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本文(DLA SMD-5962-95554 REV B-2013 MICROCIRCUIT LINEAR PRECISION QUAD OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf)为本站会员(arrownail386)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-95554 REV B-2013 MICROCIRCUIT LINEAR PRECISION QUAD OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Replaced reference to MIL-STD-973 with reference to MIL-PRF-38535. Drawing updated to reflect current requirements. gt 04-04-14 R. MONNIN B Update drawing to current MIL-PRF-38535 requirements. jt Remove class M references. -jt 13-09-05 C. SAFFLE

2、 REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY RAJESH PITHADIA DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTM

3、ENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY MICHAEL FRYE MICROCIRCUIT, LINEAR, PRECISION QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-12-28 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-95554 SHEET 1 OF 12 DSCC FORM 2233 AP

4、R 97 5962-E554-13 Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95554 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents three product assurance class levels consisting of space appli

5、cation (device class V), high reliability (device class Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA)

6、 levels is reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment. 1.2 PIN. The PIN is as shown in the following example: 5962 - 95554 01 N X D Federal stock class designator RHA designator (see 1.2.1) Device type (see

7、 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes N, Q, and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a n

8、on-RHA device. 1.2.2 Device type. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 TLC27L9M precision quad operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance le

9、vel as follows: Device class Device requirements documentation N Certification and qualification to MIL-PRF-38535 with a nontraditional performance environment (encapsulated in plastic) Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline. The case outline are as designated in

10、MIL-STD-1835, and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 14 Plastic small-outline package carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes N, Q, and V. 1.2.5.1 Lead finish D. Lead finish D shall be design

11、ated by a single letter as follows: Finish letter Process D Palladium Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95554 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.6 Device class N manufacturer PIN. For Device cla

12、ss N, plastic encapsulated microcircuits (PEMS) the following manufacturer PIN (see 3.5.1 herein) shall be marked: Standard microcircuit drawing PIN 1/ Manufacturer PIN 5962-9555401NXD 27L9M 1.3 Absolute maximum ratings. 2/ Supply voltage (VDD) 3/ +18 V dc Differential input voltage (VID) 4/ VDDInpu

13、t voltage range (VI) . -0.3 V dc to VDDInput current (II) . 5 mA Output current (IO) (each output) . 30 mA Total current into VDDterminal +45 mA Total current out of ground terminal +45 mA Duration of short-circuit current (TA 25C) 5/ Unlimited Continuous total power dissipation (PD) 6/ 950 mW Stora

14、ge temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +260C 1.4 Recommended operating conditions. Supply voltage (VDD) +4 V dc min to +16 V dc max Common mode input voltage (VIC) VDD= 5 V . 0 V dc min to 3.5 V dc max VDD= 10 V . 0 V dc min to 8.5 V dc max Operating free-air

15、 temperature (TA) . -55C min to +125C max 1/ The SMD PIN is provided for cross reference information, see 3.5.1 herein. 2/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 3/

16、All voltage values except differential voltages are with respect to network ground. 4/ Differential voltages are at the non-inverting input terminal with respect to the inverting input terminal. 5/ The output may be shorted to either supply. Temperature and/or supply voltages must be limited to ensu

17、re that the maximum dissipation rating is not exceeded. 6/ Above +25C, derate at a factor of 7.6 mW/C. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95554 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUME

18、NTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFEN

19、SE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List

20、of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In

21、the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The

22、 individual item requirements for device classes N, Q, and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2

23、 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes N, Q, and V. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections.

24、The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply

25、over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein.

26、In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be mark

27、ed. Marking for device classes N, Q, and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes N, Q, and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. Provided by IHSNot for ResaleNo reproduction or networking permitted

28、without license from IHSSTANDARD MICROCIRCUIT DRAWING SIZE A 5962-95554 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. For device classes N, Q, and V, a certificate of compliance shall be required from a QML-38535 listed

29、manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets the requirements of MIL-PRF

30、-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes N, Q, and V in MIL-PRF-38535. 4. VERIFICATION 4.1 Sampling and inspection. For device classes N, Q, and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as

31、 modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. For device classes N, Q, and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devic

32、es prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for device classes N, Q, and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-

33、38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inp

34、uts, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein. c. Additional screening for device class V beyond the requirements of device cl

35、ass Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes N, Q, and V. Qualification inspection for device classes N, Q, and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein f

36、or groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes N, Q, and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. 4.4.1 Group A inspection. a. Test

37、s shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Additional criteria for de

38、vice classes N, Q, and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the d

39、evice manufacturers TRB, in accordance with MIL-PRF-38535, and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-

40、STD-883. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95554 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specifie

41、d Group A subgroups Device type Limits 2/ Unit Min Max Input offset voltage VIOVDD= 5 V, VOUT= 1.4 V, VIC= 0 V, RS= 50 , 1 All 900 V RL= 1 M 2,3 3750 VDD= 10 V, VOUT= 1.4 V, VIC= 0 V, 1 1200 RS= 50 , RL= 1 M 2,3 4300 Input offset current IIOVDD= 5 V, VOUT= 2.5 V, VIC= 2.5 V 2 All 15 nA VDD= 10 V, VO

42、UT= 5 V, VIC= 5 V 2 15 Input bias current IIBVDD= 5 V, VOUT= 2.5 V, VIC= 2.5 V 2 All 35 nA VDD= 10 V, VOUT= 5 V, VIC= 5 V 2 35 Common-mode input voltage range (also VICRVDD= 5 V 1 All 0 to 4 V applies to each input individually) 2,3 0 to 3.5 VDD= 10 V 1 0 to 9 2,3 0 to 8.5 High-level output voltage

43、VOHVDD= 5 V, VID= 100 mV, 1 All 3.2 V RL= 1 M 2,3 3.0 VDD= 10 V, 1 8.0 VID= 100 mV, RL= 1 M 2,3 7.8 See footnotes at end of table. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95554 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234

44、 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Low-level output voltage VOLVDD= 5 V, VID= -100 mV, IOL= 0 1,2,3 All 50 mV VDD= 10 V, VID= -100 mV, IOL= 0 Large-

45、signal differential AVDVDD= 5 V, RL= 1 M, 1 All 50 V/mV voltage amplification VOUT= 0.25 V to 2 V 2,3 25 VDD= 10 V, RL= 1 M, 1 50 VOUT= 1 V to 6 V 2,3 25 Common-mode rejection CMRR VDD= 5 V, 1 All 65 dB ratio VICR= VICRmin 2,3 60 VDD= 10 V, 1 65 VICR= VICRmin 2,3 60 Supply-voltage rejection kSVRVDD=

46、 5 V to 10 V, 1 All 70 dB ratio (VDD/ VIO) VOUT = 1.4 V 2,3 60 Supply current (four IDDVDD= 5 V, 1 All 68 A amplifiers) VOUT= 2.5 V, 2 48 VIC= 2.5 V, no load 3 120 VDD= 10 V, 1 92 VOUT= 5 V, 2 60 VIC= 5 V, no load 3 192 1/ Group A subgroup 3 (TA= -55C) test limits are guaranteed but not tested. 2/ T

47、he algebraic convention, whereby the most negative value is a minimum and the most positive a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. Provided by IHSNot for ResaleNo reproduction or networking permitted without license

48、from IHSSTANDARD MICROCIRCUIT DRAWING SIZE A 5962-95554 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 CASE X FIGURE 1. Case outline. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95554 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 CASE X Symbol Dimensions Min Max Note A 1.35 1.75 A1 0.10 0.21 b 0.36 0.51 8 c 0.19 0.25 D 8.55 8.75 2 E 5.80 6.20 E1 3.80 4.00 3 e 1.27 BSC

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