DLA SMD-5962-93149 REV D-2013 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with the notice of revision 5962-R161-94 TVN 94-05-02 Monica L. Poelking B Changes in accordance with the notice of revision 5962-R241-94. jak 94-07-21 Monica L. Poelking C Update the boilerplate to current requirements as s

2、pecified in MIL-PRF-38535. jak 07-04-10 Thomas M. Hess D Update output low and high voltage test conditions (VOLand VOH) VIHand VILlimits to table I. Update the boilerplate to current requirements as specified in MIL-PRF-38535 jwc 13-09-11 Thomas M. Hess REV SHEET REV D D D D SHEET 15 16 17 18 REV S

3、TATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen THIS DRAWING IS AVAILABLE FOR USE BY

4、ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-03-15 AMSC N/A REVISION LEVEL D SI

5、ZE A CAGE CODE 67268 5962-93149 SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E471-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93149 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2

6、DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying N

7、umber (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93149 01 M R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outl

8、ine (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A

9、specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABT374 Octal edge-triggered D-type flip-flop with three-

10、state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN cla

11、ss level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP

12、2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q, and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or net

13、working permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93149 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage ra

14、nge (VIN) . -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to +5.5 V dc 4/ DC input clamp current (IIK) (VIN= 0.0 V) . -18 mA DC output clamp current (IOK) (VOUT= 0.0 V) . -50 mA DC output current (IOL) (per output pin) . +96 mA Storage temperature range (TSTG) -65C to +150C Lead

15、 temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C Maximum power dissipation (PD) . 500 mW 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Input voltage range (VIN)

16、. +0.0 V dc to VCC Output voltage range (VOUT) +0.0 V dc to VCCMaximum low level input voltage (VIL ) 0.8 V Minimum high level input voltage (VIH ) . 2.0 V Case operating temperature range (TC) -55C to +125C input rise and fall rate (t/V) . 5 ns/V Maximum high level output current (IOH) -24 mA Maxim

17、um low level output current (IOL) . +48 mA 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for

18、 the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. Provided by IHSNot for ResaleNo reproduct

19、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93149 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specif

20、ication, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Spe

21、cification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings

22、. (Copies of these documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited

23、 herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance w

24、ith MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-

25、38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for d

26、evice class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall b

27、e as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performan

28、ce characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. Provided by IHSNot for ResaleNo repr

29、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93149 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups speci

30、fied in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limita

31、tions, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-3

32、8535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device cla

33、sses Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved sourc

34、e of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and h

35、erein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircu

36、its delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and revie

37、w for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer

38、. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 127 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT D

39、RAWING SIZE A 5962-93149 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device typ

40、e VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOH1For all inputs affecting output under test, VIN= VIHor VILVIL= 0.8 V, VIH= 2.0 V IOH= -3 mA All 4.5 V 1, 2, 3 2.5 V VOH2For all inputs affecting output under test, VIN= VIHor VILVIL= 0.8 V VIH= 2.0 V All 5.0 V 1, 2, 3 3

41、.0 V VOH3For all inputs affecting output under test, VIN= VIHor VILVIL= 0.8 V, VIH= 2.0 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 V Low level output voltage 3007 VOLFor all inputs affecting output under test, VIH= 2.0 V or 0.8 V IOL= 48 mA All 4.5 V 1, 2, 3 0.55 V Three-state output leakage current high 3

42、021 IOZH4/ 5/ For control inputs affecting output under test, VIN= 2.0 V or 0.8 V VOUT= 2.7 V All 5.5 V 1, 2, 3 10.0 A Three-state output leakage current low 3020 IOZL4/ 5/ For control inputs affecting output under test, VIN= 2.0 V or 0.8 V VOUT= 0.5 V All 5.5 V 1, 2, 3 -10.0 A Negative input clamp

43、voltage 3022 VIC-For input under test, IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V Off-state leakage current IOFFFor input or output under test, VIN= VOUT= 4.5 V All other pins at 0.0 V All 0.0 V 1 100 A High-state leakage current ICEXFor output under test, VOUT= 5.5 V Outputs at high logic state All 5.5 V

44、 1, 2, 3 50 A Input current high 3010 IIHFor input under test, VIN= VCCAll 5.5 V 1, 2, 3 +2.0 A Input current low 3009 IILFor input under test, VIN= GND All 5.5 V 1, 2, 3 -2.0 A Output current 3011 IO6/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50 -180 mA See footnotes at end of table. Provided by IHSNot for R

45、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93149 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 tes

46、t method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Quiescent supply current delta, TTL input levels 3005 ICC7/ For input under test, VIN= VIHor VILVIL= 0.8 V VIH= 2.0 V For all other inputs, VIN= VC

47、Cor GND All 5.5 V 1, 2, 3 2.5 mA Quiescent supply current, output high 3005 ICCHVIN= VIHor VILVIL= 0.8 V VIH= 2.0 V IOUT= 0 A All 5.5 V 1, 2, 3 250 A Quiescent supply current, output low 3005 ICCLVIN= VIHor VILVIL= 0.8 V VIH= 2.0 V IOUT= 0 A All 5.5 V 1, 2, 3 30 mA Quiescent supply current, output t

48、hree-state 3005 ICCZVIN= VIHor VILVIL= 0.8 V VIH= 2.0 V IOUT= 0 A All 5.5 V 1, 2, 3 250 A Input capacitance 3012 CINTC= +25C See 4.4.1c All 5.0 V 4 11.0 pF Output capacitance 3012 COUTTC= +25C See 4.4.1c All 5.0 V 4 16.0 pF Low level ground bounce noise VOLP8/ VIH= 3.0 V VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 All All 5.0 V 4 800 mV VOLV8/ All All 5.0 V 4 -1500 mV High level VCCbounce noise VOHP8/ All All 5.0 V 4 1600 mV VOHV8/ All All 5.0 V 4 -600 mV Functional tests 3014 9/ VIL= 0.8 V VIH= 2.0 V Verify output VOSee 4.4.1b All 4.5 V 7, 8 L