DLA SMD-5962-96697 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 1-LINE TO 8-LINE CLOCK DRIVER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《单片硅TTL兼容输入1线到8线时钟驱动器 改进的双极CMOS数字微电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate to the current requirements of MIL-PRF-38535. - jak 08-08-11 Thomas M. Hess REV SHET REV A A SHET 15 16 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Thanh

2、V. Nguyen STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-01

3、-26 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 1-LINE TO 8-LINE CLOCK DRIVER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-96697 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E476-08 Provided by IHSNot for ResaleNo reproduction or networking permitted

4、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96697 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device c

5、lasses Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in

6、the following example: 5962 - 96697 01 Q X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet th

7、e MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The devi

8、ce type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54CBT16209 18-bit bus-exchange switch with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance le

9、vel as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). Th

10、e case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F48 48 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q, and V or MIL-PRF-38535, appendix A for device class M.

11、Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96697 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply volt

12、age range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to +7.0 V dc 4/ Continuous channel current +128 mA DC input clamp current (IIK) (VI 0.0 V) -50 mA Maximum power dissipation (PD) . 590 mW 5/ Storage temperature range (TSTG) -65C to +150C Lead temperature (soldering, 1

13、0 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH ) . 2.0 V Maximum low level input voltage (VIL ) 0.8 V Case operating temperature range (T

14、C) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified

15、herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input clamp current rating are observed. 5/ PD= VCCx ICC+ n(IIH)2ronWhere: n = 18 IIN= 64 mA ron= 8.0 VCC= 5.5 V ICC= 3.

16、0 A VCCis as specified in 1.4 above; ICC, IIN, and ronare as specified in table I herein; and n is the total number of outputs. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96697 DEFENSE SUPPLY CENTER COLU

17、MBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified,

18、the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface

19、 Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Do

20、cument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable

21、laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM)

22、plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and ph

23、ysical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Termina

24、l connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and t

25、est circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical pe

26、rformance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each su

27、bgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96697 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The pa

28、rt shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product usi

29、ng this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q a

30、nd V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in

31、order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA p

32、rior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance

33、. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSC

34、C-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers

35、facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 128 (see MIL-PRF-38535, ap

36、pendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96697 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charact

37、eristics. Test and MIL-STD-883 test method 1/ Symbol VCCGroup A subgroups Limits 3/ Unit Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Min Max Negative input clamp voltage 3022 VIC- For input under test, IIN= -18 mA 4.5 V 1, 2, 3 -1.2 V 0.0 V 10.0 Input current high 3

38、010 IIHFor input under test, VIN= 5.5 V 5.5 V 1, 2, 3 1.0 A Input current low 3009 IILFor input under test VIN= GND 5.5 V 1, 2, 3 -1.0 A Quiescent supply current 3005 ICCFor all other inputs, VIN= VCCor GND IOUT= 0.0 A 5.5 V 1 3.0 A Quiescent supply current delta, TTL input level 3005 ICC4/ For inpu

39、t under test, VIN= 3.4 V For all other inputs, VIN= VCCor GND 5.5 V 1, 2, 3 2.5 mA Input capacitance 3012 CINControl pins TA= +25C See 4.4.1c VIN= 3.0 V or 0.0 V 5.0 V 4 10 pF I/O capacitance (off) 3012 CI/OVOUT= 3.0 V or 0.0 V Sn = 5.0 V TA= +25C See 4.4.1c 5.0 V 4 15 pF VOLP5/ 5.0 V 4 750 mV Low l

40、evel ground bounce noise VOLP5/ 5.0 V 4 -800 mV VOHP5/ 5.0 V 4 700 mV High level VCCbounce noise VOHV5/ VIH= 3.0 V, VIL= 0.0 V TA= +25C See figure 4 See 4.4.1d 5.0 V 4 -750 mV VIN= 0.0 V, IIN= 64 mA 8.0 VIN= 0.0 V, IIN= 30 mA 8.0 On-state resistance ron6/ VIN= 2.4 V, IIN= 15 mA 4.5 V 4 15.0 See foot

41、notes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96697 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical perform

42、ance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol VCCGroup A subgroups Limits 3/ Unit Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Min Max 4.5 V Functional test 3014 7/ VIN= 0.8 V or 2.0 V Verify output VOSee figure 5 5.5 V 7, 8 L H 4.5 V and

43、 5.5 V 2.0 13.1 Propagation delay time, S0 to mBn or mAn 3003 tPZLtPZH8/ 9/ 4.0 V 9, 10, 11 14.0 ns 4.5 V and 5.5 V 1.7 15.3 Propagation delay time, output enable Sn to mBn or mAn 3003 tPZLtPZH9/ 4.0 V 9, 10, 11 16.0 ns 4.5 V and 5.5 V 1.0 13.2 Propagation delay time, output disable Sn to mBn or mAn

44、 3003 tPLZtPHZ9/ CL= 50 pF minimum RL= 500 See figure 5 4.0 V 9, 10, 11 14.5 ns 1/ For tests not listed in the referenced MIL-STD-883 (e.g. ICC), utilize the general test procedure under the conditions listed herein. 2/ Each input/output, as applicable, shall be tested at the specified temperature f

45、or the specified limits, to the tests in table I herein. Output terminals not designated shall be high level logic, low level logic, or open, except for all ICCand ICCtests, where the output terminals shall be open. When performing these tests, the current meter shall be placed in the circuit such t

46、hat all current flows through the meter. For input terminals not designated, VIN= GND or VIN 3.0 V. 3/ For negative and positive voltage and current values, the sign designates the potential difference in reference to GND and the direction of current flow, respectively; and the absolute value of the

47、 magnitude, not the sign, is relative to the minimum and maximum limits, as applicable, listed herein. 4/ This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or VCC. This test may be performed either one input at a time (preferred

48、method) or with all input pins simultaneously at VIN= VCC- 2.1 V (alternate method). When the test is performed using the alternate test method, the maximum limit is equal to the number of inputs at a high TTL input level times 2.5 mA, and the preferred method and limits are guaranteed. 5/ This test is for qualification only. Ground and VCCbounce tests are performed on a non-switching (quiescent) output and are used to measure the magnitude of induced noise caused by other simultaneously switching outputs. The test is performed on a low noise bench test fixtur