DLA SMD-5962-94629 REV D-2012 MICROCIRCUIT HYBRID LINEAR 5 VOLT SINGLE CHANNEL DC DC CONVERTER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I, change Capacitive load maximum limit. Remove figure 3, block diagram. 98-11-09 K. A. Cottongim B Table I, change Recovery time, step transient load changes (TTLOAD) maximum limit from 200 s to 300 s. sld 99-02-02 K. A. Cottongim C Add de

2、vice type 02, case outline Y, and vendor CAGE 51651. 04-04-02 Raymond Monnin D Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 12-10-12 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10

3、11 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall Cottongim MICROCIRCUIT, HYBRID, LINEAR, 5 VOLT, S

4、INGLE CHANNEL, DC/DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95-10-24 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-94629 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E473-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr

5、om IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94629 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlin

6、es and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 94629 01 H X X Federal RHA Device Device C

7、ase Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked

8、 with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 ASA2805S/CH DC/DC converter, 5 W, 5 V output 02 DHC2805SH DC/DC converter, 6 W, 5 V output 1.

9、2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The produ

10、ct assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devi

11、ces are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and confor

12、mance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be r

13、eviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s

14、) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Dual-in-line Y See figure 1 8 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or net

15、working permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94629 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc (continuous) 80 V (100 ms) Power di

16、ssipation (PD) . 4 W Lead soldering temperature (10 seconds) . +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range: Device type 01 +16 V dc to +40 V dc Device type 02 +12 V dc to +50 V dc Output power: 2/ Device type 01 5 W Device type 02 6 W Case

17、operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents

18、 are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Out

19、lines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Buil

20、ding 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exem

21、ption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device ma

22、nufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition,

23、the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability.

24、 2/ Derate output power linearly above case temperature +125C to 0 at +135C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94629 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC

25、 FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The

26、terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requi

27、rements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herei

28、n. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance ins

29、pection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the

30、 preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that th

31、e manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. S

32、ampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with M

33、IL-PRF-38534. The following additional criteria shall apply: a. Pre-seal burn-in test, method 1030 of MIL-STD-883. (optional for class H) (1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DL

34、A Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1030 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015

35、of MIL-STD-883. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also,

36、the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. c. Interim and final electrical test parameters shall

37、be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94629 DLA LAN

38、D AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C VIN= 28 V dc 5%, CL= 0 unless otherwise specified Group A subgroups Device types Limits Unit Min Max Output voltage VOUTIOUT=

39、0 1 01,02 4.95 5.05 V 2,3 4.90 5.10 Output current 1/ IOUTVIN= 16, 28, and 40 V dc 1,2,3 01 1000 mA 02 1200 Output ripple voltage 2/ VRIPVIN= 16, 28, and 40 V dc, B.W. = 20 Hz to 2 MHz 1 01 190 mVp-p 2,3 475 VIN= 16, 28, and 40 V dc, B.W. = 20 Hz to 2 MHz, IOUT= 1000 mA 1 02 190 mVp-p 2,3 475 Line r

40、egulation VRLINEVIN= 16, 28, and 40 V dc, IOUT= 0, 500, and 1000 mA 1 01,02 25 mV 2,3 50 Load regulation VRLOADVIN= 16, 28, and 40 V dc, IOUT= 0, 500, and 1000 mA 1 01,02 25 mV 2,3 50 Input current IINIOUT= 0 , Inhibit (pin 5) tied to input return (pin 7) 1,2,3 01,02 18 mA IOUT= 0 , Inhibit (pin 5)

41、= open 50 Input ripple current 2/ IRIPIOUT= 1000 mA, B.W. = 20 Hz to 2 MHz 1,2,3 01 100 mAp-p 02 200 Efficiency Eff IOUT= 1000 mA 1,2,3 01 66 % 1 02 64 2,3 62 Isolation ISO Input to output or any pin to case (except pin 8) at 500V dc, TC= +25C 1 01,02 100 M Capacitive load 3/ 4/ CLNo effect on dc pe

42、rformance, TC= +25C 4 01,02 250 F Power dissipation load fault PDOverload 5/ 1,2,3 01 4.0 W Shot circuit 6/ 01,02 2.0 Switching frequency FSIOUT= 1000 mA 4,5,6 01 500 600 kHz 4 02 375 425 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

43、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94629 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued Test Symbol Conditions -55C TC +125C VIN= 28 V dc 5%, CL= 0 unless otherwise spe

44、cified Group A subgroups Device types Limits Unit Min Max Output response to step transient load changes 7/ VOTLOAD500 mA to/from 1000 mA 4 01 -300 +300 mV pk 5,6 -450 +450 4 02 -500 +500 5,6 -750 +750 0 mA to/from 500 mA 4 01 -500 +500 5,6 -750 +750 4,5,6 02 -1500 +1500 Recovery time, step transien

45、t load changes 7/ 8/ TTLOAD500 mA to/from 1000 mA 4,5,6 01,02 300 s 0 mA to/from 500 mA 1 ms 500 mA to/from 0 mA 1 Output response transient step line changes VOTLINEInput step 16 to 40 V dc, IOUT= 1000 mA 4/ 9/ 4,5,6 01,02 500 mV pk Input step 40 to 16 V dc, IOUT= 1000 mA 4/ 9/ -500 Recovery time t

46、ransient step line changes TTLINEInput step 16 to 40 V dc, IOUT= 1000 mA 4/ 8/ 9/ 4,5,6 01,02 800 s Turn on overshoot VtonOSIOUT = 0 mA 4,5,6 01 600 mV pk IOUT = 1000 mA 01,02 600 Turn on delay 10/ TonDIOUT = 0 and 1000 mA 4,5,6 01 20 ms 02 50 Load fault recovery 4/ TrLF4,5,6 01 6/ 20 ms 1/ Paramete

47、r guaranteed by line and load regulation tests. 2/ Bandwidth guaranteed by design. Tested for 20 kHz to 2 MHz. 3/ Capacitive load may be any value from 0 to the maximum limit without compromising dc performance. A capacitive load in excess of the maximum limit will not disturb loop stability but may

48、 interfere with the operation of the load fault detection circuitry, appearing as a short circuit during turn-on. 4/ Parameter shall be tested as part of design characterization and after design or process changes. Thereafter, parameters shall be guaranteed to the limits specified in table 1. 5/ An overload is that condition with a load in excess of the rated load but less than that necessary to trigger the short