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本文(DLA SMD-5962-95606 REV B-2013 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS OCTAL TRANSCEIVER LINE DRIVER WITH 25 O SERIES RESISTOR AND THREESTATE OUTPUTS TTL COMPATIBLE INPUTS MONOLI.pdf)为本站会员(priceawful190)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-95606 REV B-2013 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS OCTAL TRANSCEIVER LINE DRIVER WITH 25 O SERIES RESISTOR AND THREESTATE OUTPUTS TTL COMPATIBLE INPUTS MONOLI.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate to current requirements as specified in MIL-PRF-38535. jak 07-06-11 Thomas M. Hess B Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 13-05-16 Thomas M. Hess REV SHEET REV B B B B SHEET 15 16 1

2、7 18 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS A

3、ND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thanh V. Nguyen APPROVED BY Thomas M. Hess MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL TRANSCEIVER/LINE DRIVER WITH 25 SERIES RESISTOR AND THREE- STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 95-07-

4、12 REVISION LEVEL B SIZE A CAGE CODE 67268 5962-95606 SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E416-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REV

5、ISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or

6、 Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 95606 01 Q R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class design

7、ator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device typ

8、e(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABT2245 Octal transceiver/line driver with 25 series resistor and three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single lett

9、er identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals P

10、ackage style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-T20 20 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. Provided by IHSNot for ResaleNo reproduction or networking permitted

11、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (I/O ports) (

12、VIN) -0.5 V dc to +5.5 V dc 4/ DC input voltage range (except I/O ports) (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to +5.5 V dc 4/ DC output current (IOL) (per output): A port +96 mA B port +30 mA DC input clamp current (IIK) (VIN= 0.0 V) -18 mA DC output clamp current

13、 (IOK) (VOUT= 0.0 V) -50 mA Storage temperature range (TSTG) -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C Maximum power dissipation (PD) . 500 mW 1.4 Recommended operating conditions. 2/ 3/

14、 Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Input voltage range (VIN) . +0.0 V dc to VCCOutput voltage range (VOUT) +0.0 V dc to VCCMaximum low level input voltage (VIL ) +0.8 V Minimum high level input voltage (VIH ) . +2.0 V Maximum high level output current (IOH) -24 mA Maximum low level

15、 output current (IOL): A port +48 mA B port +12 mA Maximum input rise or fall rate (t/V) 5 ns/V Case operating temperature range (TC) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance

16、 and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. Unused inputs must be held high or low. 4/ The input negative voltage ra

17、tings may be exceeded provided that the input clamp-current ratings are observed. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4

18、 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the so

19、licitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMEN

20、T OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA

21、 19111-5094). 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.

22、3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, o

23、r function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Te

24、rminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms

25、and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electric

26、al performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-

27、95606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part s

28、hall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using t

29、his option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate of complian

30、ce. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of

31、supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of

32、 microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electric

33、al performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOHFor all inputs affecting output under test, VIN= 2.0 V or 0.8 V A por

34、t IOH= -3 mA 4.5 V 1, 2, 3 2.5 V 5.0 V 1, 2, 3 3.0 A port IOH= -24 mA 4.5 V 1, 2, 3 2.0 B port IOH= -1 mA 4.5 V 1 3.35 2, 3 3.3 5.0 V 1 3.85 2, 3 3.80 B port IOH= -3 mA 4.5 V 2, 3 3.0 B port IOH= -12 mA 1 2.6 Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= 2.0 V or

35、0.8 V A port IOL= +48 mA 4.5 V 1, 2, 3 0.55 B port IOL= +8 mA 1 0.65 2, 3 0.8 B port IOL= +12 mA 1 0.8 Negative input clamp voltage 3022 VIC-For input under test, IIN= -18 mA 4.5 V 1, 2, 3 -1.2 V Input current high 3010 IIH4/ For input under test, VIN= VCCControl inputs 0.0 V 1, 2, 3 +1.0 A 5.5 V +1

36、.0 A or B ports 2.1 V 1, 2, 3 +20.0 5.5 V +20.0 Input current low 3009 IIL4/ For input under test, VIN= GND Control inputs 0.0 V 1, 2, 3 -1.0 A 5.5 V -1.0 A or B ports 2.1 V 1, 2, 3 -20.0 5.5 V -20.0 Output current 3011 IO5/ VOUT= 2.5 V A port 5.5 V 1, 2, 3 -25 -100 mA B port -50 -180 Three-state ou

37、tput leakage current high 3021 IOZH6/ For control input affecting output under test, VIN= 2.0 V or 0.8 V VOUT= 2.7 V 2.1 V 1, 2, 3 10.0 A 5.5 V 1, 2, 3 10.0 Three-state output leakage current low 3020 IOZL6/ For control input affecting output under test, VIN= 2.0 V or 0.8 V VOUT= 0.5 V 2.1 V 1, 2, 3

38、 -10.0 A 5.5 V 1, 2, 3 -10.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97

39、 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Power-up output leakage current IOZPU7/ VOUT= 0.5 V to 2.7 V OE = Dont care

40、 0.0 V to 2.1 V 1, 2, 3 50.0 A Three-state output leakage current IOZPD7/ 2.1 V to 0.0 V 1, 2, 3 50.0 A Off-state leakage current IOFFFor input or output under test, VINor VOUT= 4.5 V All other pins at 0.0 V 0.0 V 1 100 A High-state leakage current ICEXFor output under test, VOUT= 5.5 V Outputs at h

41、igh logic state 5.5 V 1, 2, 3 50 A Quiescent supply current delta, TTL input level ICC8/ For input under test, VIN= 3.4 V For all other inputs, VIN= VCCor GND Data inputs, outputs enabled 5.5 V 1, 2, 3 1.5 mA Data inputs, outputs disabled 5.5 V 1, 2, 3 50 A Control inputs 5.5 V 1, 2, 3 1.5 mA Quiesc

42、ent supply current, output high 3005 ICCHFor all inputs, VIN= VCCor GND IOUT= 0 A 5.5 V 1, 2, 3 250 A Quiescent supply current, outputs low 3005 ICCLFor all inputs, VIN= VCCor GND IOUT= 0 A 5.5 V 1, 2, 3 32 mA Quiescent supply current, outputs disabled 3005 ICCZFor all inputs, VIN= VCCor GND IOUT= 0

43、 A 5.5 V 1, 2, 3 250 A Input capacitance 3012 CINTC= +25C See 4.4.1b VIN= 2.5 V or 0.5 V 5.0 V 4 11 pF I/O capacitance 3012 CI/OTC= +25C See 4.4.1b VOUT= 2.5 V or 0.5 V 5.0 V 4 16 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from

44、 IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5

45、.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Low level ground bounce noise VOLP9/ VIH= 3.0 V VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 5.0 V 4 1200 mV VOLV9/ 5.0 V 4 -1800 mV High level VCCbounce noise VOHP9/ 5.0 V 4 2000 mV VOHV9/ 5.0 V 4 -350 mV Functional tests 30

46、14 10/ VIL= 0.8 V, VIH= 2.0 V Verify output VOSee 4.4.1c 4.5 V 7, 8 L H 5.5 V 7, 8 L H Propagation delay time, An to Bn 3003 tPLH111/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.0 3.4 ns 4.5 V and 5.5 V 10, 11 1.0 4.0 tPHL111/ 5.0 V 9 1.0 4.2 4.5 V and 5.5 V 10, 11 1.0 4.6 Propagation delay tim

47、e, Bn to An 3003 tPLH211/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.0 3.2 ns 4.5 V and 5.5 V 10, 11 1.0 3.8 tPHL211/ 5.0 V 9 1.0 3.6 4.5 V and 5.5 V 10, 11 1.0 4.2 Propagation delay time, output enable, OE to An 3003 tPZH111/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 1.0 4.6 ns 4.5 V and

48、 5.5 V 10, 11 1.0 5.6 tPZL111/ 5.0 V 9 1.0 4.7 4.5 V and 5.5 V 10, 11 1.0 6.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V

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