1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R128-96. 95-05-22 K. A. Cottongim B Changes in table I, VTLOAD, conditions, limits and note 7. 98-09-11 K. A. Cottongim C Correct paragraphs 4.2.a.2 and 4.3.3.b.2. Editorial changes throughout. 05-03-14 Raymond
2、 Monnin D Table I, input current test, second test condition, keep subgroups 1 and 3 with a max limit of 35 mA and change subgroup 2 to a max limit of 45 mA. Table I, note 5, correct VIHfrom 4.5 minimum to 4 V minimum and 5 V maximum. 06-11-16 Raymond Monnin REV SHEET REV SHEET REV STATUS REV D D D
3、D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS A
4、PPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, +5 AND 15 VOLT, TRIPLE CHANNEL, DC/DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95-11-17 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-95602 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E099-07Provided
5、by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95602 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product ass
6、urance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall
7、be as shown in the following example: 5962 - 95602 01 H X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. R
8、HA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MHF+28
9、515T/883, MHF+28515TF/883 DC-DC converter, 15 W, +5 V and 15 V outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qu
10、alification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level
11、is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flo
12、w, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the de
13、vice acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may ha
14、ve a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 9 Dual-in-line Z See figure 1 9 Flange mount Provided by IHSNot for ResaleNo reproduction or netwo
15、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95602 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings
16、. 1/ Input voltage range -0.5 V dc to +80 V dc Power dissipation (PD) . 12 W Output power . 15.2 W Lead soldering temperature (10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range +16 V dc to +48 V dc Output currents: +5 V (main). +1500
17、mA 15 V (dual) 250 mA Output power 2/ . 15 W Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless o
18、therwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Int
19、erface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps
20、.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this do
21、cument, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate outpu
22、t power linearly above case temperature (TC) +125C to 0 at +135C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95602 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC F
23、ORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacture
24、rs Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modif
25、ication in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case ou
26、tline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table
27、I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall
28、be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein sha
29、ll maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be m
30、aintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of complian
31、ce (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to
32、this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described he
33、rein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and s
34、hall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TCas specified in the approved manufactu
35、rers QM plan. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license
36、from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95602 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TC +125C VIN= 28 V dc 2 percent no external sync, C
37、L= 0 unless otherwise specified Group A subgroups Device type Min Max Unit 1 +4.95 +5.05 IOUT= +1.5 A dc, (main) 2,3 +4.85 +5.15 1 14.55 15.45 Output voltage 1/ VOUTIOUT= 250 mA dc, (dual) 2,3 01 14.40 15.60 V dc VIN= 16 V dc, 28 V dc, and to 48 V dc (main) 0.0 1500 Output current 1/ 2/ 3/ IOUTVIN=
38、16 V dc, 28 V dc, and to 48 V dc (dual) 1,2,3 01 0.0 250 mA 1 60 B.W. = 10 kHz to 2 MHz (main) 2,3 90 mV p-p 1 112 Output ripple voltage 1/ VRIPB.W. = 10 kHz to 2 MHz (dual) 2,3 01 225 mV p-p VIN= 16 V dc to 48 V dc, IOUT= 1.5 A (main) 75 Line regulation 1/ VRLINEVIN= 16 V dc to 48 V dc, IOUT= 250 m
39、A (dual) 1,2,3 01 300 mV IOUT= 0 to 1.5 A, (main) 75 Load regulation 1/ VRLOADIOUT= 0 to 250 mA, (dual) 1,2,3 01 300 mV IOUT= 0, inhibit (pin 1) = 0 1,2,3 5 1,3 35 Input current IINIOUT= 0, inhibit (pin 1) = open 2 01 45 mA Input ripple IRIPIOUT= 1.5 A, (main), IOUT= 250 mA, (dual), B.W. = 10 kHz to
40、 10 MHz 1,2,3 01 50 mA p-p 1 74 Efficiency Eff IOUT= 1.5 A, (main), IOUT= 250 mA, (dual) 2, 3 01 72 % Isolation ISO Input to output or any pin to case (except pin 6) at 500 V dc, TC= +25C 1 01 100 M Power dissipation, load fault PDShort circuit, all outputs 1,2,3 01 12 W Switching frequency 4/ FSIOU
41、T= 1.5 A (main), IOUT= 250 mA (dual) 4,5,6 01 375 500 kHz See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95602 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION
42、 LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TC +125C VIN= 28 V dc 2 percent no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Min Max Unit External sync range 5/ FSYNCIOUT= 1.5 A
43、 (main), TTL level to pin 7 IOUT= 250 mA (dual) 4,5,6 01 400 600 kHz 50 percent load to/from 100 percent load, (main), IOUT= 125 mA (dual) 4,5,6 -850 +850 Output response to step transient load changes 1/ 6/ 7/ VTLOAD50 percent load to/from 100 percent load, (dual), IOUT= 1.0 A (main) 4,5,6 01 -950
44、+950 mV pk 50 percent load to/from 100 percent load, (main) 4,5,6 8 ms Recovery time, step transient load changes 1/ 6/ 7/ 8/ TTLOAD50 percent load to/from 100 percent load, (dual) 4,5,6 01 3 ms Output response to transient step line changes 9/ 10/ VTLINEInput step 16 from/to 48 V dc, IOUT= 1.5 A (m
45、ain), IOUT= 250 mA (dual) TC= +25C 4 01 800 mV pk Recovery time, transient step line changes 8/ 9/ 10/ TTLINEInput step 16 from/to 48 V dc, IOUT= 1.5 A (main), IOUT= 250 mA (dual) TC= +25C 4 01 5 ms Turn-on overshoot 1/ 10/ VtonOSIOUT = 1.5 A (main), IOUT = 250 mA (dual) 4,5,6 01 500 mV pk Turn-on d
46、elay 1/ 8/ 11/ TonDIOUT = 1.5 A (main), IOUT = 250 mA (dual) 4,5,6 01 25 ms Load fault recovery 10/ TrLFIOUT = 1.5 A (main), IOUT = 250 mA (dual) 4,5,6 01 25 ms 1/ Tested at each output. 2/ Parameter guaranteed by line and load regulation tests. 3/ The sum of both dual output currents shall not exce
47、ed 500 mA. Up to 80 percent total auxiliary power (400 mA) may be taken from either side. 4/ When Sync input (pin 7) is not used it must be electrically isolated (not connected) to any circuit. 5/ A TTL level waveform (VIH= 4 V minimum and 5 V maximum, VIL= 0.8 V maximum) with a 50 percent 1 percent
48、 duty cycle applied to the sync input pin (pin 7) within the sync range frequency shall cause the converters switching frequency to become synchronous with the frequency applied to the sync input pin (pin 7). 6/ Negative output parameter shall be tested as part of device characterization and after design or process changes. Thereafter parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 7/ Load step transition time is 10 microse
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