DLA SMD-5962-93201 REV C-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 16-BIT EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R962-94. - TVN 94-06-08 Monica L. Poelking B Changes in accordance with NOR 5962-R005-98. - Jak 97-11-21 Monica L. Poelking C Incorporate previous Notice of Revisions (NORs). Change device class designator M to

2、Q class in section 1.2. Update the boilerplate to current requirements of MIL-PRF-38535 and Editorial changes throughout. - MAA 09-01-22 Charles F. Saffle REV SHET REV C C C C SHEET 15 16 17 18 REV C C C C C C C C C C C C C C REV STATUS OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPA

3、RED BY Thanh V. Nguyen CHECKED BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Monica L. Poelking DRAWING APPROVAL DATE 93-11-15 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUT

4、S, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON SIZE A CAGE CODE 67268 5962-93201 STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REVISION LEVEL C SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E131-09 Provided by IHSNot fo

5、r ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-93201 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class

6、levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflect

7、ed in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93201 01 Q X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator.

8、Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates

9、 a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABT16374A 16-bit edge-triggered D-type flip-flop with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class desi

10、gnator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certificatio

11、n and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F48 48 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device clas

12、ses Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-93201 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2

13、234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to + 7.0 V dc DC input voltage range (VIN) -0.5 V dc to + 7.0 V dc 4/ DC output voltage range (VOUT). -0.5 V dc to + 5.5 V dc 4/ DC input clamp current (IIK) (VIN 0 V) -18 mA DC output clamp current (IOK) (VOUT 0

14、V) -50 mA DC output current (IOL) (per output) . +96 mA VCCcurrent (IVCC) . +514 mA Ground current (IGND). +1091 mA Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +260C Thermal resistance, junction-to-case (JC): See MIL-STD-1835 Junction temperature (TJ) +1

15、75C Maximum power dissipation (PD). 818 mW 5/ 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT) +0.0 V dc to VCCMinimum high level input voltage (VIH) 2.0 V Maximum low level input volta

16、ge (VIL) . 0.8 V Maximum high level output current (IOH) -24 mA Maximum low level output current (IOL) +48 mA Maximum input rise or fall rate (t/v) . 10 ns/V Case operating temperature range (TC) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Ex

17、tended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The inp

18、ut and output negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. 5/ Power dissipation values are derived using the formula PD= VCC ICC+ n VOL IOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified table I herein, an

19、d n represents the total number of outputs. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-93201 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APP

20、LICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPAR

21、TMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDB

22、K-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3

23、 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3

24、.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as

25、described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as spec

26、ified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Trut

27、h table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test cir

28、cuit. The switching waveforms and test circuit shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-93201 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL

29、C SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and post-irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post irradiation parameter limits are as specified in table I and shall apply over the full case operati

30、ng temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer

31、s PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classe

32、s Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for

33、device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device

34、class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that

35、the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38

36、535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawi

37、ng is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be mad

38、e available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 127 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted wit

39、hout license from IHS-,-,-SIZE A 5962-93201 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -

40、55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Min Max Unit VOH1IOH= -3 mA All 4.5 V 1, 2, 3 2.5 VOH2 OH= -3 mA All 5.0 V 1, 2, 3 3.0 High level output voltage 3006 VOH3For all inputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOH= -24 mA All 4.5

41、 V 1, 2, 3 2.0 V Low level output voltage 3007 VOLFor all inputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOL= +48 mA All 4.5 V 1, 2, 3 0.55 V Negative input clamp voltage 3022 VIC-For input under test, IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V Three-state output leakage current high 3021 IOZ

42、H 4/ For control input affecting output under test, VIH= 2.0 V or VIL= 0.8 V VOUT= 2.7 V All 5.5 V 1, 2, 3 +50 A Three-state output leakage current low 3020 IOZL 4/ For control input affecting output under test, VIH= 2.0 V or VIL= 0.8 V VOUT= 0.5 V All 5.5 V 1, 2, 3 -50 A Off-state leakage current I

43、OFFFor input or output under test, VINor VOUT= 0.5 V All other pins at 0.0 V All 0.0 V 1 100 A High-state leakage current ICEXFor output under test, VOUT= 5.5 V Outputs at high logic state All 5.5 V 1, 2, 3 50 A Input current high 3010 IIHFor input under test, VIN= VCCAll 5.5 V 1, 2, 3 +2.0 A Input

44、current low 3009 IILFor input under test, VIN= GND All 5.5 V 1, 2, 3 -2.0 A Output current 3011 IO 5/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50 -180 mA Quiescent supply current delta, TTL input level 3005 ICC6/ For input under test, VIN= 3.4 V For all other inputs VIN= VCCor GND All 5.5 V 1, 2, 3 2.5 mA See

45、 footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-93201 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical pe

46、rformance characteristics - Continued. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Min Max Unit Quiescent supply current, output high 3005 ICCHVIN= VCCor GND IOUT = 0.0 A All 5.5 V

47、 1, 2, 3 2.0 mA Quiescent supply current, output low 3005 ICCLVIN= VCCor GND IOUT = 0.0 A All 5.5 V 1, 2, 3 72 mA Quiescent supply current, output disabled 3005 ICCZVIN= VCCor GND IOUT = 0.0 A All 5.5 V 1, 2, 3 2.0 mA Input capacitance 3012 CINSee 4.4.1b TC= +25C All 5.0 V 4 10.5 pF Output capacitan

48、ce 3012 COUT See 4.4.1b TC= +25C All 5.0 V 4 14.5 pF VOLP 7/ All 880 Low level ground bounce noise VOLV7/ VIH= 2.0 V, VIL= 0.0 TA= +25C See figure 4 All 5.0 V 4 -1500 mV VOHP 7/ All 1375 High level VCCbounce noise VOHV 7/ VIH= 2.0 V, VIL= 0.0 TA= +25C See figure 4 All 5.0 V 4 -800 mV All 4.5 V 7, 8 L H Functional tests 3014 8/ VIH= 2.0 V or VIL= 0.8 V Verify output VOUTSee 4.4.1c M 5.5 V 7, 8 L H 5.0 V 9 1.5 5.7 tPLH9/ All 4.5 V and 5.5 V 10, 11 1.5 6.9 5.0 V 9 1.5 6.1 Propagation delay time, mCLK to mQn 3003 tPHL 9/ CL= 50 pF minimum