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本文(DLA SMD-5962-97616 REV C-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET MONOLITHIC SILICON.pdf)为本站会员(tireattitude366)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-97616 REV C-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make corrections to figure 5. - JAK 00-08-02 Monica L. Poelking B Add footnote to ICCin table I. Correct waveforms in figure 5. Add table III, delta limits. Update the boilerplate to the requirements of MIL-PRF-38535. Editorial changes throughout

2、. - TVN 03-08-19 Thomas M. Hess C Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - jak 10-09-08 Thomas M. Hess REV SHEET REV SHEET REV C C C SHEET 15 16 17 REV STATUS OF SHEETS REV C C C C C C C C C C C C C C SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Tin H

3、. Le DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Charles F. Saffle, Jr. APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, LO

4、W VOLTAGE CMOS, DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON DRAWING APPROVAL DATE 97-09-09 REVISION LEVEL C SIZE A CAGE CODE 67268 5962-97616 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E428-10 Provided by IHSNot for ResaleNo reproduction or networking permit

5、ted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97616 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes

6、 Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the fo

7、llowing example: 5962 - 97616 01 Q C A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MI

8、L-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device t

9、ype(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LVC74A Dual positive edge-triggered D-type flip flop with clear and preset 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follow

10、s: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. Q or V Certification and qualification to MIL-PRF-38535. 1.2.4 Case outline(s). The case outl

11、ine(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-

12、PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97616 REVISION LEVEL C SHE

13、ET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +6.5 V dc DC input voltage range (VIN) -0.5 V dc to +6.5 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc 4/ 5/ DC input clamp current (IIK) (VIN 0.0 V) . -50 mA DC output cla

14、mp current (IOK) (VOUT 0.0 V or VOUT VCC) . 50 mA Continuous output current (IOUT) (VOUT= 0.0 to VCC) 50 mA Continuous current through VCCor GND . 100 mA Maximum power dissipation at TA= +55C (in still air) . 500 mW 6/ Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10

15、seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +150C 1.4 Recommended operating conditions. 2/ 3/ 7/ Supply voltage range (VCC): Operating . +2.0 V dc to +3.6 V dc Data retention only (minimum) . +1.5 V dc Input voltage range (VIN) 0.0 V to +5.5

16、V dc Output voltage range (VOUT) . 0.0 V to VCCMinimum high level input voltage (VIH) (VCC= 2.7 V to 3.6 V) +2.0 V dc Maximum low level input voltage (VIL) (VCC= 2.7 V to 3.6 V) . +0.8 V dc Maximum high level output current (IOH): VCC= 2.7 V -12 mA VCC= 3.0 V -24 mA Maximum low level output current

17、(IOL): VCC= 2.7 V +12 mA VCC= 3.0 V +24 mA Input transition rise or fall rate (t/v) 0 ns/V to 10 ns/V Case operating temperature range (TC) . -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade per

18、formance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded

19、 provided that the input and output clamp current ratings are observed. 5/ The value of VCCis provided in the recommended operating conditions section 1.4 above. 6/ The maximum package power dissipation is calculated using a junction temperature of 150C and a board trace length of 750 mils. 7/ Unuse

20、d inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97616 REVISION LEVEL C SHEET 4 DSCC FORM 2234 A

21、PR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or con

22、tract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HAND

23、BOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19

24、111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3.

25、REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, o

26、r function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions sh

27、all be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure

28、 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveform

29、s and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as s

30、pecified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduc

31、tion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97616 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufactu

32、rers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device cla

33、sses Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark f

34、or device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For devi

35、ce class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply for this drawi

36、ng shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes

37、Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) i

38、nvolving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility

39、and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 38 (see MIL-PRF-38535, appendix A).

40、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97616 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and

41、MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOHFor all inputs affecting output under test, VIN= VIHor VILFor all other inputs, VIN= VCCor GND IOH= -100 A 2.7

42、 V and 3.6 V 1, 2, 3 VCC-0.2 V IOH= -12 mA 2.7 V 1, 2, 3 2.2 3.0 V 2.4 IOH= -24 mA 3.0 V 1, 2, 3 2.2 Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= VIHor VILFor All other inputs, VIN= VCCor GND IOL= 100 A 2.7 V and 3.6 V 1, 2, 3 0.2 V IOL= 12 mA 2.7 V 1, 2, 3 0.4 I

43、OL= 24 mA 3.0 V 1, 2, 3 0.55 Input current high 3010 IIHFor input under test, VIN= 5.5 V 3.6 V 1, 2, 3 +5.0 A Input current low 3009 IILFor input under test, VIN= GND 3.6 V 1, 2, 3 -5.0 A Quiescent supply current 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0.0 A 3.6 V 1, 2, 3 10.0 A Quiescent suppl

44、y current delta, TTL input levels 3005 ICC4/ For input under test, VIN= VCC- 0.6 V Other inputs at VCCor GND 2.7 V and 3.6 V 1, 2, 3 500.0 A Input capacitance 3012 CINTC= +25C VIN= VCCor GND See 4.4.1c 3.3 V 4 9.0 pF Power dissipation capacitance per flip flop CPDCL= 50 pF minimum f = 10 MHz TC= +25

45、C See 4.4.1c 3.3 V 4 30.0 pF Low level ground bounce noise VOLP5/ VIH= 2.7 V, VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 3.0 V 4 650 mV VOLV5/ 3.0 V 4 -650 mV High level VCCbounce noise VOHP5/ 3.0 V 4 250 mV VOHV5/ 3.0 V 4 -300 mV See footnotes at end of table. Provided by IHSNot for ResaleNo repro

46、duction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97616 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/

47、 Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Functional test 3014 6/ VIN= VIHor VILVerify output VOUTSee 4.4.1b2.0 V and 3.6 V 7, 8 L H Maximum operating frequency fMAX CL= 50 pF minimum RL= 500 See figure 5 3.0 V a

48、nd 3.6 V 9, 10, 11 100 MHz 2.7 V 83 Propagation delay time, mCLK to mQ or Qm 3003 tPLH1, tPHL17/ 3.0 V and 3.6 V 9, 10, 11 1.0 5.2 ns 2.7 V 6.0 Propagation delay time, PREm or CLRm to mQ or Qm 3003 tPLH2, tPHL27/ 3.0 V and 3.6 V 9, 10, 11 1.0 5.4 ns 2.7 V 6.4 Clock frequency fclock CL= 50 pF minimum RL= 500 3.0 V and 3.6 V 9, 10, 11 0 100 MHz 2.7 V 0 83 Pulse duration tw CL= 50 pF minimum RL= 500 See figure 5 PRE or CLR low 3.0 V and 3.6 V 9, 10, 11 3.3 ns 2.7 V 3.3 CLK high or low 3.0 V an

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