DLA SMD-5962-94587 REV C-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 16-BIT NONINVERTING BUFFER LINE DRIVER WITH SERIES RESISTOR AND THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS M.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes IAW NOR 5962-R191-94 tvn. 96-11-04 Monica L. Poelking B Change low level ground bounce limits. Editorial changes throughout jak. 99-07-15 Monica L. Poelking C Correct test condition for high level output voltage (VOH) and low level output

2、 voltage (VOL) in the table I. Update the boilerplate paragraphs to current requirements of MIL-PRF-38535. - MAA 09-03-24 Thomas M. Hess REV SHEET REV C C C SHEET 15 16 17 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Thanh V. Nguyen

3、 STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT NONINVERTING BUFFER/LINE

4、DRIVER WITH SERIES RESISTOR AND THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-04-05 SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-94587 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E220-09 Provided by IHSNot for

5、ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class le

6、vels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected

7、 in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 94587 01 Q X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. De

8、vice classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a

9、 non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABT162244 16-bit noninverting buffer/driver with series resistor and three-state outputs, TTL compatible inputs. 1.2.3 Device class designator. The dev

10、ice class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or

11、V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F48 48 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 f

12、or device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET

13、 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to +5.5 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +5.5 V dc 4/ DC output current (IOL) (per output) +30 mA DC input clamp current (IIK)

14、 (VIN 0.0 V) -18 mA DC output clamp current (IOK) (VOUT 0.0 V). -50 mA Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C Maximum power dissipation (PD) . 267 mW

15、 5/ 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to VCCMinimum High level input voltage (VIH) +2.0 V Maximum Low level input voltage (VIL). +0.8V Maximum High level outpu

16、t current (IOH) -3.0 mA Maximum Low level output current (IOL). +8.0 mA Maximum input rise or fall rate (t / V). 10 ns/V Case operating temperature range ( TC) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum leve

17、ls may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output voltage ratings may be

18、 exceeded provided that the input and output clamp-current ratings are observed. 5/ Power dissipation values are derived using the formula Pd = VCCICC+ nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table 1 herein, and “n“ represents the total number of outputs

19、. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specifica

20、tion, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-385

21、35 - Integrated Circuits Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard For Microcircuit Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings

22、 (SMDs). MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a

23、 conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual it

24、em requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item r

25、equirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for d

26、evice classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as sp

27、ecified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test

28、circuit shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.2.7 R

29、adiation exposure circuit. The radiation exposure circuit shall be as specified when available. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as s

30、pecified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked wi

31、th the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the R

32、HA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“

33、 or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to th

34、e requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an

35、 approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of co

36、nformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of pro

37、duct (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicab

38、le required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A). Provided b

39、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits 3/ T

40、est and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Min Max Unit 4.5 V1, 2, 3 3.35 IOH= -1.0 mA 5.0 V1, 2, 3 3.85 High level output voltage 3006 VOHFor all inputs affecting output under test, VIH= 2.0 V or VIL=

41、0.8 V IOH= -3.0 mA 4.5 V1, 2, 3 3.1 V Low level output voltage 3007 VOLFor all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V IOL= +8.0 mA 4.5 V1, 2, 3 0.8 V Negative input clamp voltage 3022 VIC-For input under test, IIN= -18 mA 4.5 V1, 2, 3 -1.2 V Input current high 3010 IIHFor input

42、 under test, VIN= VCC5.5 V1, 2, 3 +1.0 A Input current low 3009 IILFor output under test, VIN= GND 5.5 V1, 2, 3 -1.0 A Three-state output leakage current high 3021 IOZHFor control inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V VOUT= 2.7 V 5.5 V1, 2, 3 +10.0A Three-state output leakage

43、current low 3020 IOZLFor control inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V VOUT= 0.5 V 5.5 V1, 2, 3 -10.0 A Off-state leakage current IOFFFor input or output under test VINor VOUT= 5.5 V All other pins at 0.0 V 0.0 V1 100 A High-state leakage current ICEXFor output under test, VOU

44、T= 5.5 V Outputs at high logic state 5.5 V1, 2, 3 50.0 A Output current 3011 IO4/ VOUT= 2.5 V 5.5 V1, 2, 3 -25.0 -100 mA Quiescent supply current delta, TTL input level 3005 ICC5/ For input under test, VIN= 3.4 V For all other inputs VIN= VCCor GND 5.5 V1, 2, 3 50.0 A Quiescent supply current, outpu

45、ts high 3005 ICCH5.5 V1, 2, 3 2.0 Quiescent supply current, outputs low 3005 ICCL5.5 V1, 2, 3 30.0 Quiescent supply current, outputs disabled 3005 ICCZFor all inputs, VIN= VCCor GND IOUT= 0 A 5.5 V1, 2, 3 2.0 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networkin

46、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Limits 3/ Test and MIL-STD-883 test method 1/ Sy

47、mbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Min Max Unit Input capacitance 3012 CIN5.0 V 4 10 pFOutput capacitance 3012 COUTTC= +25C See 4.4.1c 5.0 V 4 13 pF VOLP6/ 5.0 V 4 765 Low level ground bounce noise VOLV6/ 5.0 V 4 -755 VOHP6/ 5.0 V

48、4 1375 High level VCCbounce noise VOHV6/ VIH= 3.0 V, VIL= 0.0 V TC= +25C See 4.4.1d See figure 4 5.0 V 4 -550 mV 4.5 V 7, 8 L H Functional test 3014 7/ VIH= 2.0 V, VIL= 0.8 V Verify output VOSee 4.4.1b 5.5 V 7, 8 L H 5.0 V 9 1.0 3.6 tPLH8/ 4.5 V and 5.5 V 10, 11 1.0 4.1 5.0 V 9 1.0 4.7 Propagation delay time, mAn to mYn 3003 tPHL8/ CL= 50 pF minimum RL = 500 See figure 5 4.5 V and 5.5 V 10, 11 1.0 5.3 ns 5.0 V 9 1.0 4.8 tPZH8/ 4.5 V and 5.5 V 10, 11 1.0 5.6 5.0 V 9 1.0 4.7 Propagation delay time, output enable, OEm to mYn 3003 tPZL8/ CL= 5