DLA SMD-5962-93092 REV H-2007 MICROCIRCUIT HYBRID LINEAR 5-VOLT SINGLE CHANNEL DC-DC CONVERTER《5伏特单通道直流 直流转变器 线性混合微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added RHA and class K devices. Added RHA requirements. Redrew entire document. -sld 97-10-29 K. A. Cottongim B Table I; changed for the VOUTtest the min and max limits for device type 02 RHA levels L and R from 4 and 6 V dc to 4.6 and 5.4 V dc. C

2、hanged for the VRIPtest the max limit for device type 02 subgroups 2 and 3 from 800 mVp-p to 675 mVp-p and for device type 02 RHA levels L and R change the max limit from 2000 mVp-p to 1000 mVp-p. Changed for the VOTLOADtest the min and max limit from -3000 and + 3000 mVpk to -2000 and +2000 mVpk. C

3、hanged the TTLOADtest max limit for device 01 from 500 to 250 s for subgroup 4 and from 4500 to 1500 s for subgroups 5 and 6. -sld 98-02-04 K. A. Cottongim C Add case outlines Y and Z. Table I, IINmaximum limit , change from 4 mA to 5 mA. 99-07-12 Raymond Monnin D Correct paragraph 1.3, power dissip

4、ation. Changes to table I to standardize test nomenclature and conditions. Correct paragraph 4.3.5.a. 01-02-06 Raymond Monnin E Add device type 03, case outline U, and vendor CAGE 51651. 04-04-02 Raymond Monnin F Figure 1, case outlines Y and Z, change the maximum D/E dimension from 1.105“ (28.07 mm

5、“) to 1.110“ (28.19 mm) and change the R maximum dimension from 0.600“ (1.52 mm) to .065“ (1.65 mm). 05-04-16 Raymond Monnin G Added paragraph 1.5 and note 2. Table 1, added new note 2 for enhanced low dose rate effects (renumber remaining notes in sequence). Paragraph 4.3.5.a, added enhanced low do

6、se rate effects. Added radiation hardened level P. -sld 07-06-04 Robert M. Heber H Added radiation hardened level D. -sld 07-06-28 Robert M. Heber REV SHEET REV H H SHEET 15 16 REV STATUS REV H H H H H H H H H H H H H H OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Gary Zahn

7、DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 5-VOLT, SINGLE CHANNEL, DC-DC CONVERTER AND A

8、GENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-12-06 AMSC N/A REVISION LEVEL H SIZE A CAGE CODE 67268 5962-93092 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E513-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRA

9、WING SIZE A 5962-93092 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which

10、are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 93092 01 H X X Federal RHA Device Device Case Lead stock class design

11、ator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA d

12、esignator. A dash (-) indicates a non-RHA device. See 4.3.5. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MSA2805S/883, MGA2805S DC-DC converter, 5 W, +5 V output 02 SMSA2805S DC-DC converter, 5 W, +5 V output 03 DH

13、C2805SH DC-DC converter, 6 W, +5 V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and

14、E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applic

15、ations where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guara

16、ntees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; th

17、erefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature rang

18、e. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style U See figure 1 8 Dual-in-line X See figure 1 8 Dual-in-line Y See figure 1 20 Flat pack Z See figure 1 20 Flat pack with formed leads 1.2.5 Le

19、ad finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93092 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 3 DSCC

20、FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc Power dissipation (PD): Device types 01, 02, and 03 (non-RHA) . 2.2 W Device type 02 (RHA levels D, P, L and R) 3 W Output power: Device types 01 and 02 5.2 W Device type 03 6.25 W Lead soldering temperature

21、(10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range: Device types 01 and 02 +16 V dc to +40 V dc Device type 03 +12 V dc to +50 V dc Case operating temperature range (TC). -55C to +125C 1.5 Radiation features. Maximum total dose availa

22、ble (dose rate = 9 rad(Si)/s): Device type 02 (RHA levels D, P, L and R) 100 krad (Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise

23、 specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface S

24、tandard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil

25、 or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document,

26、however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be d

27、ose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo repro

28、duction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93092 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for

29、 device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may

30、eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable dev

31、ice class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The termina

32、l connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements

33、. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In a

34、ddition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection

35、 group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the prepar

36、ing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performan

37、ce requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be

38、in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,

39、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93092 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V, CL= 0 Group A subgroups Device type

40、s Limits Unit unless otherwise specified Min Max 1 4.95 5.05 IOUT= 1A 2,3 01,02,03 4.80 5.20 Output voltage VOUTD, P, L, R 1,2,3 02 4.6 5.5 V dc VIN= 16 V dc to 40 V dc 1,2,3 01,02,03 1 Output current IOUTD, P, L, R 1,2,3 02 1 A 01,03 350 1 02 450 01,03 525 IOUT= 1A, BW = 10 kHz to 2 MHz 2,3 02 675

41、VOUTripple voltage VRIPD, P, L, R 1,2,3 02 1000 mVp-p VIN=16 V dc to 40 V dc, 1,2,3 01,02,03 50 VOUTline regulation VRLINEIOUT= 1A D, P, L, R 1,2,3 02 100 mV IOUT= 0 to 1A 1,2,3 01,02,03 50 VOUTload regulation VRLOADD, P, L, R 1,2,3 02 100 mV IOUT= 0 A, Inhibit (see figure 2) = 0 1,2,3 01,02,03 5 D,

42、 P, L, R 1,2,3 02 12 01,03 40 IOUT= 0 A, Inhibit (see figure 2) = open 1, 2, 3 02 60 Input current IIND, P, L, R 1,2,3 02 100 mA 01 100 1 02,03 200 01 150 IOUT= 1A, BW = 10 kHz to 10 MHz 2,3 02,03 300 IINripple current IRIPD, P, L, R 1,2,3 02 500 mAp-p See footnotes at end of table. Provided by IHSN

43、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93092 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test

44、Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V, CL= 0 Group A subgroups Device types Limits Unit unless otherwise specified Min Max 01 66 1 02,03 64 01 64 IOUT= 1A 2,3 02,03 62 Efficiency Eff D, P, L, R 1,2,3 02 58 % Input to output or any pin to case except the case ground (see figure 2)

45、at 500V dc 1 01,02,03 100 Isolation ISO TC= +25C D, P, L, R 1 02 100 M No effect on dc performance, TC= +25C 4 01,02,03 300 Capacitive load 3/ 4/ CLD, P, L, R 4 02 300 F 1 2 Short circuit 2,3 01,02,03 2.2 Short circuit power dissipation 5/ PDD, P, L, R 1,2,3 02 3 W 4 01,02 450 600 4 03 375 425 IOUT=

46、 1 A 5,6 01,02 400 660 Switching frequency FSD, P, L, R 4,5,6 02 400 700 kHz 01 -250 +250 4 02,03 -500 +500 01 -750 +750 50% load to/from 100% load 5,6 02,03 -1500 +1500 VOUTstep load transient 6/ VTLOADD, P, L, R 4,5,6 02 -2000 +2000 mV pk See footnotes at end of table. Provided by IHSNot for Resal

47、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93092 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Condi

48、tions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V, CL= 0 Group A subgroups Device types Limits Unit unless otherwise specified Min Max 01 250 4 02,03 500 01 1500 50% load to/from 100% load 5,6 02,03 4500 s VOUTstep load transient recovery 6/ 7/ TTLOADD, P, L, R 4,5,6 02 5 ms Input step 16 V dc to/from 40 V dc, IOUT= 1A 4,5,6 01,02,03 -500 +500 VOUTstep line transient 4/ 8/ VTLINED, P, L, R 4,5,6 02 -1500 +1500 m