DLA SMD-5962-94710-1994 MICROCIRCUIT DIGITAL QUAD UNIVERSAL ASYNCHRONOUS RECEIVER TRANSMITTER (QUART) MONOLITHIC SILICON《整体不同步接收器或传播器(夸脱)硅单片电路线型微电路》.pdf

1、- SMD-5962-947LO = 9999996 0070397 48T I -yu- REVISIONS LTR 1 DESCRIPTION DATE (YR-MO-DA) APPROVED ?I=+ SHEET 18 19 20 21 22 23 PMIC NIA STANDARD MICROCIRCUIT DRAWING SHEET THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE 15 16 17 AMSC N/A SHEET )ESC FOR

2、M 193 JUL 94 123 SIZE A REV CAGE CODE 5962-94710 67268 CHECKED BY Thomas M. Hess APPROVED BY Monica L. Poelking DRAWING APPROVAL DATE 94- 1 1 -01 REVISION LEVEL DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUIT, DIGITAL, QUAD UNIVERSAL ASYNCHRONOUS RECEIVER/TRANSMITTER (QUART) MONOLI

3、THIC SILICON 5962-E021-95 DISTRIBUTION STATCMENT A. Approved for public release: distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SflD-59bZ-qY710 9999796 0070198 3Lb I 1. SCOPE 1.1 Scope. This drawing forms a part of a one p

4、art - one part nuher documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifyin

5、g Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883. “Provisions for the use of MIL-STO-883 in conjunction with compliant non-JAN devices“. When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in

6、the PIN. 1.2 m. The PIN shall be as shown in the following example: - 5962 94710 o1 P X X I I - 1 I I I I I I I 1 I Lead finish Case outline Dev ice Devi ce IL Federa 1 RHA stock class designator me class 1 designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) I (see 1.2.3) f 1.2.1 R

7、HA desiqnator. Device class M RHA marked devices shall meet the MIL-1-38535 appendix A specified RHA levels I Drawing nuher and shall be marked with the appropriate RHA designator. Oevice classes Q and V RHA marked devices shall meet the non-RHA devi ce. 1 MIL-1-38535 specified RHA levels and shall

8、be marked with the appropriate RHA designator. A dash (-) indicates a , 1.2.2 Device typeu. The device type(s) shall identify the circuit function as follows: 1.2.3 Device class desiqnator. The device class designator shall be a single letter identifying the product assurance level as follows: Devic

9、e type Generic number Circuit function S TANDARD MICROCIRCUIT DRAWNG DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 o1 26C94 SIZE 5962-94710 A REVISION LEVEL SHEET 2 Quad universal asynchronous rece i ver/tra nsmi t ter (QUART) Oevice class Device requirements documentat ion M Vendor self-cert

10、ification to the requirements for non-JAN class 8 microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or Certification and qualification to MIL-1-38535 1.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive desiqnator Termi na

11、 1 s Package style X GOIPl-T48 or CDIP2-T48 48 Dual-in-1 ine package MIL-1-38535 for classes Q and V. Finish letter “X“ shall not be marked on the microcircuit or its packaging. The “X“ designation is for use in specifications when lead finishes A. 8, and C are considered acceptable and interchangea

12、ble without preference. 1.2.5 Lead finish. The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or DESC FORM 193A JUl 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- - - SMD-5962-947LO 9999996 0070399 252 1.3 Absolute

13、 maximum ratinqs. L/ Storage temperature range . Voltage from VDD to GND . Voltage form any pin to ground range . Power dissipation 1 W Lead temperature (soldering, 10 seconds) . +3OO0C Thermal resistance, junct ion-to-case (3) See MIL-STD-1835 Junction temperature ( TJ) . 1.4 Operating ambient temp

14、erature range . -55C to +125“C Supply voltage range . 1,5 Digital loqic testinq for device classes Q and V. -65C to +15OoC -0.5 V dc to +7.0 V dc -0.5 V dc to Vcc + 0.5 V dc 150C Recomnended opera t i nq condi t ions. 4.75 V dc 5 VCC S 5.25 V dc Fault coverage measurement of manufacturing logic test

15、s (MIL-STD-883, test method 5012) XX percent 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, bulletin, and handbook. Unless otherwise specified, the following specification. standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of

16、Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein, SPEC i F I CATION MILITARY MIL-1-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS S TAMIAEU MICROCIRCUIT DRAWING MIL I TARY SIZE 5962-94710 A DEFENS

17、E ELECTRONICS SUPPLY CENTER I DESC FORM 193A JUL 94 REVISION LEVEL DAYTON, OHIO 45444 SHEET 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I SMD-5962-94710 = 9999996 0070200 BTLi S TANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAY

18、TON, OHIO 45444 3. REQUIREMENTS 3.1 item requirements. The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compiant non-JAN devices“ and as specified herein. The individual item requiremnts f

19、or device classes Q and V shall be in accordance with MIL-1-38535. the device manufacturers Quality Management (QM) plan, and as specified herein. specified in MIL-STD-883 (see 3.1 herein) for device class M and MIL-1-38535 for device classes Q and V and herein. The case outline(s) shall be in accor

20、dance with 1.2.4 herein. 3.2 Desian, construction. and physical dimensions. The design, construction, and physical dimensions shall be dS 3.2.1 Case outline(s1. 3.2.2 Terminal connections. 3.2.3 Block diaqram. 3.3 Electrical performance characteristics and postirradiation parameter limits. The termi

21、nal connections shall be as specified on figure I. The block diagram shall be as specified on figure 2. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating tempe

22、rature range. SIZE 5962-94710 A REVISION LEVEL SHEET 4 3.4 Electrical test requirements. The electrical test requiremnts shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. I 3.5 Marking. The part shall be marked with the PIN listed in 1.2 her

23、ein. Marking for device class M shall be in accordance with MIL-STD-883 (see 3.1 herein). MIL-BUL-103. Marking for device classes Q and V shall be in accordance with MIL-1-38535. In addition, the manufacturers PIN may also be marked as listed in 3.5.1 Certification/compliance mark. The compliance ma

24、rk for device class M shall be a “C“ as required in MIL-STO-883 (see 3.1 herein). in MIL-1-38535. The certification mark for device classes Q and V shall be a “QML“ or “Q* as required 3.6 Certificate of comliance. For device class M, a certificate of compliance shall be required from a manufacturer

25、in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.7.2 herein). for device classes Q and V, a certificate of compliance shail be required from a QML-38535 listed manufacturer in order to supp1y to the requirements of this drawing (see 6.7.1 herein). The certificate of compli

26、ance submitted to DESC-EC prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device class M, the requirements of MIL-STO-883 (see 3.1 herein), or for device classes Q and V, the requirements of MIL-1-38535 and the requirements her

27、ein, 3.1 herein) or for device classes Q and V in MIL-1-38535 shall be provided with each lot of microcircuits delivered to this drawing. (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-STO-973. retain the option to review the manufacturers fa

28、cility and applicable required docurnentation. shall be made available onshore at the option of the reviewer. 3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STD-883 (see 3.8 Notification of chanqe for device class M. For device class M, notificatio

29、n to DESC-EC of change of product 3.9 Verification and review for device class M. For device class M, DESC, DESCs agent, and the acquiring activity Offshore documentation 3.10 Microcircuit group assianment far device class M. Device class M devices covered by this drawing shall be in microcircuit gr

30、oup number 105 (see MIL-1-38535, appendix A). I DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-94710 9977996 0070201 730 m I I 1 I I l I /0*9Vcc 1 I OD outputs) I IIOH = -100 pA I I I I STANDARD MICROCIRCUIT DRAWING DE

31、FENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 IWcc 5 5.25 V Input current low, Il0 ports I I SIZE 5962-94710 A REVISION LEVEL SHEET 5 l I I l I I I I l I I I I ( I Output off current high, I IOZH /VIN = Vcc three-state data bus I I I 1 Output off current low. I JOZL PIN = 0 1 1.2.3 I I 1 1.2.3

32、in off state: IRQN I l l three-state data bus I l ! i l 1 Open-drain output low current IODL IVIN = O I I I I Open-drain output low current1 IODH /VIN = Vcc l I in off state: IRQN I 1 1.2.3 l i See footnotes at end of table. l I l i o1 I -10 I 1 I i” I i i 1 I l I5 lilA I I o1 i -5 i l I ir*A I l I

33、I l l Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-9Y7LO 999999b 0070202 677 I I I I I 15ee 4.4.lb 17.8 101 I functional testing l I I DESC FORM 193A I 5962-94710 l REVISION LEVEL 1 SHEET 6 STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONIC

34、S SUPPLY CENTER DAYTON, OHIO 45444 JUL 94 SIZE A Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-9471O 9999996 0070203 503 STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962-94710 A REVISION LEVEL SH

35、EET l I high from Write IMR I I (clear of interrupt mask 1 I bit) I I INTRN negated or 1/0 output 1 tIR I 1 9,IO.Il i o1 j 1100 i ns l l I l I l I l I I l I I l l j I l 1 Clock t ining I I 1 IVcc = 4.75 v I I (above 4 MHz: XI/CLK I + 2 active) l I Xl/CLK low/high tim %/ 1 tCLK See figure 4 Xl/CLK io

36、w/high time $/ i tC-K I I I Xl/CLK frequency i/ l CLK I I I 1 Counter/timer clock high tCTC I I ! or low time Counter/t imr clock frequency l I I / tCTC 1 l I I l I RxC high or low time I tRX I I I ns I I I 9,ia,ii I o1 iins/ioo 1 l l I 1 I ns 1 I l I l l I I 9,10,11 I O1 I 56/56 1 9.10.11 I O1 l I

37、2.0 I 8.0 l I MHz 9,10,11 I O1 I O s/ 1 I 8 1 MHz I l l I I I 1 I I I I “s 9,10,1i j O1 I 60 I I l I l I I I I I l ns 1 9,10,11 I O1 I 30 I l I I l l I I kxC frequency (16X) 1 tRX I See footnotes at end of table. 7 DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking perm

38、itted without license from IHS-,-,-SMD-5962-94710 9999996 0070204 44T I I l I l l I l I l l I I IVcc = 4.75 v I 1 I I l I I l I I I I 1 I I 9.10.11 I O1 I O A/ I 16 I MHz TxC frequency (16X) 1 tTX (See figure 4 I 9.10.11 I O1 1 O A/ I 1.0 I MHz TxC frequency (1X) I tTX 1 Transmitter tinting - .- I l

39、 I l l l I I TABLE 1. Electrical performance characteristics - Continued. I I Test I I I l I I l I I SOl I Condi t ions L/ 2/ 1 Group A IDevice 1 Limits 1 Unit I I I I -55C I TA 5 +125“C I subgroups 1 type I I 1 4.75 V I Vcc 1. 5.25 V I I I I I 1 unless otherwise specified I I 1 Min 1 Max 1 1 1 I Tx

40、D output delay from i tTXD See figure 4 TxC low I IVcc = 4.75 v I l l I TXD I TxD output data I TxC output delay from STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 i 9.10.11 i 01 i 1120 j ns I 1 l l I l l I I I I 1 9.10.11 o1 /-20 l l 1 I I (+20 1 ns SIZE 5962-94

41、710 A REVISION LEVEL SHEET 8 l I A(5:O) hold time to RON 12 1 WRN low I I l i i I CEN Set-up time to RDN i3 i WREI low g/ I I I I I I CEN hold time to RON i4 i WRN high 61 I I I l l l 9,10,11 o1 l I I 30 I I ! l I ns I I l 1 I i I I l l l l I 9.10.11 I o1 I o I I ns RDN WRW pulse width low I5 I 1 9,

42、10,11 I o1 1120 i i ns I I l I See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE 1. Electrical performance characteristics - Continued. I I Unit I -55C I TA 5 +125“C I subgroups 1 type 1 I I 4.75 V L Vcc 25.25 V i I

43、 1 I I j unless otherwise specified 1 l i imi ts l I l I I I I I Conditions L/ 21 1 Group A (Device 1 Test I Symbol I 1 Min I Max I I A read cycle follawed by a write cycle without OACKN - Continued. I l 1 I (7:O) data bus floating I 7 j ! ! RDN or CEN high I l I D(7:O) data bus Set-up 18 I time bef

44、ore WRN or CEN I I high l i STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962- 94 710 A REVISION LEVEL SHEET 9 I l 1 I l l I 1 I 9,10,11 I O1 1 I 30 i ns I CEN low I I CEN low I Set-up: A(5:O) valid to 1 1 Hold: A(5:O) vaid after 1 2 Access: Later of CEN lo

45、w 1 3 and RDN low, to Dnn valid (read) I I l Later of CEN low and (RON or I 4 WRN as applicable) low, to I DACKN low I I high, to Dnn released I (read) g/ I Earlier of CEN high or RND i 5 See footnotes at end of table. i ns l 9,10,11 O1 i 50 i l I I i I See figure 4 1 9,10,11 1 o1 wcc = 4.75 v I I i

46、 I I I I 9.10.11 1 o1 I I jI 1 I 9.10.11 I o1 I I l I I 1 1 I ! I Normal operation: I 9.10,11 I o1 See figure 4 I I vcc = 4.75 v I 1 I From power down: i I I See figure 4 vcc = 4.75 v I I 1 9.10.11 1 o1 1 I i I I 10 I I I 30 I I i ns I l l I /I20 I ns l I I I l I l I I150 I A 10 + 2 1127 t 3 1 nc X1

47、 edges 1x1 edges 1 I l o i 30 i ns i l I l Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-94710 9999996 007020b 212 I I 1 45 9.10.11 j o1 1 o iee figure 4 Icc = 4.75 v I I ns I I I i I l I I I l I l I l l l I I I I I 9,10,11 1 O1 1 50 I l n

48、s l I S TANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I 1 I I 5962-94710 SIZE A REVISION LEVEL SHEET 10 I I i l l I I l I I I I I l l I 9.10.11 I o1 1 o I I ns Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SVD-59

49、62-9+710 D 999999b 0070207 I159 STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 Notes : i/ All testing to be performed using worst-case test conditions unless otherwise specified. E/ Ali voltage measurements are referenced to ground(GND1. For testing, all inputs swing b