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本文(DLA SMD-5962-93086 REV B-2008 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS OCTAL BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf)为本站会员(ideacase155)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-93086 REV B-2008 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS OCTAL BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add source of supply for device type 02; add VCC,and ground bounce limits for device type 02; change ICCL, tS1, and tS2, for device type 02. Change to new boilerplate. - JAK 96-03-01 Monica L Poelking B Update boilerplate to current MIL-PRF-38535

2、 requirements. - MAA 08-10-28 Thomas M. Hess REV SHEET REV SHEET REV B B B B B B B SHEET 15 16 17 18 19 20 21 REV B B B B B B B B B B B B B B REV STATUS OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby CHECKED BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COL

3、UMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Thomas M. Hess DRAWING APPROVAL DATE 94-06-30 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON SIZE A CAGE CODE 67268 5962-93086 STANDARD MICR

4、OCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REVISION LEVEL B SHEET 1 OF 21 DSCC FORM 2233 APR 97 5962-E026-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-930

5、86 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (devi

6、ce class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93086 01 Q K

7、A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and

8、are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function

9、as follows: Device type Generic number Circuit function 01 54ABT2952 Octal bus transceiver and register with three-state outputs, TTL compatible inputs 02 54ABT2952A Octal bus transceiver and register with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class des

10、ignator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. Q or V Certificat

11、ion and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style K GDFP2-F24 or CDFP3-F24 24 Flat pack L GDIP3-T24 or CDIP4-T24 24 Dual-in-line 3 CQCC1-N28 28 Square leadl

12、ess chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-93086 STANDARD MICROCIRCUIT D

13、RAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) (except I/O ports) -0.5 V dc to +7.0 V dc 4/ DC input voltage range (

14、VIN) (I/O ports). -0.5 V dc to +5.5 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +5.5 V dc 4/ DC input clamp current (IIK) (VIN 0.0 V) . -18 mA DC output clamp current (IOK) (VOUT 0.0 V) . -50 mA DC output current (IOL) (per output) +96 mA Storage temperature range (TSTG) . -65C to +150C Le

15、ad temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C Maximum power dissipation (PD): Device type 01 . 500 mW Device type 02 . 400 mW 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) +4.5 V dc

16、to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to VCCMinimum high level input voltage (VIH). +2.0 V Maximum low level input voltage (VIL) +0.8 V Maximum high level output current (IOH) -24 mA Maximum low level output current (IOL) +48 mA Maximum input r

17、ise or fall rate (t/V) 5 ns/V Case operating temperature range (TC). -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages

18、are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. P

19、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-93086 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specificat

20、ion, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation. or contract DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-3853

21、5 - Integrated Circuits Manufacturing, General Specification For. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawi

22、ngs. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a con

23、flict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item r

24、equirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requi

25、rements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for devic

26、e classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specif

27、ied on figure 2. 3.2.4 Block or Logic diagram. The block or logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching wavef

28、orms and test circuit shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-93086 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL B SHEET 5 DSCC FORM 223

29、4 APR 97 3.3 Electrical performance characteristics and post-irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3

30、.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marke

31、d. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in a

32、ccordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be

33、 a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate

34、of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers produ

35、ct meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class

36、 M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any

37、change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at

38、the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

39、-,-SIZE A 5962-93086 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V V

40、CC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Min Max Unit VOH1For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -3 mA All 4.5 V 1, 2, 3 2.5 VOH2For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -3 mA All 5.0 V 1, 2, 3 3.0 High level outp

41、ut voltage 3006 VOH3For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 V Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= +48 mA All 4.5 V 1, 2, 3 0.55 V Three-state output leakage current high 3021 I

42、OZH 4/ 5/ For all inputs affecting output under test, OEAB = 2.0 V, OEBA = 2.0 V, VOUT= 2.7 V All 5.5 V 1, 2, 3 +10.0 A Three-state output leakage current low 3020 IOZL 4/ 5/ For all inputs affecting output under test, OEAB = 2.0 V, OEBA = 2.0 V, VOUT= 0.5 V All 5.5 V 1, 2, 3 -10.0 A Control inputs

43、All 1, 2, 3 +1.0 Input current high 3010 IIH 6/ For input under test, VIN= VCCA or B ports All 5.5 V1, 2, 3 +100 A Control inputs All 1, 2, 3 -1.0 Input current low 3009 IIL 6/ For input under test, VIN= GND A or B ports All 5.5 V1, 2, 3 -100 A Negative input clamp voltage 3022 VIC-For input under t

44、est, IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V Off-state leakage current IOFFFor input or output under test, VIN or VOUT= 4.5 V All other pins at 0.0 V All 0.0 V 1 100 A High-state leakage current ICEXFor output under test, VOUT= 5.5 V Outputs at high logic state All 5.5 V 1, 2, 3 +50 A See footnotes at

45、end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-93086 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance ch

46、aracteristics-Continued Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Min Max Unit Output current 3011 IO 7/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50 -180 mA Quiescent supply current delta,

47、 TTL input level 3005 ICC8/ For input under test, VIN= 3.4 V For all other inputs, VIN= VCCor GND All 5.5 V 1, 2, 3 1.5 mA Quiescent supply current, output high 3005 ICCHFor all inputs VIN= VCCor GND IOUT= 0.0 A All 5.5 V 1, 2, 3 250 A 01 1, 2, 3 30 Quiescent supply current, output low 3005 ICCLFor

48、all inputs VIN= VCCor GND IOUT= 0.0 A 02 5.5 V 1, 2, 3 35 mA Quiescent supply current, outputs disabled 3005 ICCz For all inputs VIN= VCCor GND IOUT= 0.0 A All 5.5 V 1, 2, 3 250 A Input capacitance 3012 CINTC= +25C, See 4.4.1c All 5.0 V 4 4.0 pF Input capacitance 3012 CI/OTC= +25C, See 4.4.1c All 5.0 V 4 7.0 pF 01 * VOLP9/ 02 4 600 01 * Low level ground bounce noise VOLV9/ VIH= 3.0 V, VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 02 5.0 V 4 -1100 mV 01 * VOHP9/ 02 4 1100 01 * High level VCCbounce noise

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