ImageVerifierCode 换一换
格式:PDF , 页数:21 ,大小:138.40KB ,
资源ID:700605      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-700605.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(DLA SMD-5962-95518 REV C-2010 MICROCIRCUIT DIGITAL CMOS ARINC 429 MULTICHANNEL RECEIVER TRANSMITTER MONOLITHIC SILICON.pdf)为本站会员(outsidejudge265)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-95518 REV C-2010 MICROCIRCUIT DIGITAL CMOS ARINC 429 MULTICHANNEL RECEIVER TRANSMITTER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate to MIL-PRF-38535 requirements. - CFS 06-10-18 Thomas M. Hess B Add new IOL (DTACK Output Sink Current) test requirement to table I. - CFS 08-02-26 Thomas M. Hess C Add new device. Update boilerplate paragraphs to current requir

2、ements of MIL-PRF-38535. - MAA 10-11-24 Thomas M. Hess REV SHET REV C C C C C C SHEET 15 16 17 18 19 20 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED Larry T. Gauder DLA LAND AND MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas

3、M. Hess COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, CMOS, ARINC 429 MULTICHANNEL RECEIVER/TRANSMITTER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95

4、-10-04 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-95518 SHEET 1 OF 20 DSCC FORM 2233 APR 97 5962-E095-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95518 DLA LAND AND MARITIME COLUMBUS, OHIO 4

5、3218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are ref

6、lected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 95518 01 M X X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2

7、)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices mee

8、t the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 68C429A CMOS Arinc 429 mul

9、tichannel receiver/transmitter 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class lev

10、el B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X CMGA15-P84 84 Pin grid

11、array Y CQCC1-G132 132 Gull wing lead chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR

12、D MICROCIRCUIT DRAWING SIZE A 5962-95518 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range, referenced to ground (VCC) -0.3 V dc to +7.0 V dc Input voltage range (VIN) . -0.3 V dc to +7.0 V dc Storage

13、temperature range . -55C to +150C Maximum power dissipation (PD) 400 mW Lead temperature (soldering, 10 seconds) +270C Maximum operating junction temperature (TJ) +170C Thermal resistance, junction-to-case (JC): Case outline X . 2C/W Case outline Y . 3C/W Thermal resistance, junction-to-ambient (JA)

14、: Case outline X . 28C/W Case outline Y . 27C/W 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V dc minimum to 5.5 V dc maximum High level input voltage range (VIH) . 2.25 V to 5.8 V Low level input voltage range (VIL) -0.3 V to +0.8 V Case operating temperature range (TC) -5

15、5C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation

16、or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE

17、 HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia,

18、PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained

19、. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT

20、 DRAWING SIZE A 5962-95518 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modifie

21、d in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and

22、 as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines s

23、hall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Block diagrams. The block diagrams shall be as specified on figure 2. 3.2.4 Timing waveforms. The timing waveforms shall be as specified on figure 3. 3.3 Electrical

24、performance characteristics and post-irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requi

25、rements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where ma

26、rking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-3

27、8535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MI

28、L-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be r

29、equired from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product mee

30、ts, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in

31、MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is requi

32、red for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore do

33、cumentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 100 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or

34、networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95518 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. See footnotes at end of table. Test Symbol Conditions 1/ -

35、55C TC +125C, 4.5 V VCC 5.5 V unless otherwise specified Group A subgroupsDevice types Limits Unit Min Max High level input voltage VIH1, 2, 3 All 2.25 VCC+ 0.3 V Low level input voltage VIL1, 2, 3 All -0.5 0.8 V High level output voltage VOH(except IRQRX, IRQTX : open drain outputs) 1, 2, 3 All 2.7

36、 V Low level output voltage VOL1, 2, 3 All 0.5 V Output source current (except IRQRX, IRQTX : open drain outputs) IOHVOUT= 2.7 V 1, 2, 3 All -8 mA Output sink current IOLVOUT= 0.5 V (except DTACK) 1, 2, 3 All 8 mA VOUT= 0.5 V (DTACK) 6 Input leakage current ILIVIN= 0 to VCC1, 2, 3 All 20 A Dynamic s

37、upply current ICCTCASE= Tmin, 2/ VCC= 5.5 V 1, 2, 3 All 65 mA Input capacitance CINSee 4.4.1.c 4 All 10 pF Hi-Z output capacitance COUTSee 4.4.1.c 4 All 20 pF Functional test See 4.4.1.b VCC= 4.5V, 5.5 V 7, 8 All Clock period tCYCSVCC= 4.5V and 5.5 V 9, 10, 11 All 50 2000 ns Clock pulse width tCLS,

38、tCHSVCC= 4.5V and 5.5 V 9, 10, 11 All 20 ns Rise and fall times tCRS, tCFSVCC= 4.5V and 5.5 V 9, 10, 11 All 5 ns Cycle time tCYCAVCC= 4.5V and 5.5 V 9, 10, 11 All 200 8000 ns Clock pulse width tCLS, tCHAVCC= 4.5V and 5.5 V 9, 10, 11 All 240 ns Rise and fall times tCRA, tCFAVCC= 4.5V and 5.5 V 9, 10,

39、 11 All 5 ns Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95518 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristic

40、s - Continued. See footnotes at end of table. Test Symbol Conditions 1/ -55C TC +125C, 4.5 V VCC 5.5 V unless otherwise specified Group A subgroupsDevice types Limits Unit Min Max Address valid to CS low 1 See figure 3. 9, 10, 11 All 0 ns R/W valid to CS low 2 See figure 3. 9, 10, 11 All 0 ns Data i

41、n valid to LDS/UDS low 3 See figure 3. 9, 10, 11 All 0 ns CS, LDS/UDS, IACKxx valid to CLK-SYS low 4 See figure 3. 9, 10, 11 All 5 ns CLK-SYS low to DTACK low 5 See figure 3. 9, 10, 11 All 45 ns CLK-SYS low to data out valid 6 See figure 3. 9, 10, 11 All 50 ns DTACK low to data out valid 7 3/ See fi

42、gure 3. 9, 10, 11 All 10 ns CS or LDS/UDS or IACKxx high to DTACK high 8 3/ See figure 3. 9, 10, 11 All 35 ns CS or LDS/UDS or IACKxx high to DTACK hi-z 9 3/ See figure 3. 9, 10, 11 All 50 ns CS or LDS/UDS or IACKxx high to data out hi-z 10 3/ See figure 3. 9, 10, 11 All 25 ns IEIxx or IACKxx low to

43、 IEOxx low 11 See figure 3. 9, 10, 11 All 35 ns IACKxx high to IEOxx high 12 See figure 3. 9, 10, 11 All 40 ns IEIxx low to DTACK low 13 See figure 3. 9, 10, 11 All 40 ns IEIxx low to data out valid 14 See figure 3. 9, 10, 11 All 45 ns CS, IACKxx, LDS/UDS inactive time 15 See figure 3. 9, 10, 11 All

44、 15 ns DTACK low to CS or LDS/UDS or IACKxx high 16 3/ See figure 3. 9, 10, 11 All 0 ns Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95518 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C S

45、HEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. 1/ All testing performed using worst-case test conditions unless otherwise specified. 2/ IDDis measured with all I/O pins at 0 V, all input pins at 0 V except CLK-SYS and CLK-ARINC which run at tCYCminimum. 3/

46、Guaranteed, but not tested. Test Symbol Conditions 1/ -55C TC +125C, 4.5 V VCC 5.5 V unless otherwise specified Group A subgroupsDevice types Limits Unit Min Max CS or LDS/UDS high to address hold time 17 3/ See figure 3. 9, 10, 11 All 0 ns CS or LDS/UDS high to R/W invalid 18 3/ See figure 3. 9, 10

47、, 11 All 0 ns DTACK low to data in hold time 19 3/ See figure 3. 9, 10, 11 All 0 ns CS or LDS/UDS or IACKxx high data out hold time 20 3/ See figure 3. 9, 10, 11 All 0 ns Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S

48、IZE A 5962-95518 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 Device type: 01 Case outline: X Terminal number Terminal symbol Terminal number Terminal symbol Terminal number Terminal symbol A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 B1 B2 B3 B4 B5 B6 B7 B8 B9 B10 B11 C1 C2 C5 C6 C7 C9 C10 C11 GND VCCTX1H TX2H TX3L TX2L RX1L RX3H RX4H RX4L VCCD1 VCCGND TX1L TX3H RX1H RX2H RX3L GND GND RX5L D2 D0 VCCGND RX2L NC RX5H RX6H D1 D2 D10 D11 E1 E2 E3 E9 E10 E11 F1 F2 F3 F9 F10 F11 G1 G2 G3 G9 G10 G11 H1 H2 H10 H11 J1 J

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1