DLA SMD-5962-94655 REV F-2009 MICROCIRCUIT HYBRID LINEAR 5-VOLT SINGLE CHANNEL DC-DC CONVERTER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R125-95. 95-05-10 K. A. Cottongim B Table I, correct isolation test condition. Corrections to figure 1, case outlines X and Z. 97-10-21 K. A. Cottongim C Removed the min limit for dimension D of 2.880 inches (7

2、3.15 mm) for case outline Z. -sld 98-09-17 K. A. Cottongim D Paragraphs 4.2.a.2 and 4.3.3.b.2, change TCto TA. Table I, Output current test, correct conditions. Table I, Efficiency test limits, change 80% to 76% and 76% to 73%. Table I, standardize test nomenclature. 01-06-06 Raymond Monnin E Update

3、 drawing. -gz 07-04-10 Robert M. Heber F Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 09-11-02 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve L. Dunca

4、n DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 5-VOLT, SINGLE CHANNEL, DC-DC CONVERTER AND

5、AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-10-21 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-94655 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E008-10Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRA

6、WING SIZE A 5962-94655 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which

7、are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 94655 01 H X X Federal RHA Device Device Case Lead stock class design

8、ator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked wit

9、h the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MHD2805S/883, MHD2805SF/883 DC-DC converter, 15 W, 5 V output 1.2.3 Device class designator. This

10、 device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follow

11、s: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testi

12、ng version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C,

13、 and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the except

14、ion(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted witho

15、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94655 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive desi

16、gnator Terminals Package style X See figure 1 10 Dual-in-line Z See figure 1 10 Flange mount 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range (VIN) -0.5 V dc to +50 V dc Power dissipation (PD) . 10 W Output power . 15.45

17、W Lead soldering temperature (10 seconds) . +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range (VIN) +16 V dc to +40 V dc Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and hand

18、books. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits

19、, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Micr

20、ocircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this dr

21、awing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Exte

22、nded operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94655 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEV

23、EL F SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the

24、 device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In

25、addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outl

26、ine(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as

27、specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking

28、of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device d

29、escribed herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. T

30、his data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The cert

31、ificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcir

32、cuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or funct

33、ion as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

34、level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in acc

35、ordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or

36、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94655 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C VIN= 28V dc

37、 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage VOUTIOUT= 3.0 A 1 01 4.95 5.05 V dc 2,3 4.85 5.15 Output current IOUTVIN= 16 V dc to 40 V dc 1,2,3 01 0.0 3000 mA VOUTripple voltage VRIPIOUT= 3.0 A, B.W. = 10 kHz to 2 MHz 1

38、 01 50 mV p-p 2,3 90 VOUTline regulation VRLINEVIN= 16 V dc to 40 V dc, IOUT= 3.0 A 1,2,3 01 50 mV VOUTload regulation VRLOADIOUT= 0 to 3.0 A 1,2,3 01 50 mV Input current IINIOUT= 0 A, Inhibit (pin 2) = 0 1,2,3 01 8 mA IOUT= 0 A, Inhibit (pin 2) = open 1, 2, 3 01 75 IINripple current IRIPIOUT= 3.0 A

39、, B.W. = 10 kHz to 10 MHz 1, 2, 3 01 50 mA p-p Efficiency Eff IOUT= 3.0 A 1 01 76 % 2, 3 73 Isolation ISO Input to output or any pin to case (except pins 6, 7, and 8) at 500V dc, TA= +25C 1 01 100 M Capacitive load 1/ 2/ CLNo effect on dc performance, TA= +25C 4 01 10000 F See footnotes at end of ta

40、ble. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94655 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristi

41、cs - Continued. Test Symbol Conditions VIN= 28V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Short circuit power dissipation PDShort circuit 1,2,3 01 10 W Switching frequency FSIOUT= 3.0 A 4,5,6 01 550 650 kHz External sync range 3/

42、 FSYNCIOUT= 3.0 A, TTL level to pin 9 4,5,6 01 500 675 kHz VOUTstep load transient 4/ VTLOAD50% load to/from 100% load 4,5,6 01 -300 +300 mV pk VOUTstep load transient recovery 2/ 4/ 5/ TTLOAD50% load to/from 100% load 4,5,6 01 200 s VOUTstep line transient 2/ 6/ VTLINEInput step 16 V dc to/from 40

43、V dc, IOUT= 3.0 A 4,5,6 01 -300 +300 mV pk VOUTstep line transient recovery 2/ 5/ 6/ TTLINEInput step 16 V dc to/from 40 V dc, IOUT= 3.0 A 4,5,6 01 300 s Start up overshoot 2/ VtonOSIOUT = 3.0 A 4,5,6 01 50 mV pk Start up delay 7/ TonDIOUT = 3.0 A 4,5,6 01 5 ms Load fault recovery 2/ 5/ TrLFIOUT = 3

44、.0 A 4,5,6 01 5 ms 1/ Capacitive load may be any value from 0 to the maximum limit without compromising dc performance. 2/ Parameter shall be tested as part of device characterization and after design and process changes; therefore, the parameter shall be guaranteed to the limits specified in table

45、I. 3/ A TTL level waveform (VIH= 4.5 V minimum, VIL= 0.8 V maximum) with a 50% 10% duty cycle applied to the sync pin (pin 9) within the sync range frequency shall cause the converters switching frequency to become synchronous with the frequency applied to the sync input pin (pin 9). 4/ Load step tr

46、ansition time greater than 10 microseconds. 5/ Recovery time is measured from the initiation of the transient until VOUThas returned to within 1 percent of VOUT final value. 6/ Input step transition time is greater than 10 microseconds. 7/ Start up delay time measurement is either for a step applica

47、tion of power at the input or the removal of a ground signal from the inhibit pin (pin 2) while power is applied to the input. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94655 DEFENSE SUPPLY CENTER COLUM

48、BUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Symbol Millimeters Inches Min Max Min Max A 10.16 .400 b 0.89 1.14 .035 .045 e 10.16 BSC .400 BSC E 28.07 28.32 1.105 1.115 L 6.09 6.60 .240 .260 q 53.21 2.095 q1 24.26 BSC .955 BSC S1 6.22 BSC .245 BSC S2 3.94 BSC .155 BSC NOTES: 1. The case outline X was originally designed using the inch-pound units of measurement, in the event of conflict between the metric and in