1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update to current requirements. Editorial changes throughout. - gap 06-10-02 Raymond Monnin REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Larry T. Gauder DEFENSE SUPPLY CE
2、NTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas M. Hess COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ECL, LOW POWER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL
3、DATE 96-01-04 QUAD DRIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-96732 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E538-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96732
4、 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outl
5、ines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96732 01 Q X X Federal stock class designator
6、RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA
7、 designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic num
8、ber Circuit function 01 100313 Low power quad driver 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compli
9、ant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X G
10、DIP5-T24 or CDIP6-T24 24 dual-in-line package Y See figure 1 24 quad-flat package 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted witho
11、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96732 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Negative supply voltage range (VEE) -7.0 V dc to +0.5 V dc DC input voltage range (VIN) VEE
12、to +0.5 V DC input current range (IIN) -30 mA to +5.0 mA Maximum dc output current (IOUT) -50 mA Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +175C Maximum power dissipation (PD) . 500 mW Thermal resistance, junction-to-case (JC
13、): Case X . See MIL-STD-1835 Case Y . 28 C/W 1.4 Recommended operating conditions. Negative supply voltage range (VEE) -5.7 V dc minimum to -4.2 V dc maximum High level input voltage range (VIH) -1.165 V dc minimum to -0.870 V dc maximum Low level input voltage range (VIL) . -1.830 V dc minimum to -
14、1.475 V dc maximum Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the i
15、ssues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Stan
16、dard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the
17、Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supe
18、rsedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo rep
19、roduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96732 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device cl
20、asses Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class
21、M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-
22、PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table. The truth table shall be as specified on figure
23、3. 3.2.4 Logic diagram The logic diagram shall be as specified on figure 4. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms and shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise sp
24、ecified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II.
25、 The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufa
26、cturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.
27、 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a c
28、ertificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MI
29、L-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the r
30、equirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8
31、 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSC
32、Cs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices cover
33、ed by this drawing shall be in microcircuit group number 30 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96732 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVIS
34、ION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C Group A subgroups Limits Unit unless otherwise specified Min Max 1, 2 -1025 -870 High-level output voltage VOHVEE= -4.2 V, -5.7 V VIH= -0.87 V 3 -1085 -870 mV 1, 2 -1830 -1
35、620 Low-level output voltage VOLVIL= -1.83 V Loading 50 to -2.0 V 3 -1830 -1555 mV 1, 2 -1035 High level threshold output voltage VOHCVEE= -4.2 V, -5.7 V VIH= -1.165 V 3 -1085 mV 1, 2 -1610 Low level threshold output voltage VOLCVIL= -1.475 V Loading 50 to -2.0 V 3 -1555 mV Negative power supply dra
36、in current IEEVEE= -5.7 V, -4.2 V 1, 2, 3 -65 -20 mA Low-level input current IILVEE= -4.2 V VIN= -1.83 V 1, 2, 3 0.5 A 1, 2 240 High-level input current IIHVEE= -5.7 V VIN= -0.87 Enable input 3 340 A 1, 2 350 Data input 3 500 A Functional tests VEE= -4.2 V, -5.7 V VIH= -1.165 V, VIL= -1.830 V See 4.
37、4.1b 7, 8 9 0.30 1.80 10 0.30 2.30 Propagation delay time, data to output tPLH1 tPHL1VEE= -4.2 V, -5.7 V See figure 5 11 0.30 2.00 ns 9 0.60 2.30 10 0.60 2.70 Propagation delay time, enable to output tPLH2 tPHL211 0.50 2.40 ns 9 0.30 1.90 10 0.30 2.00 Transition time, 20% to 80% 1/ 80% to 20% tTLH t
38、THL11 0.30 2.00 ns 1/ This parameter is provided as design information only (not tested but guaranteed). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96732 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 432
39、18-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Case Y Dimensions Millimeters Inches Notes Note 1 Min Max Min Max A 2.16 .085 b 0.41 0.46 .016 .018 c 0.10 0.15 .004 .006 D 22.10 28.45 .870 1.120 D1 9.40 10.16 .370 .400 4 E 22.10 28.45 .870 1.120 E1 9.40 10.16 .370 .400 4 e 1.14 1.40 .045 .055
40、 L 6.35 9.14 .250 .360 Q 0.89 1.27 .035 .050 5 S 1.91 .075 NOTES: 1. The preferred unit of measurement is millimeters. However, this item was designed using inch-pound units of measurements. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall r
41、ule. 2. Lead number 1 is identified by a tab located on the lead. 3. Lead numbers are shown for reference only and do not appear on package. 4. Dimensions D1 and E1 allow glass meniscus. 5. Dimension Q shall be measured at the point of exit of the lead from the body. FIGURE 1. Case outline. Provided
42、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96732 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 01 Case outline X Y Terminal connection Ter
43、minal symbol Terminal symbol 1 O 2d O 1d 2 O 2c O 2d 3 O 1c O 1d 4 O 2c O 2d 5 O 1c O 2c 6 VCCO 1c 7 VCCAO 2c 8 O 1b O 1c 9 O 2b VCC10 O 1b VCCA11 O 2b O 1b 12 O 2a O 2b 13 O 1a O 1b 14 O 2a O 2b 15 O 1a O 2a 16 Da O 1a 17 Db O 2a 18 VEEO 1a 19 E Da 20 Dc Db 21 Dd VEE22 O 1d E 23 O 2d Dc 24 O 1d Dd
44、FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96732 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Inputs Outputs Dn
45、E O 1n O 2n O 1n O 2n L L L L H H L H H H L L H L H H L L H H H H L L H = High voltage level L = Low voltage level FIGURE 3. Truth table. FIGURE 4. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59
46、62-96732 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. VCC, VCCA, = +2.0 V, VEE= -2.5 V. 2. L1 and L2 = equal length 50 impedance lines. 3. RT= 50 Terminator internal to scope. 4. Decoupling 0.1 F from GND to VCCand VEE. 5. All unus
47、ed outputs are loaded with 50 to GND. 6. CL= fixture and stray capacitance 3 pF. FIGURE 5. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96732 DEFENSE SUPPLY CENTER COL
48、UMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance w
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