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本文(DLA SMD-5962-94625 REV B-2006 MICROCIRCUIT HYBRID LINEAR 12 VOLT SINGLE CHANNEL DC DC CONVERTER《12伏特单信道直流 直流转变器 线性混合微型电路》.pdf)为本站会员(周芸)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-94625 REV B-2006 MICROCIRCUIT HYBRID LINEAR 12 VOLT SINGLE CHANNEL DC DC CONVERTER《12伏特单信道直流 直流转变器 线性混合微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing boilerplate. Editorial changes throughout. 03-05-29 Raymond Monnin B Correct paragraphs 4.2.a.2. and 4.3.3.b.2. 06-11-06 Raymond Monnin REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 1

2、1 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID,

3、LINEAR, 12 VOLT, SINGLE CHANNEL, DC/DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-07-19 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-94625 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E056-07Provided by IHSNot for ResaleNo reproduction or networking permitted w

4、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-3853

5、4. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 94625 01 H X X F

6、ederal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA

7、levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 ATR2812S/CH DC/DC converter, 30 W, 12 V output 1.2.3 Device class d

8、esignator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance level

9、s are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required.

10、G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections

11、(Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure

12、that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking

13、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter D

14、escriptive designator Terminals Package style X See figure 1 10 Dual-in-line Z See figure 1 10 Flange mount 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc Power dissipation (PD) 14 W Lead temperatu

15、re (soldering, 10 seconds). +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range +16 V dc to +40 V dc Output power 2/ . 30 W Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and ha

16、ndbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircui

17、ts, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Mi

18、crocircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a confl

19、ict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item per

20、formance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device cla

21、ss. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the devi

22、ce for the applicable device class. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate output power linearly above case temperature +125C to 0 at +135C. Provided b

23、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The desig

24、n, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. T

25、he block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requireme

26、nts. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. I

27、n addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspect

28、ion group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the pre

29、paring activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the perfor

30、mance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall

31、be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional c

32、riteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circ

33、uit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TCas specified in the approved manufacturers QM plan. b. Interim and final electrical test parameters shall be as specified in table II here

34、in, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS

35、, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TC +125C VIN= 28 V dc 5%, CL= 0 unless otherwise specified Group A subgroups Device type Min Max Unit 1 11.88 12.12 Output voltage VOUTIOUT= 0 2,3 01 1

36、1.70 12.30 V Output current 1/ IOUTVIN= 16, 28, and 40 V dc 1,2,3 01 2500 mA Output ripple voltage 2/ VRIPVIN= 16, 28, and 40 V dc, B.W. = 20 Hz to 2 MHz 1,2,3 01 60 mV p-p 1 30 Line regulation 3/ VRLINEVIN= 16, 28, and 40 V dc, IOUT= 0, 1250, and 2500 mA 2,3 01 60 mV 1 60 Load regulation 3/ VRLOADV

37、IN= 16, 28, and 40 V dc, IOUT= 0, 1250, and 2500 mA 2,3 01 120 mV IOUT= 0, inhibit (pin 2) tied to input return (pin 10) 1,2,3 18 1 50 Input current IINIOUT= 0, inhibit (pin 2) = open 2,3 01 75 mA Input ripple current 2/ IRIPIOUT= 2500 mA , B.W. = 20 Hz to 2 MHz 1,2,3 01 50 mA p-p 1 80 Efficiency EF

38、FIOUT= 2500 mA 2,3 01 75 % Isolation ISO Input to output or any pin to case (except pin 8) at 500 V dc, TC= +25C 1 01 100 M Capacitive load 4/ 5/ CLNo effect on dc performance, TC= +25C 4 01 500 F Overload, TC= +25C 6/ 1 12 Power dissipation load fault PDShort circuit 1,2,3 01 9 W See footnotes at e

39、nd of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance chara

40、cteristics - Continued. Limits Test Symbol Conditions -55C TC +125C VIN= 28 V dc 5%, CL= 0 unless otherwise specified Group A subgroups Device type Min Max Unit Switching frequency FSIOUT= 2500 mA 4,5,6 01 500 600 kHz Sync frequency range FsyncIOUT= 2500 mA 4,5,6 01 500 700 kHz 1250 mA to/from 2500

41、mA 4,5,6 -800 +800 Output response to step transient load changes 7/ VOTLOAD 200 mA to/from 1250 mA 4,5,6 01 -1000 +1000 mV pk 4 100 1250 mA to/from 2500 mA 5,6 200 4 100 Recovery time step transient load changes 7/ 8/ TTLOAD 200 mA to/from 1250 mA 5,6 01 200 s Output response to transient step line

42、 changes 5/ 9/ VOTLINE Input step 16 V to/from 40 V dc, IOUT= 2500 mA 4,5,6 01 1200 mV pk Recovery time transient step line changes 5/ 8/ 9/ TTLINE Input step 16 V to/from 40 V dc, IOUT= 2500 mA 4,5,6 01 10 ms Turn on overshoot VTonOSIOUT= 0 and 2500 mA 4,5,6 01 800 mV pk Turn on delay 10/ TonDIOUT=

43、 0 and 2500 mA 4,5,6 01 25 ms Load fault recovery 5/ 10/ TrLF 4,5,6 01 25 ms 1/ Parameter guaranteed by line and load regulation tests. 2/ Bandwidth guaranteed by design. Tested for 20 kHz to 2 MHz. 3/ Output voltage measured at load with remote sense leads connected across load. 4/ Capacitive load

44、may be any value from 0 to the maximum limit without compromising dc performance. A capacitive load in excess of the maximum limit will not disturb loop stability but may interfere with the operation of the load fault detection circuitry, appearing as a short circuit during turn on. 5/ Parameter sha

45、ll be tested as part of design characterization and after design or process changes. Thereafter parameters shall be guaranteed to the limits specified in table 1. 6/ An overload is that condition with a load in excess of the rated load but less than that necessary to trigger the short circuit protec

46、tion and is the condition of maximum power dissipation. 7/ Load step transition time between 2 and 10 microseconds. 8/ Recovery time is measured from the initiation of the transient to where VOUThas returned to within 1 percent of VOUTat 50 percent load. 9/ Input step transition time between 2 and 1

47、0 microseconds. 10/ Turn on delay time measurement is for either a step application of power at the input or the removal of a ground signal from the inhibit pin (pin 2) while power is applied to the input. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-

48、,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A 10.29 .405 b 0.89 1.14 .035 .045 D 53.85 2.120 e 10.03 10.29 .395 .405 E 28.45 1.120 eA 20.19 20.45 .795 .805 L 6.35 6.86 .250 .270 FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH

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