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本文(DLA SMD-5962-96864 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGHSPEED CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf)为本站会员(ideacase155)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-96864 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGHSPEED CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate to current requirements as specified in MIL-PRF-38535. - jak 08-10-17 Thomas M. Hess REV SHET REV A A A A A SHEET 15 16 17 18 19 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PM

2、IC N/A PREPARED BY Bernard J. Miesse STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles F. Saffle Jr. DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF DE

3、FENSE DRAWING APPROVAL DATE 96-08-30 MICROCIRCUIT, DIGITAL, ADVANCED HIGH-SPEED CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-96864 SHEET 1 OF 19 DSCC FORM 2233 APR 97 5962-E510-08 Provided by IHSNot for

4、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96864 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class l

5、evels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflecte

6、d in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96864 01 Q R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Dev

7、ice classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a

8、non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54AHC374 Octal edge-triggered D-type flip-flop with three-state outputs 1.2.3 Device class designator. The device class designator is a single letter iden

9、tifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF

10、-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead fini

11、sh. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96864 DEFENSE SUPPLY CENTER COL

12、UMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to VCC+ 0.5 V dc 4/ DC input cla

13、mp current (IIK) (VINVCC) . 20 mA Continuous output current (IO) (VOUT= 0 V to VCC) . 25 mA Continuous current through VCCor GND 75 mA Storage temperature range (TSTG) -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction t

14、emperature (TJ) . +175C Maximum power dissipation at TA= +55C (instill air) (PD) . 500 mW 1.4 Recommended operating conditions. 2/ 3/ 5/ Supply voltage range (VCC) . +2.0 V dc to +5.5 V dc Input voltage range (VIN) . +0.0 V dc to +5.5 V dc Output voltage range (VOUT) +0.0 V to VCCMinimum high level

15、input voltage (VIH): VCC= 2.0 V . 1.5 V VCC= 3.0 V . 2.1 V VCC= 5.0 V 0.5 V . 3.85 V Maximum low level input voltage (VIL): VCC= 2.0 V . 0.5 V VCC= 3.0 V . 0.9 V VCC= 5.0 V 0.5 V . 1.65 V Maximum high level output current (IOH): VCC= 2.0 V . -50 A VCC= 3.3 V 0.3 V . -4 mA VCC= 5.0 V 0.5 V . -8 mA Ma

16、ximum low level output current (IOL): VCC= 2.0 V . +50 A VCC= 3.3 V 0.3 V . +4 mA VCC= 5.0 V 0.5 V . +8 mA Minimum input rise or fall rate (t/V): VCC= 3.3 V V 0.3 V . 100 ns/V VCC= 5.0 V V 0.5 V . 20 ns/V Case operating temperature range (TC) -55C to +125C 1/ Stresses above the absolute maximum rati

17、ng may cause permanent damage to the device, Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case

18、 temperature range of -55C to +125C. 4/ The input and output voltage ratings may be exceeded providing that the input and output current ratings are observed. 5/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted

19、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96864 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards

20、, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DE

21、PARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these

22、 documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited here

23、in, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with M

24、IL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535

25、, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device

26、 class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as

27、specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. Provided by IHSNot for Resale

28、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96864 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits

29、. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups s

30、pecified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space li

31、mitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-P

32、RF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device

33、 classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved s

34、ource of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for

35、device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered

36、 to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For devi

37、ce class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device

38、class M devices covered by this drawing shall be in microcircuit group number 38 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96864 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,

39、 OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max2.0 V 1.9 3.0 V 2.9 IOH=

40、-50 A 4.5 V 1, 2, 3 4.4 1 2.58 IOH= -4 mA 3.0 V 2, 3 2.48 1 3.94 High level output voltage 3006 VOHFor all inputs affecting outputs under test, VIN= VIHor VILFor all other inputs, VIN= VCCor GND IOH= -8 mA 4.5 V 2, 3 3.8 V 2.0 V 0.10 3.0 V 0.10 IOH= 50 A 4.5 V 1, 2, 3 0.10 1 0.36 IOH= 4 mA 3.0 V 2,

41、3 0.50 1 0.36 Low level output voltage 3007 VOLFor all inputs affecting outputs under test, VIN= VIHor VILFor all other inputs, VIN= VCCor GND IOH= 8 mA 4.5 V 2, 3 0.50 V 1 +0.1 Input current high 3010 IIHFor input under test, VIN= VCCFor all other inputs, VIN= VCCor GND 5.5 V 2, 3 +1.0 A 1 -0.1 Inp

42、ut current low 3009 IILFor input under test, VIN= GND For all other inputs, VIN= VCCor GND 5.5 V 2, 3 -1.0 A 1 +0.25 Three-state output leakage current, high 3021 IOZHOE = VIHFor all other inputs, VIN= VCCor GND VOUT= VCC5.5 V 2, 3 +2.5 A 1 -0.25 Three-state output leakage current, low 3020 IOZLOE =

43、 VIHFor all other inputs, VIN= VCCor GND VOUT= GND 5.5 V 2, 3 -2.5 A 1 4.0 Quiescent supply current, 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0 A 5.5 V 2, 3 40 A Input capacitance 3012 CINTC= +25C VIN= VCCor GND See 4.4.1c 5.0 V 4 10.0 pF Output capacitance 3012 COUTTC= +25C VIN= VCCor GND See 4

44、.4.1c 5.0 V 4 10.0 pF Power dissipation capacitance CPD4/ CL= 50 pF minimum f = 1 MHz see figure 4 5.0 V 4 35.0 pF VOLP5/ 5.0 V 4 1500 Low level ground bounce noise VOLV5/ 5.0 V 4 -1500 mV VOHP5/ 5.0 V 4 750 High level VCCbounce noise VOHV5/ VIH= VCC, VIL = 0.0 V TA= +25C See 4.4.1d See figure 4 5.0

45、 V 4 -1500 mV See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96864 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE

46、 I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max 2.0 V 3.0 V Functional test 3014 6/ VIN= VIHor VILVerify output VOSee 4.4.1b 5.5 V

47、7, 8 L H 9 5.0 3.0 V and 3.6 V 10, 11 5.5 9 5.0 Pulse duration, CLK high or low twCL= 50 pF minimum See figure 5 4.5 V and 5.5 V 10, 11 5.0 ns 9 4.5 3.0 V and 3.6 V 10, 11 4.0 9 3.0 Pulse duration, data high or low before CLK tsCL= 50 pF minimum See figure 5 4.5 V and 5.5 V 10, 11 3.0 ns 3.0 V and 3

48、.6 V 2.0 Pulse duration, data high or low after CLK thCL= 50 pF minimum See figure 5 4.5 V and 5.5 V 9, 10, 11 2.0 ns 9 80 3.0 V and 3.6 V 10, 11 70 9 130 CL= 15 pF minimum See figure 5 7/ 4.5 V and 5.5 V 10, 11 110 MHz 9 55 3.0 V and 3.6 V 10, 11 50 9 85 Maximum clock frequency fMAXCL= 50 pF minimum See figure 5 4.5 V and 5.5 V 10, 11 75 ns See footnotes on next sheet. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S

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