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本文(DLA SMD-5962-96775 REV B-2010 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SI.pdf)为本站会员(孙刚)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-96775 REV B-2010 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SI.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate to MIL-PRF-38535 requirements. Editorial changes throughout. - LTG 03-02-04 Thomas M. Hess B Update boilerplate paragraphs to current requirements of MIL-PRF-38535 MAA 10-04-19 Thomas M. Hess REV SHET REV B B B B B B B B SHEET

2、15 16 17 18 19 20 21 22 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Bernard J. Miesse DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles F. Saffle, Jr. T

3、HIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROV

4、AL DATE 96-04-11 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-96775 SHEET 1 OF 22 DSCC FORM 2233 APR 97 5962-E268-10 .Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96775 DEFENSE SUPPLY CENTER COLUM

5、BUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are a

6、vailable and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96775 01 Q X A Federal stock class designator RHA designator (see 1.2.1) De

7、vice type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RH

8、A marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABTE

9、16245 16-bit incident-wave switching bus transceiver with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certific

10、ation to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter De

11、scriptive designator Terminals Package style X GDFP1-F48 48 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

12、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96775 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN)(except I/O ports)

13、-0.5 V dc to +7.0 V dc 4/ DC output voltage range applied to any output in the high state or power-off state (VOUT) -0.5 V dc to +5.5 V dc 4/ DC output current (IOL) (per output) . +128 mA DC input clamp current (IIK) (VIN 0.0 V ) -18 mA DC output clamp current (IOK) (VOUT 0.0 V) . -50 mA Maximum po

14、wer dissipation at TA= +55C (in still air) (PD) . 827 mW 5/ Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. 2/ 3/ 6/ Supp

15、ly voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH): OE +2.0 V Except OE +1.6 V Maximum low level input voltage (VIL): OE +0.8 V Except OE +1.4 V Input voltage range (VIN) +0.0 V dc to VCCMaximum high level output current (IOH): B bus -12 mA A bus -24 mA Maximum low

16、level output current (IOL): B bus +12 mA A bus +64 mA Maximum input transition rise or fall rate (t/V) (outputs enabled) 10 ns/V Operating case temperature range (TC) . -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the max

17、imum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative volt

18、age ratings may be exceeded provided that the input and output clamp current ratings are observed. 5/ Power dissipation values are derived using the formula PD= VCCICC+ nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein, and n represents the total nu

19、mber of outputs. 6/ Unused or floating pins (input or A-bus I/O) must be held high or low. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96775 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISI

20、ON LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are tho

21、se cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Ou

22、tlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue

23、, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specifi

24、c exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan

25、 shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, constr

26、uction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections

27、 shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on fi

28、gure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96775 DEFENSE SUPPLY CENTER COLU

29、MBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table

30、I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed

31、in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shal

32、l still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as require

33、d in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of

34、this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source o

35、f supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as requi

36、red for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 here

37、in) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required docume

38、ntation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A) Provided by IHSNot for Resale

39、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96775 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test meth

40、od 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Negative input clamp voltage 3022 VIKFor input under test IIN= -18 mA 4.5 V 1, 2, 3 -1.2 V High level output voltage 3006 VOHFor input OE affecting output under test

41、, VIH = 2.0 V or VIL= 0.8 V For all other inputs (except OE) VIN= 1.6 V or 1.4 V B port IOH= -100 A 5.5 V 1, 2, 3 VCC-0.2 V IOH= -1 mA 4.5 V 1, 2, 3 2.4 IOH= -12 mA 2.0 A port IOH= -1 mA 5.5 V 1, 2, 3 4.5 IOH= -32 mA 4.5 V 1, 2, 3 2.4 Low level output voltage 3007 VOLFor input OE affecting output un

42、der test, VIH = 2.0 V or VIL= 0.8 V For all other inputs (except OE) VIN= 1.6 V or 1.4 V B port IOL= +1 mA 4.5 V 1, 2, 3 0.4 V A port IOL= +64 mA 0.55 Input bus hold current, B port IHOLDVIN= 0.8 V 4.5 V 1, 2, 3 100 A VIN= 2.0 V -100 VIN= 0.0 V 5.5 V 1, 2, 3 500 VIN= 5.5 V -500 Input current high 30

43、10 IIHVIN= VCCor GND Control inputs 5.5 V 1, 2, 3 1.0 A A or B ports 20.0 Input current low 3009 IILVIN= VCCor GND Control inputs -1.0 A or B ports -20.0 Three-state output leakage current high 3021 IOZH4/ A port For control input affecting output under test, VIH= 2.0 V or VIL= 0.8 V VOUT= 2.7 V 5.5

44、 V 1, 2, 3 10.0 A Three-state output leakage current low 3020 IOZL4/ A port For control input affecting output under test, VIH= 2.0 V or VIL= 0.8 V VOUT= 0.5 V 5.5 V 1, 2, 3 -10.0 A Output current 3011 IO5/ VOUT= 2.5 V A port 5.5 V 1, 2, 3 -50 -180 mA B port -25 -90 See footnotes at end of table. Pr

45、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96775 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Co

46、ntinued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Off-state leakage current IOFFFor input or output under test VINor VOUT= 4.5 V VCCBIAS = 0.0 V 0.0 V 1, 2, 3 100 A Quiescent sup

47、ply current, A or B ports 3005 ICCFor all inputs VIN= VCCor GND IOUT= 0.0 A Outputs high 5.5 V 1, 2, 3 28.0 36.0 mA Outputs low 38.0 48.0Outputs disabled 20.0 32.0Quiescent supply current, (VCCBIAS) ICC(VCCBIAS) VCCBIAS = 4.5 V to 5.5 V IOUT= 0.0 A 0.0 V and 4.5 V1, 2, 3 700 A VCCBIAS = 4.5 V to 5.5

48、 V IOUT= 0.0 A 6/ 4.5 V and 5.5 V1, 2, 3 20.0Output voltage, A port VOUTVCCBIAS = 4.5 V to 5.5 V 0.0 V 1, 2, 3 1.1 1.9 V VCCBIAS = 4.75 V to 5.25 V 1.3 1.7 Output current, A port IOUTVCCBIAS = 4.5 V, VOUT= 0.0 V 0.0 V 1, 2, 3 -20 -100 A VCCBIAS = 4.5 V, VOUT= 3.0 V 20 100 Input capacitance 3012 CINTC= +25C, VIN= 2.5 V or 0.5 V See 4.4.1c 5.0 V 4 10.0 pF I/O capacitance 3012 CI/OTC= +25C, VOUT= 2.5 V or 0.5 V See 4.4.1c 5.0 V 4 13.0 Low level ground bounce noise VOLP7/ VIH= 3.0 V, VIL= 0.0 V TA= +25C See figure 4 See 4.4.1d 5.0 V 4 1550 mV Low level ground bounce noise

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