1、NOTICE OF REVISION (NOR)THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED.1. DATE(YYMMDD)96-03-21Form ApprovedOMB No. 0704-0188Public reporting burden for this collection is estimated to average 2 hours per response, including the time for reviewinginstructions, searching exi
2、sting data sources, gathering and maintaining the data needed, and completing and reviewing thecollection of information. Send comments regarding this burden estimate or any other aspect of this collection of information,including suggestions for reducing this burden, to Department of Defense, Washi
3、ngtion Headquarters Services, Directorate forInformation Operations and Reports, 1215 Jefferson Davis Highway, Suite 1204, Arlington, VA 22202-4302, and to the Office ofManagement and Budget, Paperwork Reduction Project (0704-0188), Washington, DC 20503.PLEASE DO NOT RETURN YOUR COMPLETED FORM TO EI
4、THER OF THESE ADDRESSED. RETURN COMPLETEDFORM TO THE GOVERNMENT ISSUING CONTRACTING OFFICER FOR THE CONTRACT/ PROCURING ACTIVITYNUMBER LISTED IN ITEM 2 OF THIS FORM.2. PROCURINGACTIVITY NO.3. DODAAC4. ORIGINATORb. ADDRESS (Street, City, State, Zip Code)Defense Electronics Supply Center5. CAGE CODE67
5、2686. NOR NO.5962-R084-96a. TYPED NAME (First, Middle Initial,Last)1507 Wilmington PikeDayton, OH 45444-57657. CAGE CODE672688. DOCUMENT NO.5962-947119. TITLE OF DOCUMENTMICROCIRCUIT, LINEAR, QUAD VOLTAGE COMPARATOR, MONOLITHIC SILICON10. REVISION LETTER11. ECP NO.No registered usersa. CURRENT b. NE
6、WA12. CONFIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIESAll13. DESCRIPTION OF REVISIONSheet 1: Revisions ltr column; add “A“.Revisions description column; add “Changes in accordance with NOR 5962-R084-96“.Revisions date column; add “96-03-21“.Revision level block; add “A“.Rev status of sheets; for
7、sheets 1 and 2 add “A“.Sheet 2: 1.2.3 Device class designator: For device classes Q or V delete “Certification and qualification to MIL-I-38535“ and substitute“Certification and qualification to MIL-I-38535 3/“Bottom of page add “3/ For this drawing device classes Q and V shall not apply, see Standa
8、rd Microcircuit Drawing 5962-96738.“Revision level block; add “A“.14. THIS SECTION FOR GOVERNMENT USE ONLYa. (X one)X (1) Existing document supplemented by the NOR may be used in manufacture.(2) Revised document must be received before manufacturer may incorporate this change.(3) Custodian of master
9、 document shall make above revision and furnish revised document.b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENTDESC-ELDSc. TYPED NAME (First, Middle Initial, Last)Michael A. Fryed. TITLEChief, Microelectronics Branche. SIGNATUREMichael A. Fryef. DATE SIGNED(YYMMDD)96-03-2115a. ACTIVITY ACCO
10、MPLISHING REVISIONDESC-ELDSb. REVISION COMPLETED (Signature)Rajesh Pithadiac. DATE SIGNED(YYMMDD)96-03-21DD Form 1695, APR 92 Previous editions are obsolete.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPR
11、OVEDREVSHEETREVSHEETREV STATUS REVOF SHEETS SHEET 1 2 34567891011213PMIC N/A PREPARED BY RICK C. OFFICERDEFENSE ELECTRONICS SUPPLY CENTERSTANDARDMICROCIRCUITDRAWINGCHECKED BYMICHAEL A. FRYEDAYTON, OHIO 45444THIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYMICHAEL A. FRYEMICROCIRCUIT, LIN
12、EAR, QUAD VOLTAGECOMPARATOR, MONOLITHIC SILICONAND AGENCIES OF THEDEPARTMENT OF DEFENSEDRAWING APPROVAL DATE94-06-24AMSC N/AREVISION LEVEL SIZEACAGE CODE672685962-94711SHEET1 OF 13DESC FORM 193JUL 91 5962-E311-97DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provide
13、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-94711DEFENSE ELECTONICS SUPPLY CENTERDAYTON, OHIO 45444REVISION LEVEL SHEET2DESC FORM 193AJUL 911. SCOPE1.1 Scope. This drawing forms a part of a one part - one part numbe
14、r documentation system (see 6.6 herein). This drawingdescribes device requirements for product assurance classes consisting of traditional military high reliability (device classes Qand M), traditional space application (device class V), and non-traditional (device class N). A choice of case outline
15、s and leadfinishes is available and are reflected in the Part or Identifying Number (PIN). Device classes M, N, Q, and V product assurancelevels are reflected in 1.2.3 herein. When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in thePIN.1.2 PIN. The PIN is as shown in
16、 the following example:5962 - 94711 01 N X XG0DG0D G0DG0D G0DG0DG0DG0D G0DG0D G0DG0DG0D G0D G0D G0D G0D G0D Federal RHA Device Device Case Lead stock class designator type class outline finishdesignator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3)/ Drawing number1.2.1 RHA
17、 designator. Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels andshall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535specified RHA levels and shall be marked with the appropriate RHA desi
18、gnator. A dash (-) indicates a non-RHA device.1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows:Device type Generic number Temperature range Circuit function01 LM139A -55(C to +125(C Quad voltage comparator02 LM139A -40(C to +85(C Quad voltage comparator1.2.3 De
19、vice class designator. The device class designator shall be a single letter identifying the product assurance levelas follows:Device class Device requirements documentationM Vendor self-certification to the requirements for non-JAN class Bmicrocircuits in accordance with 1.2.1 of MIL-STD-883 1/N Cer
20、tification and qualification to MIL-I-38535 with a non-traditionalperformance environment 2/Q or V Certification and qualification to MIL-I-385351.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleX
21、Plastic package - see figure 1 14 Dual-in-line1/ For this drawing device class M shall not apply, see Standardized Military Drawing 5962-87739.2/ Any device outside the traditional performance environment (i.e. an operating temperature range of -55(C to +125(Cand which requires hermetic packaging).P
22、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-94711DEFENSE ELECTONICS SUPPLY CENTERDAYTON, OHIO 45444REVISION LEVEL SHEET3DESC FORM 193AJUL 911.2.5 Lead finish. The lead finish shall be as specified in MIL-STD-8
23、83 (see 3.1 herein) for class M or MIL-I-38535 for classesQ and V. Finish letter “X“ shall not be marked on the microcircuit or its packaging. The “X“ designation is for use inspecifications when lead finishes A and B are considered acceptable and interchangeable without preference. For device class
24、N, lead finish shall be in accordance with 1.2.5.1 herein.1.2.5.1 Lead finish D. Lead finish D shall be designated by a single letter as folllows:Finish letter ProcessD Palladium1.3 Absolute maximum ratings. 3/Operating supply voltage 36 V dc 0r 18 V dcInput voltage range. -0.3 V dc to 36 V dcInput
25、current (VIN -0.3 V) 50 mAMaximum power dissipation . 900 mW 4/Sink current 20 mA approximatelyLead temperature (soldering 10 seconds) 300(CJunction temperature (TJ). +150(CStorage temperature range. -65(C to +150(CThermal resistance, junction-to-case ( JC):Case X 50(C/W1.4 Recommended operating con
26、ditions.Operating supply voltage 5 V dc to 30 V dcAmbient operating temperature range (TA):Device type 01 -55(C to +125(CDevice type 02 -40(C to +85(C2. APPLICABLE DOCUMENTS2.1 Government specification, standards, bulletin, and handbook. Unless otherwise specified, the following specification,standa
27、rds, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications andStandards specified in the solicitation, form a part of this drawing to the extent specified herein.SPECIFICATIONMILITARYMIL-I-38535 - Integrated Circuits, Manufacturing, General Spe
28、cification for.STANDARDSMILITARYMIL-STD-883 - Test Methods and Procedures for Microelectronics.MIL-STD-973 - Configuration Management.MIL-STD-1835 - Microcircuit Case Outlines.BULLETINMILITARYMIL-BUL-103 - List of Standardized Military Drawings (SMDs).3/ Stresses above the absolute maximum rating ma
29、y cause permanent damage to the device. Extended operation at themaximum levels may degrade performance and affect reliability.4/ Derate above 100(C ambient, 10 mW/(C.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA59
30、62-94711DEFENSE ELECTONICS SUPPLY CENTERDAYTON, OHIO 45444REVISION LEVEL SHEET4DESC FORM 193AJUL 91HANDBOOKMILITARYMIL-HDBK-780 - Standardized Military Drawings.(Copies of the specification, standards, bulletin, and handbook required by manufacturers in connection with specificacquisition functions
31、should be obtained from the contracting activity or as directed by the contracting activity.)2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text ofthis drawing shall take precedence.3. REQUIREMENTS3.1 Item requirements. The i
32、ndividual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883,“Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specifiedherein. The individual item requirements for device classes N, Q, and V shall be in accordance with MI
33、L-I-38535, the devicemanufacturers Quality Management (QM) plan, and as specified herein. For this drawing, device class M, shall not apply, seeStandardized Military Drawing 5962-87739.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as sp
34、ecifiedin MIL-STD-883 (see 3.1 herein) for device class M and MIL-I-38535 for device classes N, Q, and V and herein.3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
35、3.2.3 Logic diagram(s). The logic diagram(s) shall be as specified on figure 3.3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, theelectrical performance characteristics and postirradiation parameter limits are as specified in table
36、I and shall apply over the fullambient operating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are defined in table I.3.5 Marking. The part shall be marked with the PIN listed i
37、n 1.2 herein. Marking for device class M shall be in accordancewith MIL-STD-883 (see 3.1 herein). In addition, the manufacturers PIN may also be marked as listed in MIL-BUL-103.Marking for device classes N, Q, and V shall be in accordance with MIL-I-38535.3.5.1 Certification/compliance mark. The com
38、pliance mark for device class M shall be a “C“ as required in MIL-STD-883 (see3.1 herein). The certification mark for device classes N, Q, and V shall be a “QML“ or “Q“ as required in MIL-I-38535.3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a
39、manufacturer in order tobe listed as an approved source of supply in MIL-BUL-103 (see 6.7.2 herein). For device classes N, Q, and V, a certificate ofcompliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see6.7.1 herein). The certifi
40、cate of compliance submitted to DESC-EC prior to listing as an approved source of supply for thisdrawing shall affirm that the manufacturers product meets, for device class M, the requirements of MIL-STD-883 (see 3.1herein), or for device classes N, Q, and V, the requirements of MIL-I-38535 and the
41、requirements herein.3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STD-883 (see 3.1 herein)or for device classes N, Q, and V in MIL-I-38535 shall be provided with each lot of microcircuits delivered to this drawing.3.8 Notification of change for de
42、vice class M. For device class M, notification to DESC-EC of change of product (see 6.2herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMIC
43、ROCIRCUIT DRAWINGSIZEA5962-94711DEFENSE ELECTONICS SUPPLY CENTERDAYTON, OHIO 45444REVISION LEVEL SHEET5DESC FORM 193AJUL 91TABLE I. Electrical performance characteristics.Test SymbolConditions01 = -55qC TA +125qC02 = -40qC TA +85qCGroup AsubgroupsDevicetypeLimits Unitunless otherwise specified Min M
44、axInput offset voltage VIO RS = 0 :, VO = 1.4 V, 1 All -2.0 +2.0 mVV+ = 5 V dc to 30 V dc 2,3 -4.0 +4.0Input offset current IIO +INPUT - -INPUT withOUTPUT in the linear1 All -25 +25 nArange 2,3 -100 +100Input bias current IIB +INPUT - -INPUT withOUTPUT in the linear1 All -100 -1 nArange 2,3 -300 -3I
45、nput common-modevoltage rangeVICR V+ = 5 V to 30 V 1,2,3 All 0 V+ -2.0VVoltage gain AV RL t 15 k:, V+ = 15 V 4 All 50 V/mV5,6 25Output sink current ISK V-IN = 1 V, V+IN 0 V,VO t 1.5 V, TA = +25qC1 All 6 mASaturation voltage VSAT V-IN = 1 V, V+IN 0 V, 1 All 400 mVISK d 4 mA 2,3 700Output leakage curr
46、ent IOL V-IN t 1 V dc, VO = 30 V, 1 All 0.5 PAV-IN = 0 V 2,3 1.0Supply current ICC RL = f, V+ = 5 V to 30 V 1,2,3 All 3 mAInput voltage commonmode rejection ratioCMRR RL t 15 k:, V+ = 30 V,VCM = 0 V to 28 V1,2,3 All 70 dBPower supply rejectionratioPSRR V+ = 5 V to 30 V 2/ 1,2,3 All 70 dBSee footnote
47、s at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-94711DEFENSE ELECTONICS SUPPLY CENTERDAYTON, OHIO 45444REVISION LEVEL SHEET6DESC FORM 193AJUL 91TABLE I. Electrical performance characteristics -
48、Continued.Test SymbolConditions01 = -55qC TA +125qC02 = -40qC TA +85qCGroup AsubgroupsDevicetypeLimits Unitunless otherwise specified Min MaxResponse time tRLH VRL = 5 V, RL = 5.1 k:,100 mV input step,TA = +25qC9 All 5 PstRLH 5 mV overdrive,TA = +25qC2.51/ The algebraic convention, whereby the most negative value is a minimum and the most positive is maximum,is used in this table. Negative current shall be defined as conventional current flow out of a device terminal.2/ If not
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