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本文(DLA SMD-5962-93175 REV C-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 16-BIT BUS TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf)为本站会员(registerpick115)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-93175 REV C-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 16-BIT BUS TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added CIN, CI/O, and ground bounce and VCCbounce noise data. Added device type 02 and CAGE 27014 as source of supply 96-01-12 Monica L. Poelking B Change ground bounce limits for device type 01. Change output enable limit for device type 01. Edit

2、orial changes throughout - jak 99-04-12 Monica L. Poelking C Update the boilerplate paragraphs to current requirements as specified in MIL-PRF-38535. - jak 09-04-01 Thomas M. Hess REV SHEET REV C C C C SHEET 15 16 17 18 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10

3、11 12 13 14 PMIC N/A PREPARED BY Wanda L. Meadows STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas J. Ricciuti DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADV

4、ANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-05-03 MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-93175 SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E236-09 Provide

5、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93175 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product as

6、surance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) lev

7、els is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93175 01 M X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RH

8、A designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash

9、 (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABT16245A 16-bit bus transceiver with three-state outputs, TTL compatible inputs. 02 54ABT16245 16-bit bus transceiver with three-state

10、 outputs, TTL compatible inputs. 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class l

11、evel B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F48 48 Flat pac

12、k 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93175 DEFENSE

13、SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +5.5 V dc 4/ D

14、C input clamp current (IIK) (VIN 0.0 V). -18 mA DC output clamp current (IOK) (VOUT 0.0 V). -50 mA DC output current (IOL) (per output) +96 mA Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835

15、 Junction temperature (TJ) +175C Maximum power dissipation (PD): Device type 01 . 599 mW 5/ Device type 02 . 753 mW 5/ 1.4 Recommended operating conditions. 2/ 3/ 6/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to

16、VCCMinimum High level input voltage (VIH) +2.0 V Maximum Low level input voltage (VIL). +0.8V Case operating temperature range ( TC) -55C to +125C Maximum input transition rise or fall rate (t / V) (outputs enabled). 10 ns/V Maximum High level output current (IOH) -24 mA Maximum Low level output cur

17、rent (IOL). +48 mA 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specifie

18、d herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input and output clamp-current ratings are observed. 5/ Power dissipation values are derived using the formula Pd = VC

19、CICC+ nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table 1 herein, and “n“ represents the total number of outputs. 6/ Unused or floating inputs (inputs or I/O) must be held high or low. Provided by IHSNot for ResaleNo reproduction or networking permitted with

20、out license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93175 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and

21、 handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTM

22、ENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these docu

23、ments are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein.

24、 Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the devic

25、e manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

26、herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in acc

27、ordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and wave

28、forms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.2.7 Radiation exposure circuit. The radiation exposure circuit shall be as specified when a

29、vailable. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. Pr

30、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93175 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical tes

31、t requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN

32、 number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device cl

33、ass M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.

34、6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer

35、 in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requireme

36、nts of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided w

37、ith each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification

38、and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group

39、 assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93175

40、DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V DeviceType VCCGroup A subgroups Limits 3/ Unit unless

41、 otherwise specified Min Max 4.5 V 1, 2, 3 2.5 IOH= -3.0 mA All 5.0 V 1, 2, 3 3.0 High level output voltage 3006 VOH For all inputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 V Low level output Voltage 3007 VOL For all inputs affecting output under test, V

42、IH= 2.0 V or VIL= 0.8 V IOL= 48 mA All 4.5 V 1, 2, 3 0.55 V Negative input clamp voltage 3022 VIC- For input under test, IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V 01 1, 2, 3 +1.0 Control inputs 02 1, 2, 3 +2.0 A Input current high 3010 IIH 4/ For output under test, VIN= 5.5 V A or B ports All 5.5 V 1, 2,

43、 3 +100.001 1, 2, 3 -1.0 Control inputs 02 1, 2, 3 -2.0 A Input current low 3009 IIL 4/ For output under test, VIN= 0.0 V A or B ports All 5.5 V 1, 2, 3 -100.001 1, 2, 3 +10.0 Three-state output leakage current, high 3021 IOZH 5/ 6/ For control inputs affecting output under test, VIH= 2.0 V or VIL=

44、0.8 V VOUT= 2.7 V 02 5.5 V 1, 2, 3 +50.0 A 01 1, 2, 3 -10.0 Three-state output leakage current, low 3020 IOZL 5/ 6/ For control inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V VOUT= 0.5 V 02 5.5 V 1, 2, 3 -50.0 A Off-state leakage current IOFF For input or output under test VINor VOUT=

45、4.5 V All other pins at 0.0 V All 0.0 V 1 100.0A High-state leakage current ICEX For output under test, VOUT= 5.5 V Outputs at high logic state All 5.5 V 1, 2, 3 50.0 A Output current 3011 IO7/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50.0 -180.0mA See footnotes at end of table. Provided by IHSNot for ResaleN

46、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93175 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883

47、test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V DeviceType VCCGroup A subgroups Limits 3/ Unit unless otherwise specified Min Max 01 1, 2, 3 2.0 Quiescent supply current, outputs high 3005 ICCH02 5.5 V 1, 2, 3 0.1 01 1, 2, 3 32.0 Quiescent supply current, outputs low 3005 IC

48、CL02 5.5 V 1, 2, 3 60.0 01 1, 2, 3 2.0 Quiescent supply current, outputs disabled 3005 ICCZFor all inputs, VIN= VCCor GND IOUT= 0.0 A A or B ports 02 5.5 V 1, 2, 3 0.1 mA 01 1, 2, 3 1.5 Data inputs, outputs enabled 02 5.5 V 1, 2, 3 2.5 Data inputs outputs disabled All 5.5 V 1, 2, 3 1.0 01 1, 2, 3 1.5 Quiescent supply current, outputs high 3005 ICC8/ For input under test, VIN= 3.4 V For all other inputs VIN= VCCor GND Control inputs 02 5.5 V 1, 2, 3 2.5 mA Input capacitance 3012 CINControl inputs All 5.0 V 4 10.5 pF Input/output capacitance 3012 CI/

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