DLA SMD-5962-94726 REV B-2009 MICROCIRCUIT LINEAR JFET PRECISION DUAL OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make change to the large signal differential voltage amplification test subgroup 3 limits as specified under Table I. Changes in accordance with N.O.R. 5962-R005-95. - ro 94-10-14 M. A. FRYE B Update boilerplate paragraphs to current MIL-PRF-3853

2、5 requirements. Redrawn. - ro 09-12-15 C. SAFFLE REV SHET REV SHET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING I

3、S AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH R. PITHADIA APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, JFET, PRECISION, DUAL OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-07-18 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 6

4、7268 5962-94726 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E070-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94726 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FO

5、RM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (

6、PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 94726 01 Q P A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see

7、1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified

8、RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 TL052A JFET, precision, dual, operational amplifier 1.2.3 Device cla

9、ss designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-3

10、8535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chi

11、p carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94726

12、DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Positive supply voltage (+VCC) . +18 V 2/ Negative supply voltage (-VCC) -18 V 2/ Differential input voltage (VDIN) 30 V 3/ Input voltage range (VIN) (any input) 1

13、5 V 2/ 4/ Input current (IIN) (each input) 1 mA Output current (IOUT) (each input) 80 mA Total current into +VCCterminal . 160 mA Total current into -VCCterminal 160 mA Duration of short circuit current at or below +25C . Unlimited 5/ Continuous total power dissipation (PD): Case P . 1050 mW (TA +25

14、C) Case 2 . 1375 mW (TA +25C) Storage temperature range . -65C to +150C Lead temperature 1.6 mm (1/16 inch) from case for 60 seconds (case P) . +300C Case temperature for 60 seconds (case 2) . +260C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Su

15、pply voltage range (VCC) 5 V to 15 V Common mode input voltage (VIC): VCC= 5 V -1 V to +4 V VCC= 15 V -11 V to +11 V Operating free air temperature (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks

16、 form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEF

17、ENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect

18、 reliability. 2/ All voltage values, except differential voltages, are with respect to the midpoint between +VSand VS. 3/ Differential voltages are at the positive input with respect to the negative input. 4/ The magnitude of the input voltage must never exceed the magnitude of the supply voltage or

19、 15 V, whichever is less. 5/ The output may be shorted to either supply. Temperature and/or supply voltages must be limited to ensure that the maximum dissipation rating is not exceeded. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROC

20、IRCUIT DRAWING SIZE A 5962-94726 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents ar

21、e available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

22、 of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535

23、 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A

24、 for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.

25、2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical pe

26、rformance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each

27、 subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not m

28、arking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/complianc

29、e mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall

30、 be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein).

31、 The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535,

32、appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for de

33、vice class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

34、MICROCIRCUIT DRAWING SIZE A 5962-94726 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C Group A subgroups Device type Limits 1/ Unit unless otherwise specified

35、Min Max Input offset voltage VIOVCC= 5 V, VIO= 0 V, 1 01 2.8 mV VIC= 0 V, RS= 50 2,3 5.8 VCC= 15 V, VIO= 0 V, 1 0.8 VIC= 0 V, RS= 50 2,3 3.8 Input offset current IIOVCC= 5 V, VOUT= 0 V, 1 01 100 pA VIC= 0 V 2 20 nA VCC= 15 V, VOUT= 0 V, 1 100 pA VIC= 0 V 2 20 nA Input bias current IIBVCC= 5 V, VOUT=

36、 0 V, 1 01 200 pA VIC= 0 V 2 50 nA VCC= 15 V, VOUT= 0 V, 1 200 pA VIC= 0 V 2 50 nA Maximum positive peak output voltage swing +VOMVCC= 5 V, RL= 10 k 1,2,3 01 3 V VCC= 15 V, RL= 10 k 13 VCC= 5 V, RL= 2 k 2.5 VCC= 15 V, RL= 2 k 11.5 Maximum negative peak output voltage swing -VOMVCC= 5 V, RL= 10 k 1,2

37、,3 01 -2.5 V VCC= 15 V, RL= 10 k -12 VCC= 5 V, RL= 2 k -2.3 VCC= 15 V, RL= 2 k -11 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94726 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,

38、 OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA+125C Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Large signal differential 2/ AVDVCC= 5 V, RL= 2 k 1 01 25 V/m

39、V voltage amplification 2 10 3 20VCC= 15 V, RL= 2 k 1 50 2 153 40Common mode rejection ratio CMRR VCC= 5 V, VOUT= 0 V, VIC= -1 V to 4 V, RS= 50 1,2,3 01 65 dB VCC= 15 V, VOUT= 0 V, VIC= -1 V to 4 V, RS= 50 75 Supply voltage rejection ratio ( VCC/ VIO) kSVRVCC= 5 V, VIO= 0 V, RS= 50 1,2,3 01 75 dB VC

40、C= 15 V, VIO= 0 V, RS= 50 75 Supply current ICCVCC= 5 V, VOUT= 0 V, 1 01 5.6 mA (four amplifiers) no load 2,3 6.4 VCC= 15 V, VOUT= 0 V, 1 5.6 no load 2,3 6.4Positive slew rate at 3/ unity gain +SR VCC= 15 V, RL= 2 k, CL= 100 pF, TA= +25C 4 01 9 V/s Negative slew rate at 3/ unity gain -SR VCC= 15 V,

41、RL= 2 k, CL= 100 pF, TA= +25C 4 01 9 V/s 1/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 2/ At VCC= 5 V, VOUT= 2.3 V and at VC

42、C= 15 V, VOUT= 10 V. 3/ At VCC= 5 V, VIPP= 1 V and at VCC= 15 V, VIPP= 5 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94726 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEE

43、T 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines P 2 Terminal number Terminal symbol 1 OUTPUT 1 NC 2 -INPUT 1 OUTPUT 1 3 +INPUT 1 NC 4 -VCCNC 5 +INPUT 2 -INPUT 1 6 -INPUT 2 NC 7 OUTPUT 2 +INPUT 1 8 +VCCNC 9 - NC 10 - -VCC11 - NC 12 - +INPUT 2 13 - NC 14 - NC 15 - -INPUT 216 - NC 17 - OUTPUT 2

44、18 - NC 19 - NC 20 - +VCCNC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94726 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEE

45、T 8 DSCC FORM 2234 APR 97 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the opti

46、on of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A). 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedu

47、res shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with M

48、IL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device