DLA SMD-5962-95623 REV B-2001 MICROCIRCUIT LINEAR ANALOG MULTIPLEXER MONOLITHIC SILICON《类似体多路器硅单片电路线型微电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R173-97. 97-01-14 R. MONNIN B Drawing updated to reflect current requirements. -rrp 01-10-15 R. MONNIN REV SHET REV SHET REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13

2、14 PMIC N/A PREPARED BY Sandra Rooney DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Sandra Rooney COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, ANALOG MULTIPLEXER, MONOLITHI

3、C SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-06-10 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-95623 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E033-02 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for Resa

4、leNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels

5、 consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in

6、 the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 95623 01 Q X X Federal stock class designator RHA designator (see 1.2.1) Devicetype (see 1.2.2) Device class designator Caseoutline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device

7、classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-

8、RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 DG406A 16-channel analog multiplexer 02 DG407A Dual 8-channel analog multiplexer 1.2.3 Device class designator. The device class designator is a single letter

9、 identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MI

10、L-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDIP1-T28 or CDIP2-T28 28 Dual-in-line 3 CQCC1-N28 28 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specifi

11、ed in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 R

12、EVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ V+ . 44 V GND 25 V Digital inputs (VS, VD) 2/ . (V-) 2 V to (V+) + 2 V or 20 mA, whichever occurs first Current (Any terminal, except S or D) . 30 mA Continuous current, S or D 20 mA Peak current, S or D (Pulsed at 1 ms,

13、10% duty cycle max) . 40 mA Storage temperature . -65C to +150C Power dissipation (PD) 3/ : Case outline X . 1200 mW Case outline 3 1350 mW 1.4 Recommended operating conditions. Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards,

14、and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and sup

15、plement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case

16、 Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins

17、Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a s

18、pecific exemption has been obtained. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Signals on the SX, DX, or INXexceeding V+ or V- will be clamped by internal diodes.

19、 3/ For case outline X, derate 16 mW/C above +75C. For case outline 3, derate 13.5 mW/C above +75C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-50

20、00 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modifica

21、tion in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions.

22、 The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections.

23、 The terminal connections shall be as specified on figure 1. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and

24、postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in tabl

25、e I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not mark

26、ing the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance m

27、ark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be

28、 required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). Th

29、e certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, app

30、endix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for devic

31、e class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the a

32、cquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing

33、shall be in microcircuit group number 82 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 5

34、 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C VAL= 0.8 V, VAH= 2.4 V V+ = +15 V, V- = -15 V unless otherwise specified Group A subgroups Device type Limits 1/ Unit Min Max 1,3 90 Drain-source ON resistance 2/ rDS(ON)VD- = 10 V, IS= -10 m

35、A 2 All 120 Matching between channels 3/ rDS(ON)VD = 10 V, -10 V 1 All 15 1 -0.5 0.5 Source OFF leakage current IS(OFF)VEN= 0 V, VS= 10 V, VD= + 10 V 2,3 All -50 50 nA 1 -2 2 Drain OFF leakage current ID(OFF)VEN= 0 V, VS= + 10 V VD= 10 V, 2,3 All -100 100 nA 1 -2 2 Channel ON leakage current ID+ IS(

36、ON)VD= VS= 10 V 2,3 All 200 200 nA Address input current high IAHVA= 2.4 V, 15 V 1,2,3 All -10 10 A Address input current low IALVEN= 0 V, 2.4 V, VA= 0 V 1,2,3 All -10 10 A Positive supply current I+ VEN= 2.4 V, VA= 0 V 1,2,3 All -10 500 A 1 -0.1 30 Positive standby current ISTANDBYVEN= 0 V, VA= 0 V

37、, 5.0 V 2,3 All -0.1 75 A Negative supply current I- VEN= 2.4 V, VA= 0 V 1,2,3 All -500 1 A Negative standby current -ISTANDBYVEN= 0 V, VA= 0 V, 5.0 V 1 All -5 1 A ON state input capacitance CS(ON)See 4.4.1d 4 All 400 pF OFF state capacitance CS(OFF)See 4.4.1d 4 All 20 pF OFF state output capacitanc

38、e CD(OFF)See 4.4.1d 4 All 200 pF Logic input capacitance CASee 4.4.1d 4 All 15 pF OFF isolation VISOSee 4.4.1e, TA= +25C 12 All 50 dB Crosstalk VCTSee 4.4.1e, TA= +25C 12 All 50 dB Charge transfer error VCTESee 4.4.1e, CL= 10 nF, TA= +25C 12 All 10 mV See footnotes at end of table. Provided by IHSNo

39、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Sym

40、bol Conditions -55C TA +125C VAL= 0.8 V, VAH= 2.4 V V+ = +15 V, V- = -15 V unless otherwise specified Group A subgroups Device type Limits 1/ Unit Min Max 9,11 200 Enable turn ON time tON(EN)See figure 3 10 All 400 ns 9,11 150 Enable turn OFF time tOFF(EN)See figure 3 10 All 300 ns 9,11 350 Transiti

41、on time tTRANSSee figure 3 10 All 500 ns Break-before-make interval tOPENSee figure 3, TA= +25C 13 All 10 ns 1/ The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data. 2/ Sequence each switch ON. 3/ rDS(ON)= rDS(ON)MAX rDS(ON)MIN 4

42、. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit

43、, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualificatio

44、n and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1)

45、 Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applica

46、ble, in accordance with the intent specified in test method 1015. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table IIA herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT

47、 DRAWING SIZE A 5962-95623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outline X, 3 X, 3 Device type 01 02 Terminal number Terminal symbol 1 V+ V+ 2 NC Db 3 NC 4 S16S8b5 S15 7b6 S14S6b7 S13 5b8 S12S4b9 S11 3b10 S10S2b11 S9 1b12 GND GND

48、 13 NC NC 14 A3NC 15 A2A216 A1 117 A0A018 EN EN 19 S1S1a20 S2 2a21 S3S3a22 S4 4a23 S5S5a24 S6 6a25 S7S7a26 S8 8a27 V- V- 28 D DaFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95623 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type 01 A3A2A1A0ENON Switch X X X X 0 None 0 0 0 0 1 1 0 0 0 1 1 2 0 0 1 0 1 3 0 0 1 1 1 4 0 1 0 0 1 5 0 1 0 1 1 6 0 1 1 0 1 7 0 1 1 1 1 8 1 0 0 0 1