DLA SMD-5962-95633 REV B-2012 MICROCIRCUIT LINEAR DUAL PERIPHERAL OR DRIVER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate to reflect current requirements. - rrp 01-07-20 R. Monnin B Redrawn. Paragraphs updated to the current MIL-PRF-385355 requirements. -drw 12-10-25 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B OF SHEET

2、S SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Sandra Rooney DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Sandra Rooney APPR

3、OVED BY Michael A. Frye MICROCIRCUIT, LINEAR, DUAL PERIPHERAL OR DRIVER, MONOLITHIC SILICON DRAWING APPROVAL DATE 96-03-21 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-95633 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E028-13 Provided by IHSNot for ResaleNo reproduction or networking permitted

4、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95633 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q)

5、 and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following e

6、xample: 5962 - 95633 01 Q P A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-385

7、35 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 55453B Dual peripheral OR driver 1.2.3 Device class designa

8、tor. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline

9、letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. Provided by IHSNot for ResaleNo reproduction or networking permitted

10、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95633 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) 2/ 7 V dc Input voltage 5.5 V dc Interemitter voltage 3/ 5.5 V dc Off-sta

11、te output voltage . 30 V dc Continuous collector or output current 4/ . 400 mA Peak collector or output current: 4/ (tW 10 ms, duty cycle 50%) . 500 mA Continuous total power dissipation (PD): 5/ Case outline P 1050 mW Case outline 2 1375 mW Storage temperature range -65C to +150C Case temperature f

12、or 60 seconds: Case outline 2 +260C Lead temperature (soldering, 60 seconds): Case outline P +300C 1.4 Recommended operating conditions. Supply voltage range (VCC) 4.5 V dc to 5.5 V dc High level input voltage (VIN) . 2 V dc Low level input voltage (VIL) . 0.8 V dc Ambient operating temperature rang

13、e (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the soli

14、citation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT

15、OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelp

16、hia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obt

17、ained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Voltage values are with respect to the network ground terminal unless otherwise specified. 3/ This is the volta

18、ge between two emitters of a multiple-emitter transistor. 4/ Both halves of these dual circuits may conduct rated current simultaneously; however, power dissipation averaged over a short time interval must fall within the continuous dissipation rating. 5/ Above TA= +25C; for case outline P, derate 8

19、.4 mW/C and for case outline 2, derate 11 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95633 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREM

20、ENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function

21、as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal conn

22、ections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics an

23、d postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in tab

24、le I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the de

25、vice. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535

26、. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to list

27、ing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall

28、 be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95633 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM

29、2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input clamp voltage VIKVCC= 4.5 V, II= -12 mA 1, 2, 3 01 -1.5 V High level output current IOHVCC= 4.5 V, VIH= 2 V, VOH= 30 V

30、1, 2, 3 01 300 A Low level output voltage VOLVCC= 4.5 V, VIL= 0.8 V, IOL= 100 mA 1, 2, 3 01 0.5 V VCC= 4.5 V, VIL= 0.8 V, IOL= 300 mA 0.8 Input current at maximum input voltage IIVCC= 5.5 V, VI= 5.5 V 1, 2, 3 01 1 mA High level input current IIHVCC= 5.5 V, VI= 2.4 V 1, 2, 3 01 40 A Low level input c

31、urrent IILVCC= 5.5 V, VI= 0.4 V 1, 2, 3 01 -1.6 mA Supply current, outputs high ICCHVCC= 5.5 V, VI= 5 V 1, 2, 3 01 11 mA Supply current, outputs low ICCLVCC= 5.5 V, VI= 0 V 1, 2, 3 01 68 mA Propagation delay time, low-to-high level output tPLHIO= 200 mA, CL= 15 pF, RL= 50, See figure 3, VCC= 5.0 V 9

32、 01 25 ns Propagation delay time, high-to-low level output tPHL9 01 25 ns Transition time, low-to-high level output tTLH9 01 8 ns Transition time, high-to-low level output tTHL9 01 12 ns Functional test FT See 4.4.1b 7, 8 01 Provided by IHSNot for ResaleNo reproduction or networking permitted withou

33、t license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95633 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Case outline P 2 Device type 01 Terminal number Terminal symbol 1 1A NC 2 1B 1A 3 1Y NC 4 GND NC 5 2Y 1B 6 2A NC 7 2B 1Y 8 VCCNC 9 - -

34、 - NC 10 - - - GND 11 - - - NC 12 - - - 2Y 13 - - - NC 14 - - - NC 15 - - - 2A 16 - - - NC 17 - - - 2B 18 - - - NC 19 - - - NC 20 - - - VCCFIGURE 1. Terminal connections. A B Y L L L (ON STATE) L H H (OFF STATE) H L H (OFF STATE) H H H (OFF STATE) FIGURE 2. Truth table. Provided by IHSNot for Resale

35、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95633 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 NOTES: 1. The pulse generator has the following characteristics: PRR 1 MHz, ZO= 50 2. CL

36、includes probe and jig capacitance. FIGURE 3. Test circuit and timing waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95633 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8

37、DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the fo

38、rm, fit, or function as described herein. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for device classes Q and V. a. The b

39、urn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturers Technology Re

40、view Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883.

41、b. Interim and final electrical test parameters shall be as specified in table II herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification in

42、spection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classe

43、s Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. 4.4.1 Group A inspection. a. Tests shall be as specified in table II herein. b. For device classes Q and V, subgroups 7 and 8 shall include verifying the functionality of the d

44、evice. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95633 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. Test require

45、ments Subgroups (in accordance with MIL-STD-883, method 5005, table I) Subgroups (in accordance with MIL-PRF-38535, table III) Device class M Device class Q Device class V Interim electrical parameters (see 4.2) - - - - - - - - - Final electrical parameters (see 4.2) 1, 2, 3, 7, 8, 9 1/ 1, 2, 3, 7,

46、8, 9 1/ 1, 2, 3, 7, 8, 9 2/ Group A test requirements (see 4.4) 1, 2, 3, 7, 8, 9 1, 2, 3, 7, 8, 9 1, 2, 3, 7, 8, 9 Group C end-point electrical parameters (see 4.4) 1, 2, 3 1, 2, 3 1, 2, 3 Group D end-point electrical parameters (see 4.4) 1, 2, 3 1, 2, 3 1, 2, 3 Group E end-point electrical paramete

47、rs (see 4.4) - - - - - - - - - 1/ PDA applies to subgroup 1. 2/ PDA applies to subgroups 1 and 7. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Additional criteria for device classes Q and V. The steady-state life t

48、est duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturers TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in acc