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本文(DLA SMD-5962-94502 REV B-2008 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 16-BIT BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf)为本站会员(syndromehi216)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-94502 REV B-2008 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 16-BIT BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 02. Editorial changes throughout. 97/05/23 Monica L. Poelking B Update the boilerplate to the current requirements of MIL-PRF-38535. - jak 08-05-12 Thomas M. Hess REV SHET REV B B B B B B B SHEET 15 16 17 18 19 20 21 REV STATUS RE

2、V B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Thanh V. Nguyen STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPART

3、MENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-07-22 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CO

4、DE 67268 5962-94502 SHEET 1 OF 21 DSCC FORM 2233 APR 97 5962-E370-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSC

5、C FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Numb

6、er (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 94502 01 Q X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (

7、see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A speci

8、fied RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABT16646 16-bit bus transceiver and register with three-state

9、 outputs, TTL compatible inputs 02 54ABT16646 16-bit bus transceiver and register with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documen

10、tation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and

11、as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F56 56 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q, and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networki

12、ng permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltag

13、e range (I/O ports) (VIN). -0.5 V dc to +5.5 V dc 4/ DC input voltage range (except I/O ports) (VIN). -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to +5.5 V dc 4/ DC output current (IOL) (per output). +96 mA DC input clamp current (IIK) (VIN= 0.0 V). -18 mA DC output clamp curr

14、ent (IOK) (VOUT 0.0 V). -50 mA VCCcurrent (IVCC) . 514 mA GND current ( IGND) 1056 mA Storage temperature range (TSTG) -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C Maximum power dissipation (

15、PD) . 598 mW 5/ 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Input voltage range (VIN) . +0.0 V dc to VCCOutput voltage range (VOUT) +0.0 V dc to VCCMinimum high level input voltage (VIH ) . 2.0 V Maximum low level input voltage (VIL ) 0.8 V Maximum

16、 high level output current (IOH) -24 mA Maximum low level output current (IOL) . +48 mA Maximum input rise or fall rate (V/t) (outputs enabled) . 10 ns/V Case operating temperature range (TC) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extend

17、ed operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input n

18、egative voltage rating mat be exceeded provided that the input clamp current rating is observed 5/ Power dissipation values are derived using the formula PD= VCCICC+ nVOLIOL, where VCcand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein, and n represents the total numbe

19、r of outputs. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Governme

20、nt specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION

21、 MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Micr

22、ocircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2

23、 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3

24、.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as

25、described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as spec

26、ified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Trut

27、h table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test cir

28、cuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in ta

29、ble I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networ

30、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers

31、PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes

32、Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for de

33、vice class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device cl

34、ass M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that th

35、e manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-3853

36、5 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing

37、 is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made

38、available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted witho

39、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Device type VCCGroup A subgroups

40、 Limits 3/ Unit Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Min Max 4.5 V 1, 2, 3 2.5 IOH= -3.0 mA 5.0 V 1, 2, 3 3.0 High level output voltage 3006 VOHFor all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 V Low level outpu

41、t voltage 3007 VOLFor all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= 48 mA All 4.5 V 1, 2, 3 0.55 V Negative input clamp voltage 3022 VIC- For input under test, IIN= -18 mA All Open 1 -1.2 V 01 1, 2, 3 1.0 Control pins 02 5.5 V 1, 2, 3 2.0 01 1, 2, 3 20.0 Input current high 3010 II

42、H4/ For input under test VIN= VCCA or B ports 02 5.5 V 1, 2, 3 100.0 A 01 1, 2, 3 -1.0 Control pins 02 5.5 V 1, 2, 3 -2.0 01 1, 2, 3 -20.0 Input current low 3009 IIL4/ For input under test VIN= 0.0 V A or B ports 02 5.5 V 1, 2, 3 -100.0 A 01 5.5 V 1, 2, 3 10.0 A Three-state output leakage current, h

43、igh 3021 IOZH5/ For control inputs affecting outputs under test, VIN= 2.0 V or 0.8 V VOUT= 2.7 V 02 5.5 V 1, 2, 3 50.0 A 01 5.5 V 1, 2, 3 -10.0 A Three-state output leakage current, low 3020 IOZL5/ For control inputs affecting outputs under test, VIN= 2.0 V or 0.8 V VOUT= 0.5 V 02 5.5 V 1, 2, 3 -50.

44、0 A Off-state leakage current IOFFFor input or output under test, VINor VOUT= 4.5 V All others pins at 0.0 V All 0.0 V 1 100 A High-state leakage current ICEXFor output under test, VOUT= 5.5 V Outputs at high logic state All 5.5 V 1, 2, 3 50.0 A Output current 3011 IO6/ VOUT= 2.5 V All 0.0 V 1 -50 +

45、180 mA 01 5.5 V 1, 2, 3 50.0 A Quiescent supply current delta, TTL input level 3005 ICC7/ For input under test, VIN= 3.4 V For all other inputs, VIN= VCCor GND 02 5.5 V 1, 2, 3 2.5 mA See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

46、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94502 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Device type VCCGroup A subgroups Limits 3/ U

47、nit Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Min Max ICCHOutputs high All 2.0 mA 01 32.0 ICCLOutputs low 02 60.0 mA Quiescent supply current, outputs high 3005 ICCZFor all inputs, VIN= VCCor GND IOUT= 0.0 A A or B ports Outputs disabled All 5.5 V 1, 2, 3 2.0 mA I

48、nput capacitance 3005 CINTC= +25C See 4.4.1c A or B ports All 5.0 V 4 10.5 pF 01 5.0 V 4 14.5 pF Input/output capacitance 3005 CI/OTC= +25C See 4.4.1c A or B ports 02 5.0 V 4 15.0 pF 01 5.0 V 4 880 mV Low level ground bounce noise VOLP8/ 02 5.0 V 4 1000 mV 01 5.0 V 4 -1250 mV Low level ground bounce noise VOLV8/ 02 5.0 V 4 -1500 mV 01 5.0 V 4 1375 mV High level VCCbounce noise VOHP8/ 02 5.0 V 4 1500 mV 01 5.0 V 4 -550 mV High level VCCbounce noise VOHV8/ VIH= 3.0 V, VIL= 0.0 V TA= +25C See figure 4 See 4.4.1d 02 5.0 V 4 -800 mV 4.5 V Functional

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