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本文(DLA SMD-5962-96827 REV B-2010 MICROCIRCUIT DIGITAL FAST CMOS 8-BIT DIAGNOSTIC SCAN REGISTER TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING MONOLITHIC SILICON.pdf)为本站会员(livefirmly316)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-96827 REV B-2010 MICROCIRCUIT DIGITAL FAST CMOS 8-BIT DIAGNOSTIC SCAN REGISTER TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate to MIL-PRF-38535 requirements. Editorial changes throughout. LTG 03-02-11 Thomas M. Hess B Add footnote 15/ for test condition of total power supply current (ICCT) to table I. Update boilerplate paragraphs to the current MIL-PR

2、F-38535 requirements. LTG 10-05-14 Thomas M. Hess REV SHET REV B B B B SHEET 15 16 17 18 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil ST

3、ANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOL

4、TAGE SWING, MONOLITHIC SILICON DRAWING APPROVAL DATE 96-03-22 REVISION LEVEL B SIZE A CAGE CODE 67268 5962-96827 SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E316-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 596

5、2-96827 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of ca

6、se outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96827 01 Q L A Federal stock class desig

7、nator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriat

8、e RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generi

9、c number Circuit function 01 29FCT818AT 8-bit diagnostic scan register, TTL compatible inputs and limited output voltage swing 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentat

10、ion M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as

11、follows: Outline letter Descriptive designator Terminals Package style L GDIP3-T24 or CDIP4-T24 24 Dual-in-line 3 CQCC1-N28 28 Leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provide

12、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96827 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage ran

13、ge (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC+ 0.5 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc 4/ DC input clamp current (IIK) (VIN= -0.5 V ) . -20 mA DC output clamp current (IOK) (VOUT= -0.5 V and +7.0 V) . 20 mA DC output source current (IOH

14、) (per output) . -30 mA DC output sink current (IOL) (per output) +70 mA DC VCCcurrent (ICC) . 268 mA Ground current (IGND) . +588 mA Storage temperature range (TSTG) . -65C to +150C Case temperature under bias (TBIAS) . -65C to +135C Lead temperature (soldering, 10 seconds) +300C Thermal resistance

15、, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C Maximum power dissipation (PD) . 500 mW 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT) . +0.0 V dc to VCCMax

16、imum low level input voltage (VIL) 0.8 V Minimum high level input voltage (VIH) . 2.0 V Case operating temperature range (TC) . -55C to +125C Maximum input rise or fall rate (t/V): (from VIN= 0.3 V to 2.7 V, 2.7 V to 0.3 V) 5 ns/V Maximum high level output current (IOH) -3 mA Maximum low level outpu

17、t current (IOL) 20 mA 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the sol

18、icitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT

19、 OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Phi

20、ladelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters

21、specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ For VCC 6.5 V, the upper limit on the range is limited to 7.0 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI

22、NG SIZE A 5962-96827 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in thi

23、s document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the de

24、vice manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specifi

25、ed herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in

26、accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and w

27、aveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless ot

28、herwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in

29、 table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations,

30、the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, a

31、ppendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q

32、and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of su

33、pply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device clas

34、s M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this dr

35、awing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M,

36、 DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M dev

37、ices covered by this drawing shall be in microcircuit group number 40 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96827 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218

38、-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Devicetype VCCGroup A subgroups Limits 3/ Unit Min MaxHigh level output volta

39、ge 3006 VOH14/ For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -300 A All 4.5 V1, 2, 3 3.0 VCC-0.5 V VOH2IOH= -3 mA 1, 2, 3 2.4 Low level output voltage 3007 VOL14/ For all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.

40、8 V For all other inputs VIN= VCCor GND IOL= 300 A All 4.5 V1, 2, 3 0.2 V VOL2IOL= 20 mA 1, 2, 3 0.55Negative input clamp voltage 3022 VIC-For input under test, IIN= -18 mA All 4.5 V1, 2, 3 -1.2 V Three-state output leakage current high 3021 IOZH5/ 6/ OEY = 2.0 V or 0.8 V For all other inputs VIN= V

41、CCor GND VOUT= 2.7 V All 5.5 V1, 2, 3 10.0 A Three-state output leakage current low 3020 IOZL5/ 6/ VOUT= 0.5 V All 5.5 V1, 2, 3 -10.0A Input current high 3010 IIH1For input under test VIN= VCCFor all other inputs VIN= VCCor GND All 5.5 V1, 2, 3 5.0 A IIH2For input under test VIN= 2.7 V For all other

42、 inputs VIN= VCCor GND All 5.5 V1, 2, 3 1.0 A Input current low 3009 IILFor input under test VIN= 0.5 V For all other inputs VIN= VCCor GND All 5.5 V1, 2, 3 1.0 A Power-off leakage current IOFFVOUT= 4.5 V All 0.0 V1, 2, 3 1.0 A Output short circuit current 3011 IOS7/ For all inputs VIN= VIH= 2.0 V o

43、r VIL= 0.8 V VOUT= 0.0 V All 5.5 V1, 2, 3 -60 -225 mA Dynamic power supply current ICCD4/ 8/ Outputs open All 5.5 V4, 5, 6 250 A/ MHzBit Quiescent supply current delta, TTL input level 3005 ICC9/ For input under test VIN= 3.4 V For all other inputs VIN= VCCor GND All 5.5 V1, 2, 3 2.0 mA See footnote

44、s at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96827 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance

45、 characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Quiescent supply current, outputs high 3005 ICCHOEY = GND For all other inputs VIN= VCCor GND

46、 All 5.5 V1, 2, 3 1.5 mA Quiescent supply current, outputs low 3005 ICCLAll 5.5 V1, 2, 3 1.5 mA Quiescent supply current, outputs disabled 3005 ICCZ5/ OEY = VCCFor all other inputs VIN= VCCor GND All 5.5 V1, 2, 3 1.5 mA Total supply current ICCT110/ 15/ Outputs open fCP= 10 MHz OEY = GND One bit tog

47、gling fi= 5 MHz 50% duty cycle For nonswitching input VIN= VCCor GND For switching Inputs VIN= VCC or GND All 5.5 V4, 5, 6 5.3 mA For switching Inputs VIN= 3.4 V or GND 4, 5, 6 7.3 ICCT24/ 10/ 15/ Outputs open fCP= 10 MHz OEY = GND Eight bits and four controls toggling fi= 5 MHz 50% duty cycle For n

48、onswitching input VIN= VCC or GND For switching inputs VIN= VCCor GND All 5.5 V4, 5, 6 17.8 For switching inputs VIN= 3.4 V or GND 4, 5, 6 30.8 Input capacitance 3012 CIN11/ TC= +25C See 4.4.1b All GND 4 10.0 pF Output capacitance 3012 COUT11/ All GND 4 12.0 pF Low level ground bounce noise VOLP11/ 12/ VIH= 3.0 V, VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 All 5.0 V4 1750 mV VOLV11/ 12/ 4 -1100High level VCCbounce noise VOHP11/ 12/ All 5.0 V4 800 mV VOHV11/ 12/ 4 -1200Functional test 3014 13/ VIH= 2.0 V, VIL= 0.8 V Verify output VOSee 4.4.1c All 4.5 V7, 8 L H 5.5 V7, 8 L H See

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