DLA SMD-5962-95642 REV D-2010 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3 VOLT OCTAL BUS TRANSCEIVER WITH BUS HOLD THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change the VCCvoltage levels for ground bounce tests. - CS 97-04-24 Monica L. Poelking B Change the device name to reflect the bus hold feature, and adjust limits to characterize the performance of the optimized die. Editorial changes throughout.

2、 - CS 98-04-24 Monica L. Poelking C Make changes to DC output voltage range in section 1.3. Correct footnotes 7/ and 9/ in table I. Change subgroups for device class V, Group C in table II. Add table III, delta limits. Update boiler plate to MIL-PRF-38535 requirements. Editorial changes throughout.

3、jak 03-08-22 Thomas M. Hess D Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 10-03-25 Thomas M. Hess REV SHET REV D D D SHEET 15 16 17 REV STATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DEFE

4、NSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR C

5、MOS, 3.3 VOLT OCTAL BUS TRANSCEIVER WITH BUS HOLD, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 95-10-10 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-95642 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E221-10 Provided by IHSNot for ResaleNo reproduction o

6、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95642 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high

7、 reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. T

8、he PIN is as shown in the following example: 5962 - 95642 01 V R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA m

9、arked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Dev

10、ice type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LVTH245A 3.3-volt octal bus transceiver with bus hold, three-state outputs, and TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single lett

11、er identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to

12、MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square chip carrier 1.2.5 Lead finish

13、. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95642 DEFENSE SUPPLY CENTER COLUM

14、BUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +4.6 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT): High state . -0.5 V dc to VCC+ 0.5 V dc 4/ High

15、-impedance or power-off state -0.5 V dc to +7.0 V dc 4/ DC output clamp current (IOK) (VOUTVCC. 6/ Power dissipation values are derived using the formula PD= VCCICC+ nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein, and n represents the total numbe

16、r of outputs. 7/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95642 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION L

17、EVEL D SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those c

18、ited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outli

19、nes. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, B

20、uilding 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific e

21、xemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan sh

22、all not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construct

23、ion, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections

24、shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The block or logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specifi

25、ed on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and p

26、ostirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95642 DEFENSE SUPPLY CENTER COLUMBUS

27、 COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN

28、 listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designa

29、tor shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as

30、 required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirem

31、ents of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved

32、source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance

33、as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see

34、6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable require

35、d documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A). Provided by IHSNot f

36、or ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95642 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883

37、test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Negative input clamp voltage 3022 VIKFor input under test, IIN= -18 mA All 2.7 V 1,2,3 -1.2 V High level output voltage 3006 VOH1For all inputs

38、affecting output under test, VIH= 2.0 V, VIL= 0.8 V IOH= -100 A All 2.7 V and 3.6 V 1,2,3 VCC-0.2 V VOH2For all inputs affecting output under test, VIH= 2.0 V, VIL= 0.8 V IOH= -8 mA All 2.7 V 1,2,3 2.4 VOH3For all inputs affecting output under test, VIH= 2.0 V, VIL= 0.8 V IOH= -24 mA All 3.0 V 1,2,3

39、 2.0 Low level output voltage 3007 VOL1For all inputs affecting output under test, VIH= 2.0 V, VIL= 0.8 V IOL= +100 A All 2.7 V 1,2,3 0.2 V VOL2For all inputs affecting output under test, VIH= 2.0 V, VIL= 0.8 V IOL= +24 mA All 2.7 V 1,2,3 0.5 VOL3For all inputs affecting output under test, VIH= 2.0

40、V, VIL= 0.8 V IOL= +16 mA All 3.0 V 1,2,3 0.4 VOL4For all inputs affecting output under test, VIH= 2.0 V, VIL= 0.8 V IOL= +32 mA All 3.0 V 1,2,3 0.5 VOL5For all inputs affecting output under test, VIH= 2.0 V, VIL= 0.8 V IOL= +48 mA All 3.0 V 1,2,3 0.55 Input current high 3010 IIH4/ Control pins For

41、input under test, VIN= 5.5 V All 0.0 V and 3.6 V 1,2,3 10.0 A Control pins For input under test, VIN= VCCAll 3.6 V 1,2,3 1.0 A or B ports For input under test, VIN= 5.5 V Unused pins at VCCor GND All 3.6 V 1,2,3 100.0 A or B ports For input under test, VIN= VCCUnused pins at VCCor GND All 3.6 V 1,2,

42、3 5.0 Input current low 3009 IIL4/ Control pins For input under test, VIN= GND All 3.6 V 1,2,3 -1.0 A A or B ports For input under test, VIN= 0.0 V Unused pins at VCCor GND All 3.6 V 1,2,3 -10.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted witho

43、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95642 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -

44、55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ UnitMin Max Input bus hold current IHOLDA or B ports VIN= 0.8 V All 3.0 V 1,2,3 75 A A or B ports VIN= 2.0 V -75 Three-state output leakage current high 3021 IOZH5/ 6/ VOUT= 3.0 V All 3.6 V 1,2,3 1.0

45、 A Three-state output leakage current low 3020 IOZL5/ 6/ VOUT= 0.5 V All 3.6 V 1,2,3 -1.0 A Three-state output current, power-up IOZPU5/ 6/ VOUT= 0.5 V to 3.0 V OE = Dont care All 0.0 V to 1.5 V 1,2,3 100.0 A Three-state output current, power-down IOZPD5/ 6/ VOUT= 0.5 V to 3.0 V OE = Dont care All 1

46、.5 V to 0.0 V 1,2,3 100.0 A Quiescent supply current 3005 ICCOutputs high For all inputs, VIN= VCCor GND IOUT= 0.0 A All 3.6 V 1,2,3 0.39 mA Outputs low For all inputs, VIN= VCCor GND IOUT= 0.0 A 14.0 Outputs disabled For all inputs, VIN= VCCor GND IOUT= 0.0 A 0.39 Quiescent supply current delta, TT

47、L input levels 3005 ICC7/ For input under test VIN= VCC - 0.6 V For all other inputs VIN= VCCor GND All 3.0 V and 3.6 V 1,2,3 0.3 mA Low level ground bounce noise VOLP8/ VIH= 2.7 V, VIL= 0.0 V TA= +25 C See figure 4 See 4.4.1d All 3.5 V 4 900 mV VOLV8/ All 3.5 V 4 -1000 High level VCCbounce noise VO

48、HP8/ All 3.5 V 4 1200 VOHV8/ All 3.5 V 4 -1400 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95642 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits