DLA SMD-5962-93242 REV C-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS OCTAL BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes IAW NOR 5962-R217-96 jak 96-09-12 Monica L. Poelking B Update boilerplate to MIL-PRF-38535. Add note to paragraph 1.4. jak 01-01-05 Thomas M. Hess C Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 09-05-14 T

2、homas M. Hess REV SHET REV C C C C C SHEET 15 16 17 18 19 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby CHECKED BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROV

3、ED BY Monica L. Poelking STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-04-14 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIB

4、LE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-93242 SHEET 1 OF 19 DSCC FORM 2233 APR 97 5962-E309-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93242 DEFENSE SUPPLY

5、CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead fi

6、nishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93242 01 Q K A Federal stock class designator RHA designator (s

7、ee 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Devi

8、ce class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit funct

9、ion 01 54ABT652 Octal bus transceiver and register with three-state outputs, TTL compatible inputs 02 54ABT652A Octal bus transceiver and register with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product ass

10、urance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outli

11、ne(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style K GDFP2-F24 or CDFP3-F24 24 Flat pack L GDIP3-T24 or CDIP4-T24 24 Dual-in-line 3 CQCC1-N28 28 Square leadless-chip-carrier 1.2.5 Lead finish. The lead finish is

12、as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93242 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43

13、218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +5.5 V dc 4/ DC input clamp current (IIK) (VIN 0.0 V).

14、 -18 mA DC output clamp current (IOK) (VOUT 0.0 V). -50 mA DC output current (IOL) (per output). +96 mA Storage temperature range (TSTG). -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C Maximum

15、 power dissipation (PD) . 500 mW 1.4 Recommended operating conditions. 2/ 3/ 5/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to VCC Maximum low level input voltage (VIL) 0.8 V Minimum high level input voltage (VIH)

16、. 2.0 V Case operating temperature range (TC). -55C to +125C Maximum input rise or fall rate (t/V). 5 ns/V Maximum high level output current (IOH) -24 mA Maximum low level output current (IOL) 48 mA 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specifi

17、cation, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Spec

18、ification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings.

19、 Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended o

20、peration at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and o

21、utput negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. 5/ Unused pins (input or I/O) must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-

22、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93242 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing tak

23、es precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified he

24、rein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class l

25、evel B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. T

26、he case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Gro

27、und bounce test circuit and waveforms. The ground bounce test circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiatio

28、n parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall

29、be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasib

30、le due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in acc

31、ordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of comp

32、liance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be liste

33、d as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535

34、and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of micro

35、circuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device

36、 class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for devic

37、e class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93242 DEFENSE SUPPLY CENTER

38、 COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit M

39、in Max High level output voltage 3006 VOH1For all inputs affecting output under test VIN= 2.0 V or 0.8 V IOH= -3 mA All 4.5 V 1, 2, 3 2.5 V VOH2For all inputs affecting output under test VIN= 2.0 V or 0.8 V IOH= -3 mA All 5.0 V 1, 2, 3 3.0 VOH3For all inputs affecting output under test VIN= 2.0 V or

40、 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 Low level output voltage 3007 VOLFor all inputs affecting output under test VIN= 2.0 V or 0.8 V IOL= 48 mA All 4.5 V 1, 2, 3 0.55 V Three-state output leakage current high 3021 IOZH4/ 5/ For control inputs affecting output under test VIN= VIHor VIL VIH= 2.0 V

41、, VIL= 0.8 V VOUT= 2.7 V All 5.5 V 1, 2, 3 10.0 A Three-state output leakage current low 3020 IOZL4/ 5/ For control inputs affecting output under test VIN= VIHor VIL VIH= 2.0 V, VIL= 0.8 V VOUT= 0.5 V All 5.5 V 1, 2, 3 -10.0 A Negative input clamp voltage 3022 VIC-For input under test IIN= -18 mA Al

42、l 4.5 V 1, 2, 3 -1.2 V Off-state leakage current IOFFFor input or output under test VINor VOUT= 4.5 V All other pins at 0.0 V All 0.0 V 1 100.0 A High-state leakage current ICEXFor output under test VOUT= 5.5 V Outputs at high logic state All 5.5 V 1, 2, 3 50.0 A Control inputs 5.5 V 1, 2, 3 +2.0 In

43、put current high 3010 IIH6/ For input under test VIN= VCCA or B ports All 5.5 V 1, 2, 3 +100.0 A Control inputs 5.5 V 1, 2, 3 -2.0 Input current low 3009 IIL6/ For input under test VIN= GND A or B ports All 5.5 V 1, 2, 3 -100.0 A Output current 3011 IOUT 7/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50.0 -180.0

44、 mA Quiescent supply current delta TTL input levels 3005 ICC8/ For input under test VIN= 3.4 V For all other inputs VIN= VCCor GND All 5.5 V 1, 2, 3 2.5 mA Quiescent supply current, outputs high 3005 ICCHFor all inputs VIN= VCCor GND IOUT= 0.0 A All 5.5 V 1, 2, 3 250.0 A Quiescent supply current, ou

45、tputs low 3005 ICCLFor all inputs VIN= VCCor GND IOUT= 0.0 A All 5.5 V 1, 2, 3 30.0 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93242 DEFENSE SUPPLY CENTER COLUMBUS COLUM

46、BUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min

47、Max Quiescent supply current, outputs disabled 3005 ICCZFor all inputs VIN= VCCor GND IOUT= 0.0 A All 5.5 V 1, 2, 3 250.0 A Input capacitance 3012 CINSee 4.4.1b TC= +25C All 5.0 V 4 15.0 pF Output capacitance 3012 CI/OSee 4.4.1b TC= +25C All 5.0 V 4 19.5 pF 01 5.0 V 4 1200 mV Low level ground bounce

48、 noise VOLP9/ 02 5.0 V 4 850 mV 01 5.0 V 4 -1800 mV Low level ground bounce noise VOLV9/ 02 5.0 V 4 -1200 mV 01 5.0 V 4 1500 mV High level VCCbounce noise VOHP9/ 02 5.0 V 4 1150 mV 01 5.0 V 4 -1100 mV High level VCCbounce noise VOHV9/ VIH= 3.0 V VIL= 0.0 V TA= +25C See figure 4 See 4.4.1c 02 5.0 V 4 -450 mV All 4.5 V 7, 8 L H Functional test 3014 10/ VIL= 0.8 V VIH= 2.0 V Verify output VOUT See 4.4.1d All 5.5 V 7, 8 L H 5.0 V 9 0 125 Clock frequency fCLOCK 11/ CL= 50pF minimum RL= 500 See figure 5 All 4.5 V and 5.5 V 10, 11 0 125 MHz 5.0 V 9 4.0 Pulse duration, clock high or l