DLA SMD-5962-95596 REV C-2013 MICROCIRCUIT LINEAR SINGLE SUPPLY LOW POWER TRIPLE VIDEO AMPLIFIER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. - ro 02-03-18 R. MONNIN B Make corrections to the supply current disabled minimum test limits. - ro 06-12-20 R. MONNIN C Update drawing to current MIL-PRF-38535 requirements. -jt 13-09-16 C. SAFFLE

2、 REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGEN

3、CIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY MICHAEL FRYE MICROCIRCUIT, LINEAR, SINGLE SUPPLY, LOW POWER TRIPLE VIDEO AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 95-10-25 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-95596 SHEET 1 OF 10 DSCC FORM 2233 APR

4、97 5962-E555-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95596 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents

5、two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assuran

6、ce (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 95596 01 M 2 A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing num

7、ber 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA design

8、ator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 AD813 Single supply, low power, triple video amplifier 1.2.3 Device class designator. The device class designator is a single lette

9、r identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to M

10、IL-PRF-38535 1.2.4 Case outline. The case outline are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V

11、 or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95596 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absol

12、ute maximum ratings. 1/ Supply voltage (VS) 18 V Input common mode voltage range (VIN) . VSInternal power dissipation (PD) . 1.3 W 2/ Lead temperature range (soldering, 60 seconds) . +300C Storage temperature range . -65C to +150C Thermal resistance, junction to case (JC) . See MIL-STD-1835 Thermal

13、resistance, junction to ambient (JA) 95C/W 1.4 Recommended operating conditions. Supply voltage (VS) . 0 V, 5 V, 15 V Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and h

14、andbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMEN

15、T OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these docume

16、nts are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this

17、 drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade perfo

18、rmance and affect reliability. 2/ Derate at 9 mW/C for TA +32C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95596 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 AP

19、R 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, f

20、it, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensio

21、ns shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on fig

22、ure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.

23、4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked

24、. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in ac

25、cordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be

26、a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate o

27、f compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the man

28、ufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or

29、for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to

30、this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required docume

31、ntation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A). Provided by IHSNot for Resale

32、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95596 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C un

33、less otherwise specified Group A subgroups Device type Limits Unit Min Max Offset voltage VOSVS= +5 V, 0 V 1,2,3 01 -10 10 mV VS= -5 V, +5 V -10 10 VS= -15 V, +15 V -25 25 Supply current enabled ISVS= +5 V, 0 V 1,2,3 01 5.1 15 mA VS= -15 V, +15 V 6.5 27 Supply current 1/ disabled IsdVS= +5 V, 0 V 1,

34、2,3 01 0.4 3 mA VS= -15 V, +15 V 0.8 3.5 Input bias current -IIBVS= +5 V, 0 V 1,2,3 01 -120 120 A VS= -5 V, +5 V -100 100 VS= -15 V, +15 V -100 100 +IIBVS= +5 V, 0 V -60 60 VS= -5 V, +5 V -40 40 VS= -15 V, +15 V -120 120 Output voltage swing -VOVS= +5 V, 0 V, RL= 150 1,2,3 01 0.68 1.20 V VS= -5 V, +

35、5 V, RL= 150 -4.00 -3.30 VS= -15 V, +15 V, RL= 1 k -14.30 -13.20 Output voltage swing +VOVS= +5 V, 0 V, RL= 150 1,2,3 01 3.60 4.21 V VS= -5 V, +5 V, RL= 150 3.30 3.92 VS= -15 V, +15 V, RL= 1 k 13.2 14.1 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitt

36、ed without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95596 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Gr

37、oup A subgroups Device type Limits Unit Min Max Common mode rejection ratio, VOSCMRR VS= +5 V, 0 V 1,2,3 01 -4000 4000 V/V VS= -5 V, +5 V -2500 2500 VS= -15 V, +15 V -2500 2500 Common mode rejection ratio, -IIBIBRR VS= +5 V, 0 V 1,2,3 01 -20 20 A/V VS= -5 V, +5 V -20 20 VS= -15 V, +15 V -20 20 Power

38、 supply rejection ratio, VOSPSRR VS= +5 V, 0 V, VS= -15 V, +15 V 1,2,3 01 -1000 1000 V/V Power supply rejection ratio, -IIBIBSR VS= +5 V, 0 V, VS= -15 V, +15 V 1,2,3 01 -10 10 A/V Transresistance XRESVS= +5 V, 0 V, RL= 1 k 1,2,3 01 20 A/V VS= -5 V, +5 V, RL= 1 k 20 VS= -15 V, +15 V, RL= 1 k 20 Gain

39、K VS= +5 V, 0 V, RL= 1 k 1,2,3 01 1100 V/V VS= -5 V, +5 V, RL= 1 k 1300 VS= -15 V, +15 V, RL= 1 k 500 1/ Disable mode operation. Pulling the voltage on any one of the DISABLE pins 4 volts down from the positive supply will put the corresponding amplifier into a disabled, powered down state. In this

40、condition the amplifiers quiescent supply current drops, its output becomes a high impedance, and there is a high level of isolation from input to output. Leaving the DISABLE pins disconnected (floating) will leave the corresponding amplifier operational, in the enabled state. Provided by IHSNot for

41、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95596 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline 2 Terminal number Terminal symbol 1 NC 2 DISABLE 1 (S

42、ee note 1) 3 DISABLE 2 (See note 1) 4 DISABLE 3 (See note 1) 5 NC 6 +VS7 NC 8 +INPUT 1 9 -INPUT 1 10 OUTPUT 1 11 NC 12 OUTPUT 3 13 -INPUT 3 14 +INPUT 3 15 NC 16 -VS17 NC 18 +INPUT 2 19 -INPUT 2 20 OUTPUT 2 NC = No connection NOTE: 1. Disable mode operation. Pulling the voltage on any one of the DISA

43、BLE pins 4 volts down from the positive supply will put the corresponding amplifier into a disabled, powered down state. In this condition the amplifiers quiescent supply current drops, its output becomes a high impedance, and there is a high level of isolation from input to output. Leaving the DISA

44、BLE pins disconnected (floating) will leave the corresponding amplifier operational, in the enabled state. FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95596 DLA LAND AND MA

45、RITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) pla

46、n. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-3

47、8535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for

48、 device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in ta