemale396)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-93063 REV C-2007 MICROCIRCUIT LINEAR HIGH SPEED PRECISION SAMPLE AND HOLD AMPLIFIER MONOLITHIC SILICON《硅单片 高速准确取样保持放大器 线性微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 02. Make changes to 1.2.2, 1.3, 1.4, TABLE I, and figure 1. 94-03-03 M. A. FRYE B Drawing updated to reflect current requirements. - ro 01-10-16 R. MONNIN C Update drawing as part of 5 year review. rrp 07-04-11 Robert M. Heber REV

2、 SHET REV SHET REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS A

3、VAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, HIGH SPEED, PRECISION SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-01-26 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-93063 SHEET 1 OF 14

4、 DSCC FORM 2233 APR 97 5962-E273-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93063 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 S

5、cope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choic

6、e of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93063 01 M C A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.

7、5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked w

8、ith the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HA-5340 Sample and hold amplifier 02 HA-5320 Sample and hold amplifier 1.2.3 Device class desig

9、nator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, ap

10、pendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 2 CQCC1-N20 20 Square leadless chip car

11、rier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93063 DEFEN

12、SE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Voltage between +VSand VSterminals: Device type 01 . 36 V dc Device type 02 . 40 V dc Differential input voltage 24 V dc Digital input voltage ( S /H pin): Device type

13、01 . +8.0 V dc / -6.0 V dc Device type 02 . +8.0 V dc / -15.0 V dc Continuous output current . 20 mA Power dissipation, above +75C (PD): Case C 1.4 W 2/ Case 2 . 1.2 W 3/ Junction temperature (TJ) . +175C Lead temperature (soldering, 10 seconds) +275C Storage temperature range . -65C to +150C Therma

14、l resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) Case C +70C/W Case 2 . +82C/W 1.4 Recommended operating conditions. Operating supply voltage (VS) . 15 V dc Analog input voltage (VA) 10 V dc Logic low input voltage range (VIL) . 0 V dc to 0.8 V dc L

15、ogic high input voltage range (VIH) . 2.0 V dc to 5.0 V dc Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specifie

16、d herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard M

17、icrocircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quick

18、search/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performanc

19、e and affect reliability. 2/ Derate above +75C at 14 mW/C. 3/ Derate above +75C at 12 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93063 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVIS

20、ION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific e

21、xemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan sh

22、all not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construct

23、ion, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections s

24、hall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient oper

25、ating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufactu

26、rers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device cla

27、sses Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark f

28、or device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For devi

29、ce class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm th

30、at the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF

31、-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this dr

32、awing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be

33、made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 60 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted w

34、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93063 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Grou

35、p A subgroups Device type Limits 2/ Unit Min MaxInput offset voltage VIO1 01 -1.5 1.5 mV 2,3 -3.0 3.0 1 02 -1.0 1.0 2,3 -2.0 2.0 Input bias current +IIB1,2,3 01 -350 350 nA 02 -200 200 -IIB01 -350 350 02 -200 200 Input offset current IIO1,2,3 01 -350 350 nA 02 -100 100 Open loop voltage gain +AVSVOU

36、T= +10 V, 1 01 110 dB RL= 2.0 k, CL= 60 pF 2,3 100 VOUT= +10 V, 1 02 120 RL= 1.0 k 2,3 110 -AVSVOUT= -10 V, 1 01 110 RL= 2.0 k, CL= 60 pF 2,3 100 VOUT= -10 V, 1 02 120 RL= 1.0 k 2,3 110 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens

37、e from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93063 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A

38、 subgroups Device type Limits 2/ Unit Min MaxCommon mode rejection ratio +CMRR +VS= 5 V, -VS= -25 V, VOUT= -10 V, VS /H= -9.2 V 1,2,3 01 72 dB +VS= 10 V, -VS= -20 V, VOUT= -5 V, VS /H= -4.2 V 02 80 -CMRR +VS= 25 V, -VS= -5 V, VOUT= +10 V, VS /H= 10.8 V 01 72 +VS= 20 V, -VS= -10 V, VOUT= +5 V, VS /H=

39、 5.8 V 02 80 Output current +IOVOUT= +10 V 1,2,3 All 10 mA -IOVOUT= -10 V -10 Output voltage swing +VOPRL= 2.0 k, CL= 60 pF 1,2,3 01 10 V RL= 1.0 k 02 10 -VOPRL= 2.0 k, CL= 60 pF 01 -10 RL= 1.0 k 02 -10 Power supply current +ICCVOUT= 0 V, IOUT= 0 mA 1,2,3 01 25 mA 02 13 -ICC01 -25 02 -13 See footnot

40、es at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93063 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performanc

41、e characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Power supply rejection ratio +PSRR +VS= +13.5 V and +16.5 V, -VS= -15 V 1,2,3 01 75 dB +VS= +14.5 V and +15.5 V, -VS= -15 V 02 80 -PSRR -VS= -13.5 V an

42、d -16.5 V, +VS= +15 V 01 75 -VS= -14.5 V and -15.5 V, +VS= +15 V 02 65 Digital input high current IINHVIN= 5.0 V 1,2,3 01 40 A 02 0.1 Digital input low current IINLVIN= 0 V 1,2,3 01 40 A 1 02 4 2,3 10 Digital input low voltage VIL1,2,3 All 0.8 V Digital input high voltage VIH1,2,3 All 2.0 V Output v

43、oltage droop rate VDVOUT= 0 V, TA= +125C 2 01 95 V/s 02 100 Hold step error 3/ VERRVIL= 0 V, VIH= 4.0 V, tR(VS/H) = 15 ns, TA= +25C 4 01 -50 50 mV VIL= 0 V, VIH= 3.5 V, 4/ tR(VILto VIH) = 10 ns, TA= +25C 02 -6 6 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networkin

44、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93063 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless o

45、therwise specified Group A subgroups Device type Limits 2/ Unit Min Max Rise time 3/ tRAV= +1.0, CL= 60 pF, RL= 2.0 k, VOUT= 0 mV to +200 mV step, measured at 10 % and 90 % points 9,10,11 01 50 ns AV= +1.0, TA= +25C, 4/ CL= 50 pF, RL= 2.0 k, VOUT= 0 mV to +200 mV step, measured at 10 % and 90 % poin

46、ts 9 02 150 Fall time 3/ tFAV= +1.0, CL= 60 pF, RL= 2.0 k, VOUT= 0 mV to -200 mV step, measured at 10 % and 90 % points 9,10,11 01 50 ns AV= +1.0, TA= +25C, 4/ CL= 50 pF, RL= 2.0 k, VOUT= 0 mV to +200 mV step, measured at 10 % and 90 % points 9 02 150 Overshoot 3/ +OS AV= +1.0, CL= 60 pF, RL= 2.0 k,

47、 VOUT= 0 mV to +200 mV step 4,5,6 01 60 % AV= +1.0, TA= +25C, 4/ CL= 50 pF, RL= 2.0 k, VOUT= 0 mV to +200 mV step 4 02 25 -OS AV= +1.0, CL= 60 pF, RL= 2.0 k, VOUT= 0 mV to -200 mV step 4,5,6 01 60 AV= +1.0, TA= +25C, 4/ CL= 50 pF, RL= 2.0 k, VOUT= 0 mV to -200 mV step 4 02 25 See footnotes at end of

48、 table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93063 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min MaxSlew rat

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1