DLA SMD-5962-94591 REV A-2004 MICROCIRCUIT DIGITAL ECL LOW POWER 8-BIT SHIFT REGISTER MONOLITHIC SILICON《硅单片 8位移位寄存器 ECL数字微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Radiation requirements added to drawing. Update to reflect latest changes in format and requirements. Corrections made to Y case outline dimensions. Editorial changes throughout. -les 04-03-15 Raymond Monnin REV SHET REV A SHET 15 REV STATUS REV

2、A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Larry T. Gauder DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas M. Hess COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AP

3、PROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ECL, LOW POWER, 8-BIT SHIFT REGISTER, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-04-28 MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-94591 SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E167-04 DISTRIBUT

4、ION STATEMENT A. Approved for public release; distribution is unlimitedProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94591 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 2 D

5、SCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Nu

6、mber (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 F 94591 01 M X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase

7、outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendi

8、x A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 100341 Low power, 8-bit shift register 1.2.3 Device class

9、designator. The device class designator is a single letter identifying the product assurance level as listed below. Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF

10、-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDIP5-T24 or CDIP6-T24 24 dual-in-line Y See figure 1 24 quad-flat 1.2.5

11、 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94591 DEFENSE SUPPLY

12、CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VEE) -7.0 V dc to +0.5 V dc Dc input voltage range (VIN) VEEto +0.5 V dc Dc input current range (IIN) . -30 mA to +5.0 mA Storage temperature range -65C to

13、+150C Maximum dc output current (IOUT) . -50 mA Maximum power dissipation (PD) . 750 mW Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) +175C Thermal resistance, junction-to-case (JC): See MIL-STD-1835 1.4 Recommended operating conditions. Negative supply voltage range (VE

14、E) . -5.7 V dc minimim to 4.2 V dc maximum High level input voltage range (VIH) -1.165 V dc minimum to 0.870 V dc maximum Low level output voltage (VIL) . -1.830 V dc minimum to 1.475 V dc maximum Ambient operating temperature range (TC) . -55C to +125C 1.5 Radiation features. Maximum total dose ava

15、ilable (dose rate = 50 300 rads(Si)/s). 300 Krads (Si) 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these doc

16、uments are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT

17、OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect rel

18、iability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94591 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK

19、-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

20、2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENT

21、S 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function

22、as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as s

23、pecified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figu

24、re 2. 3.2.3 Truth table. The truth table shall be as specified on figure 3. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 4. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 5. 3.2.6 Radiation exposure circu

25、it. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and post-irradiation parameter limits. Unless otherwise specif

26、ied herein, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. Th

27、e electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space

28、limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL

29、-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reprodu

30、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94591 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 1/

31、3/ unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max High level output voltage VOHVEE= -4.2 V, -5.7 V, 1, 2 All -1.025 -.870 V IH= -0.87 V, 3 -1.085 -.870 Low level output voltage VOLVIL= -1.83 V, 1, 2 All -1.830 -1.620 V Loading 50 to 2.0 V 3 -1.830 -1.555 High level thres

32、hold output VOHCVEE= -4.2 V, -5.7 V, 1, 2 All -1.035 V voltage VIH= -1.165 V, 3 -1.085 Low level threshold output VOLCVIL= -1.475 V, 1, 2 All -1.610 V voltage Loading 50 to 2.0 V 3 -1.555 Negative power supply IEEVEE= -4.2 V, -5.7 V, 1, 2, 3 All -178 -55 mA drain current VEE= -4.2 V, -4.8 V, 1, 2, 3

33、 -168 -55 mA Low level input current IILVEE= -4.2 V, 1, 2, 3 All 0.5 A IN= -1.83 V High level input current IIHVEE= -5.7 V, 1, 2 All 240 A VIN= -0.87 V 3 340 Functional tests VEE= -4.2 V, -5.7 V, VIN= -1.165 V, VIL= -1.830 V, See 4.4.1c. 7, 8 All Propagation delay time tPLH1VEE= -4.2 V to -5.7 V 9 A

34、ll 0.5 2.3 ns CP to output tPLH1See figure 5 10 0.5 2.8 11 0.5 2.5 Transition time, Qn2/ tTLH9, 10, 11 All 0.3 1.3 ns tTHLSetup time 2/ ts Dnto CP 9, 10, 11 0.6 ns Pnto CP 9, 10, 11 0.6 9 1.6 Snto CP 10 2.4 11 1.7 Hold time 2/ thDnto CP 9, 10, 11 0.9 ns Pnto CP 9, 10, 11 0.9 Snto CP 9, 10, 11 0.5 Pu

35、lse width 2/ Tpw(H) 9, 10, 11 2.0 ns Max clock frequency 2/ fMAX9 400 MHz 10 300 11 400 1/ Pre and Post-irradiation values are identical unless otherwise specified in table I. When performing post-irradiation electrical measurements for any RHA level, TA= +25C. 2/ This parameter is provided as desig

36、n information only (not tested but guaranteed). 3/ This product is irradiated and post-irradiation tested at M, D, P, L, R, and F levels and meets the Table I limits. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

37、A 5962-94591 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of

38、 this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source

39、of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as requ

40、ired for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 her

41、ein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable

42、required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 33 (see MIL-PRF-38535, appendix A). 4. QUALITY ASS

43、URANCE PROVISIONS 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function

44、 as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94591 DEFENSE SUPPLY CENTER

45、COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case Y Dimension Millimeters Inches Notes Min Max Min Max A 2.16 .085 b 0.41 0.46 .015 .019 c 0.10 0.15 .004 .007 D 22.10 28.45 .870 1.120 D1 9.40 10.16 .370 .400 4 E 22.10 28.45 .870 1.120 E1 9.40 10.16 .370 .400 4 e

46、1.14 1.40 .045 .055 L 6.35 9.14 .250 .360 Q 0.89 1.27 .035 .050 5 S 1.91 .075 NOTES: 1. The preferred unit of measurement is millimeters. However, this item was designed using inch-pound units of measurement. In case problems involving conflicts between the metric and inch-pound units, the inch-poun

47、d units shall rule. 2. Lead number 1 is identified by a tab located on the lead. 3. Lead numbers are shown for reference only and do not appear on the package. 4. Dimensions D1 and E1 allow glass meniscus. 5. Dimension Q shall be measured at the point of exit of the lead from the body. FIGURE 1. Cas

48、e outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94591 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Device type 01 01 Case outlines X Y Terminal number Terminal symbol Terminal symbol 1 D0P22 Q0 13 Q1 04 Q2D05 Q3Q06 VCC 17 VCCA 28 Q4Q39 Q5VCC10 Q6 CCA11 Q7Q412 D7 513 P7 614 P6Q715 P5D716 P4P717 CP P618 VEE 519 S0P420 S1CP 21 P3VEE22 P2S023 P1 124 P0P3FIGURE 2. Terminal connections. Provided by I