DLA SMD-5962-97582 REV B-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL 3-LINE TO 8-LINE DECODERS DEMULTIPLEXERS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖特基晶体管晶体管逻辑电路 3线到8线解码器 多.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor cage 27014 for device 01. Technical changes in 1.3. - tdn 97-07-18 Raymond Monnin B Update drawing to current requirements. Editorial changes throughout. - gap 06-11-27 Raymond Monnin REV SHET REV SHET REV STATUS REV B B B B B B B B B

2、B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Tuan Nguyen DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Larry Shaw COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, DI

3、GITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, 3-LINE TO 8-LINE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-05-30 DECODERS/DEMULTIPLEXERS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-97582 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E622-06 Provided by IHSNot

4、 for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97582 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance cla

5、ss levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are ref

6、lected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 97582 01 Q E X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator

7、. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicat

8、es a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54F138 3-line to 8-line decoder/demultiplexer 1.2.3 Device class designator. The device class designator is a single letter identifying the product a

9、ssurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case out

10、line(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat pack 2 CQCC1-N20 20 leadless square chip carrier 1.2.5 Lead finish. The lead finish i

11、s as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97582 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

12、43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc Input voltage (VIN) -1.2 V at -18 mA to +7.0 V dc Input current range (II) . -30 mA to 5 mA Voltage range applied to any output in the high state -0.5 V to VCC

13、 Current into any output in the low state . 40 mA Operating free air temperature range -55C to +125C Maximum power dissipation (PD) . 110 mW Storage temperature range. -65C to +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating

14、 conditions. Supply voltage range (VCC) 4.5 V dc to 5.5 V dc High-level input voltage (VIH) . 2.0 V min Low-level input voltage (VIL) 0.8 V max Input clamp current (IIK) . -18 mA max High-level output current (IOH) -1 mA max Low-level output current (IOL) . 20 mA max Case operating temperature range

15、 (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the sol

16、icitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT

17、 OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Av

18、enue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a spe

19、cific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

20、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97582 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-3

21、8535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, append

22、ix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M

23、. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test circuit

24、and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply o

25、ver the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In a

26、ddition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked.

27、Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535.

28、 The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6

29、.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this d

30、rawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device clas

31、ses Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devic

32、es acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore d

33、ocumentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 11 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or

34、networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97582 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Test Conditions -55C TC +125C Group A

35、 subgroups Limits 1/ Unit unless otherwise specified Min Max Input clamp voltage VIKVCC= 4.5 V, II= -18 mA 1, 2, 3 -1.2 V High level output voltage VOHVCC= 4.5 V, IOH= -1 mA 1, 2, 3 2.5 V Low-level output voltage VOLVCC= 4.5 V, IOL= 20 mA 1, 2, 3 0.5 V Input current at maximum input voltage IIVCC= 5

36、.5 V, VI= 7.0 V 1, 2, 3 0.1 mA High-level input current IIHVCC= 5.5 V, VI= 2.7 V 1, 2, 3 20 A Low-level input current IILVCC= 5.5 V, VI= 0.5 V 1, 2, 3 -0.6 mA Short-circuit output current IOS2/ VCC= 5.5 V, VO= 0 1, 2, 3 -60 -150 mA Supply current ICC3/ VCC= 5.5 V 1, 2, 3 20 mA Functional test 4/ VIN

37、= VIHMin or VILMax, Verify output VO, See 4.4.1b 7, 8 Propagation delay time, low-to-high tPLHSee figure 3 9 2.7 7.5 ns level Y output from A, B, or C input 4/ 5/ 10, 11 2.7 12 Propagation delay time, high-to-low tPHL9 3.2 8 ns level Y output from A, B, or C input 10, 11 3.2 9.5 Propagation delay ti

38、me, low-to-high tPLH9 2.7 7 ns level Y output from A2G or B2G 10, 11 2.7 11 Propagation delay time, high-to-low tPHL9 2.2 7 ns level Y output from A2G or B2G 10, 11 2.2 8 Propagation delay time, low-to-high tPLH9 3.2 8 ns level Y output from G1 10, 11 3.2 12.5 Propagation delay time, high-to-low tPH

39、L9 2.7 7.5 ns level Y output from G1 10, 11 2.7 8.5 1/ For negative and positive voltage and current values, the sign designates the potential difference in reference to GND and the direction of current flow, respectively, and the absolute value of the magnitude, not the sign, is relative to the min

40、imum and maximum limits, as applicable, listed herein. 2/ Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. 3/ ICCis measured with outputs enabled and open. 4/ For subgroup 9, VCC= 5.0 V, CL= 50 pF, RL= 500 . 5/ For subgroups 10

41、 and 11, VCC= 4.5 V to 5.5 V, CL= 50 pF, RL= 500 . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97582 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97

42、 Device type 01 Case outlines E and F 2 Terminal number Terminal symbol 1 A NC 2 B A 3 C B 4 A2G C 5 B2G A2G 6 G1 NC 7 Y7 B2G 8 GND G1 9 Y6 Y7 10 Y5 GND 11 Y4 NC 12 Y3 Y6 13 Y2 Y5 14 Y1 Y4 15 Y0 Y3 16 VCCNC 17 Y2 18 Y1 19 Y0 20 VCCFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo repro

43、duction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97582 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 ENABLE INPUTS SELECT INPUTS OUTPUTS G1 A2G B2G C B A Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 X H X X X

44、X H H H H H H H H X X H X X X H H H H H H H H L X X X X X H H H H H H H H H L L L L L L H H H H H H H H L L L L H H L H H H H H H H L L L H L H H L H H H H H H L L L H H H H H L H H H H H L L H L L H H H H L H H H H L L H L H H H H H H L H H H L L H H L H H H H H H L H H L L H H H H H H H H H H L FI

45、GURE 2. Truth table. NOTES: 1. CLincludes probe and jig capacitance. CL = 50 pF, RL= 500 . 2. All input pulses are supplied by generators having the following characteristics: PRR 1 MHz, tr= tf 2.5 ns, duty cycle = 50%. 3. The output are measured one at a time with one transition per measurement. FI

46、GURE 3. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97582 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 4. V

47、ERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as de

48、scribed herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.